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Title: Nondestructive Imaging of Materials Microstructures Using X-Ray Tomographic Microscopy

Conference · · Materials Research Society Symposia Proceedings
DOI:https://doi.org/10.1557/proc-217-81· OSTI ID:6360701
 [1];  [2];  [3];  [4];  [4];  [4];  [1]
  1. Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
  2. Sandia National Laboratories (SNL-CA), Livermore, CA (United States)
  3. Univ. of Dortmund (Germany)
  4. Georgia Institute of Technology, Atlanta, GA (United States)

A technique for nondestructively imaging microstructures of materials in situ, especially a technique capable of delineating the time evolution of chemical changes or damage, will greatly benefit studies of materials processing and failure. X-ray tomographic microscopy (XTM) is a high resolution, three-dimensional inspection method which is capable of imaging composite materials microstructures with a resolution of a few micrometers. Because XTM is nondestructive, it will be possible to examine materials under load or during processing, and obtain three-dimensional images of fiber positions, microcracks, and pores. This will allow direct imaging of microstructural evolution, and will provide time-dependent data for comparison to fracture mechanics and processing models.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Energy Efficiency Office. Advanced Materials & Manufacturing Technologies Office (AMMTO); US Department of the Navy, Office of Naval Research (ONR); Federal Ministry of Education and Research (BMBF)
DOE Contract Number:
W-7405-ENG-48; AT-29-1-789; N0014-89J-1708; 03-BO1DOR
OSTI ID:
6360701
Report Number(s):
UCRL-JC-106127; CONF-901105-97; ON: DE91008505
Journal Information:
Materials Research Society Symposia Proceedings, Vol. 217; Conference: Fall Meeting of the Materials Research Society, Boston, MA (United States), 24 Nov - 1 Dec 1990; ISSN 0272-9172
Publisher:
Springer Nature
Country of Publication:
United States
Language:
English

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High resolution tomography with chemical specificity
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