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Title: New developments in photoconductive detectors (invited)

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147590· OSTI ID:451825
 [1]
  1. Los Alamos National Laboratory, NIS-5, E540, Los Alamos, New Mexico 87545 (United States)

Nearly ideal for detecting ionizing radiation, wide band-gap semiconductors present a possibility of having outstanding radiation hardness, fast charge collection, and low leakage current that will allow them to be used in high radiation, high temperature, and chemically aggressive environments. Over the past few years, the improvements in the electrical quality of wide band-gap semiconductors have progressed enormously. One particular wide band-gap semiconductor, diamond, has properties that may be ideal for radiation detection. Since the discovery of low pressure and low temperature deposition of diamond, the possibility of large area diamond films has become a reality. Over the past few years, great progress has been made in advancing the electrical quality of chemical-vapor-deposited (CVD) diamond. Presently, unprecedented diamond wafer size of 7 in. diam is possible. Due to both the present electrical quality and the available size, the utilization of diamond in radiation detection applications is not just a dream but a reality. The progression of CVD diamond{close_quote}s electrical properties in the last few years will be presented along with what is currently possible. Applications of CVD diamond for the National Ignition Facility (NIF) diagnostics will be reviewed. In addition, a brief review concerning other possible wide band-gap semiconductors for ICF diagnostics will be presented. {copyright} {ital 1997 American Institute of Physics.}

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
451825
Report Number(s):
CONF-960543-; ISSN 0034-6748; TRN: 97:006195
Journal Information:
Review of Scientific Instruments, Vol. 68, Issue 1; Conference: 11. annual high-temperature plasma diagnostics conference, Monterey, CA (United States), 12-16 May 1996; Other Information: PBD: Jan 1997
Country of Publication:
United States
Language:
English