skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Information or resolution: Which is required from an SEM to study bulk inorganic materials?: Evaluate SEMs’ practical performance

Journal Article · · Scanning
DOI:https://doi.org/10.1002/sca.21336· OSTI ID:1342927
 [1]
  1. Ames Lab., Ames, IA (United States). Division of Materials Sciences and Engineering

Significant technological advances in scanning electron microscopy (SEM) have been achieved over the past years. Different SEMs can have significant differences in functionality and performance. Here, this work presents the perspectives on selecting an SEM for research on bulk inorganic materials. Understanding materials demands quantitative composition and orientation information, and informative and interpretable images that reveal subtle differences in chemistry, orientation/structure, topography, and electronic structure. The capability to yield informative and interpretable images with high signal-to-noise ratios and spatial resolutions is an overall result of the SEM system as a whole, from the electron optical column to the detection system. The electron optical column determines probe performance. The roles of the detection system are to capture, filter or discriminate, and convert signal electrons to imaging information. The capability to control practical operating parameters including electron probe size and current, acceleration voltage or landing voltage, working distance, detector selection, and signal filtration is inherently determined by the SEM itself. As a platform for various accessories, e.g. an energy-dispersive spectrometer and an electron backscatter diffraction detector, the properties of the electron optical column, specimen chamber, and stage greatly affect the performance of accessories. Ease-of-use and ease-of-maintenance are of practical importance. It is practically important to select appropriate test specimens, design suitable imaging conditions, and analyze the specimen chamber geometry and dimensions to assess the overall functionality and performance of an SEM. Lastly, for an SEM that is controlled/operated with a computer, the stable software and user-friendly interface significantly affect the usability of the SEM.

Research Organization:
Ames Laboratory (AMES), Ames, IA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-07CH11358
OSTI ID:
1342927
Alternate ID(s):
OSTI ID: 1347894
Report Number(s):
IS-J-9020; IS-J-9198
Journal Information:
Scanning, Vol. 38, Issue 6; ISSN 0161-0457
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 7 works
Citation information provided by
Web of Science

References (20)

Electron Backscatter Diffraction in Materials Science book January 2009
Elemental mapping of microstructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD) journal January 2013
A comparison of conventional Everhart-Thornley style and in-lens secondary electron detectors-a further variable in scanning electron microscopy journal May 2011
Handbook of Charged Particle Optics book December 2017
Image distortions in SEM and their influences on EBSD measurements journal February 2007
Recent advances in electron imaging, image interpretation and applications: environmental scanning electron microscopy
  • Stokes, Debbie J.
  • Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences, Vol. 361, Issue 1813 https://doi.org/10.1098/rsta.2003.1279
journal November 2003
Application of EBSD to the analysis of interface planes: evolution over the last two decades journal June 2008
Does your SEM Really tell the truth?-how would you know? Part 1 journal February 2013
Electron imaging with an EBSD detector journal January 2015
Secondary electron emission in the scanning electron microscope journal November 1983
Low voltage scanning electron microscopy journal June 1996
Field-emission SEM imaging of compositional and doping layer semiconductor superlattices journal April 1995
Does your SEM really tell the truth? How would you know? Part 2 journal October 2013
A new examination of secondary electron yield data journal January 2005
Quantitative secondary electron energy filtering in a scanning electron microscope and its applications journal February 2007
CASINO V2.42—A Fast and Easy-to-use Modeling Tool for Scanning Electron Microscopy and Microanalysis Users journal January 2007
Probe current, probe size, and the practical brightness for probe forming systems
  • Bronsgeest, M. S.; Barth, J. E.; Swanson, L. W.
  • Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 26, Issue 3 https://doi.org/10.1116/1.2907780
journal January 2008
Simulated SEM images for resolution measurement journal September 2008
Towards ultrahigh resolution EBSD by low accelerating voltage journal June 2010
Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) journal November 2014