Materials for x-ray refractive lenses minimizing wavefront distortions
- European Synchrotron Radiation Facility (France); European X-Ray Free Electron Laser GmbH (Germany)
- Diamond Light Source (United Kingdom)
- RXOPTICS (Germany)
- Baltic Federal Univ. (Russia)
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Refraction through curved surfaces, reflection from curved mirrors in grazing incidence, and diffraction from Fresnel zone plates are key hard x-ray focusing mechanisms. In this article, we present materials used for refractive x-ray lenses. Important properties of such x-ray lenses include focusing strength, shape, and the material’s homogeneity and absorption coefficient. Both the properties of the initial material and the fabrication process result in a lens with imperfections, which can lead to unwanted wavefront distortions. Different fabrication methods for one-dimensional and two-dimensional focusing lenses are presented, together with the respective benefits and inconveniences that are mostly due to shape fidelity. Different materials and material grades have been investigated in terms of their homogeneity and the absence of inclusions. Single-crystalline materials show high homogeneity, but suffer from unwanted diffracted radiation, which can be avoided using amorphous materials. Lastly, we show that shape imperfections can be corrected using a correction lens.
- Research Organization:
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC02-76SF00515
- OSTI ID:
- 1369415
- Journal Information:
- MRS Bulletin, Vol. 42, Issue 06; ISSN 0883-7694
- Publisher:
- Materials Research SocietyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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Impact of beryllium microstructure on the imaging and optical properties of X-ray refractive lenses
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journal | January 2020 |
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Diamond refractive micro-lenses for full-field X-ray imaging and microscopy produced with ion beam lithography
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