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Title: MOS structures based on epitaxial HgCdTe layers

Journal Article · · Inorg. Mater. (Engl. Transl.); (United States)
OSTI ID:6163707

The authors present the results of a study of the dependence of the surface photoelectromotive force at wavelengths of 3.39 and 10.6 micrometers on the field electrode for MOS structures prepared from epitaxial Hg /SUB 1-x/ Cd /SUB x/ Te layers (x=0.20-0.25). They analyze the nature of the inhomogeneities in the region near the surface of semiconducting samples prepared under various heat treatment conditions and present their findings in a series of three charts.

Research Organization:
V.D. Kuznetsov Siberian Physicotechnical Institute
OSTI ID:
6163707
Journal Information:
Inorg. Mater. (Engl. Transl.); (United States), Vol. 21:3; Other Information: Translated from Izvestiya Akademii Nauk SSSR, Neorganicheskie Materialy, Vol. 21, No. 3, pp. 393-396, March, 1985
Country of Publication:
United States
Language:
English