X-ray Tomographic Microscopy (XTM)
X-ray tomographic microscopy (XTM) is a high resolution, three dimensional computed tomography (CT) system with a spatial resolution better that 0.005 mm. With this resolution it is now possible to image the microstructure of materials in millimeter-size samples. XTM differs from conventional optical and electron-beam microscopy in that the sample need not be harmed prior to characterization. There is no requirement for flat optical surfaces or thin sections. Materials are examined in their unaltered state. The three-dimensional imaging capability makes XTM ideally suited for materials research. In XTM, the x-ray attenuation coefficient at any location in a material is determined from a finite set of x-ray attenuation measurements (projection data) taken at different angles. The projection data is the transmitted x-ray intensity reaching a position-sensitive detector after passing through the sample. The data for reach angular view is stored and the three-dimensional image is generated by tomographic reconstruction techniques. The attenuation coefficient is directly related to material chemistry and density. High spatial resolution is required to provide microstructure information in the region of interest. 1 fig.
- Research Organization:
- Lawrence Livermore National Lab., CA (USA)
- Sponsoring Organization:
- DOE; USDOE, Washington, DC (USA)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 5859226
- Report Number(s):
- UCRL-JC-105138; CONF-9105166--5; ON: DE91011930
- Country of Publication:
- United States
- Language:
- English
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400102 -- Chemical & Spectral Procedures
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46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CADMIUM COMPOUNDS
CADMIUM TUNGSTATES
CAMERAS
COMPUTERIZED TOMOGRAPHY
CRYSTAL STRUCTURE
DATA ACQUISITION SYSTEMS
DESIGN
DIAGNOSTIC TECHNIQUES
ELECTROMAGNETIC RADIATION
EQUIPMENT
IMAGE PROCESSING
INORGANIC PHOSPHORS
IONIZING RADIATIONS
MATERIALS TESTING
MEASURING INSTRUMENTS
MICROSCOPES
MICROSCOPY
MICROSTRUCTURE
NONDESTRUCTIVE TESTING
OPTICAL SYSTEMS
PHOSPHORS
PHOTON COMPUTED TOMOGRAPHY
PROCESSING
RADIATION DETECTORS
RADIATION SOURCES
RADIATIONS
RESOLUTION
SCINTILLATION COUNTERS
SENSITIVITY
SOLID SCINTILLATION DETECTORS
SPATIAL RESOLUTION
TESTING
TOMOGRAPHY
TUNGSTATES
X RADIATION
X-RAY EQUIPMENT
X-RAY SOURCES