(Electron-beam induced spectroscopies at very high spatial resolution): Foreign trip report, April 26--March 12, 1988
At the Workshop on ''Electron-Beam Induced Spectroscopies at Very High Spatial Resolution,'' held in Aussois, France, the state of the art and where the field is (or should be) going was treated in depth. At the workshop the traveler made oral presentations on ionization localization effects on ALCHEMI measurements of Ni/sub 3/Al-based alloys, the complementary use of atom-probe field-ion microscopy, a rapporteur summary of the session on X-ray detectors, and a poster presentation on EXELFS characterization of amorphous and crystalline SiC and Al/sub 2/O/sub 3/. Much useful information was obtained at the workshop that will directly influence the analytical electron microscopy research at ORNL. In visits to the Ecole Polytechnique Federale Lausanne, Switzerland, the the Centre d'Etudes Nucleaires de Grenoble, France, and to the Universite Paris-Sud, Centre d'Orsay, France, the performance of and research conducted with Philips EM430ST, JEM 4000EX, and VG HB5 instruments with various attachments and modifications were discussed. Demonstration provided by the hosts on these special instruments were particularly useful.
- Research Organization:
- Oak Ridge National Lab., TN (USA)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 5860602
- Report Number(s):
- ORNL/FTR-2829; ON: DE89017303
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
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