Analysis of individual microscopic particles by means of synchrotron radiation induced x-ray micro fluorescence

Technical Report · Wed Apr 01 00:00:00 EST 1992

DOI:https://doi.org/10.2172/10147778· OSTI ID:10147778

Janssens, K H; Adams, F C ^[1]; Rivers, M L ^[2]; Jones, K W ^[3]

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1. Antwerp Univ., Wilrijk (Belgium)
2. Chicago Univ., IL (United States)
3. Brookhaven National Lab., Upton, NY (United States)

Short communication.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States); National Science Foundation, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 10147778
• Report Number(s): BNL-47504; CONF-920819-19; ON: DE92014692; CNN: Grant EAR 89-15690
• Resource Relation: Conference: Annual meeting of the Electron Microscopy Society (EMS) of America,Boston, MA (United States),16-21 Aug 1992; Other Information: PBD: Apr 1992
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
43 PARTICLE ACCELERATORS
X-RAY FLUORESCENCE ANALYSIS
SENSITIVITY
ELECTRON MICROPROBE ANALYSIS
COMPARATIVE EVALUATIONS
SYNCHROTRON RADIATION
MICROSCOPY
PARTICLES
MULTI-ELEMENT ANALYSIS
TRACE AMOUNTS
400102
430400
CHEMICAL AND SPECTRAL PROCEDURES
STORAGE RINGS