Reconstruction of nonlinear wave propagation

Fleischer, Jason W; Barsi, Christopher; Wan, Wenjie

Title: Reconstruction of nonlinear wave propagation

Patent · Tue Apr 23 00:00:00 EDT 2013

OSTI ID:1083297

Fleischer, Jason W; Barsi, Christopher; Wan, Wenjie

Disclosed are systems and methods for characterizing a nonlinear propagation environment by numerically propagating a measured output waveform resulting from a known input waveform. The numerical propagation reconstructs the input waveform, and in the process, the nonlinear environment is characterized. In certain embodiments, knowledge of the characterized nonlinear environment facilitates determination of an unknown input based on a measured output. Similarly, knowledge of the characterized nonlinear environment also facilitates formation of a desired output based on a configurable input. In both situations, the input thus characterized and the output thus obtained include features that would normally be lost in linear propagations. Such features can include evanescent waves and peripheral waves, such that an image thus obtained are inherently wide-angle, farfield form of microscopy.

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Research Organization:: Opteryx, LLC (Princeton, NJ)

Sponsoring Organization:: USDOE

DOE Contract Number:: FG02-08ER55001

Assignee:: Opteryx, LLC (Princeton, NJ)

Patent Number(s):: 8,427,650

Application Number:: 12/629,739

OSTI ID:: 1083297

Country of Publication:: United States

Language:: English

References (34)

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