skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: High spatial resolution X-ray and gamma ray imaging system using diffraction crystals

Patent ·
OSTI ID:1018042

A method and a device for high spatial resolution imaging of a plurality of sources of x-ray and gamma-ray radiation are provided. The device comprises a plurality of arrays, with each array comprising a plurality of elements comprising a first collimator, a diffracting crystal, a second collimator, and a detector.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-06CH11357
Assignee:
Uchicago Argonne, LLC (Chicago, IL)
Patent Number(s):
7,943,906
Application Number:
12/272,483
OSTI ID:
1018042
Country of Publication:
United States
Language:
English

Similar Records

High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals
Patent · Tue Dec 23 00:00:00 EST 2008 · OSTI ID:1018042

WINKLER; An imaging high resolution gamma-ray spectrometer
Journal Article · Mon Apr 01 00:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) · OSTI ID:1018042

Superior spatial resolution in confocal X-ray techniques using collimating channel array optics: elemental mapping and speciation in archaeological human bone
Journal Article · Sun Jan 01 00:00:00 EST 2017 · Journal of Analytical Atomic Spectrometry · OSTI ID:1018042