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Title: Neutron, gamma ray and post-irradiation thermal annealing effects on power semiconductor switches

Conference ·
OSTI ID:10181277
 [1];  [2]
  1. Lewis Research Center, Cleveland, OH (United States)
  2. Wittenberg Univ., Springfield, OH (United States)

The effects of neutrons and gamma rays on the electrical and switching characteristics of power semiconductor switches must be known and understood by the designer of the power conditioning, control, and transmission subsystem of space nuclear power systems. The SP-100 radiation requirements at 25 m from the nuclear source are a neutron fluence of 10{sup 13} n/cm {sup 2} and a gamma dose of 0.5 Mrads. Experimental data showing the effects of neutrons and gamma rays on the performance characteristics of power-type NPN Bipolar Junction Transistors (BJTs), Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs), and Static Induction Transistors (SITs) are given in this paper. These three types of devices were tested at radiation levels which met or exceeded the SP-100 requirements. For the SP-100 radiation requirements, the BJTs were found to be most sensitive to neutrons, the MOSFETs were most sensitive to gamma rays, and the SITs were only slightly sensitive to neutrons. Post-irradiation thermal anneals at 300 K and up to 425 K were done on these devices and the effectiveness of these anneals are also discussed.

Research Organization:
National Aeronautics and Space Administration, Cleveland, OH (United States). Lewis Research Center
Sponsoring Organization:
National Aeronautics and Space Administration, Washington, DC (United States); USDOE, Washington, DC (United States)
DOE Contract Number:
AI03-86SF16310
OSTI ID:
10181277
Report Number(s):
NASA-TM-105248; AIAA-91-3525; CONF-9109226-27; ON: DE94051220; TRN: 94:008312
Resource Relation:
Conference: AIAA/NASA/OAI conference on advanced space exploration initiative (SEI) technologies,Cleveland, OH (United States),3-4 Sep 1991; Other Information: PBD: [1994]
Country of Publication:
United States
Language:
English