The influence of layers number on the structure and ferroelectric properties of BZT films
- Department of Physics, FMIPA, Universitas Indonesia, Kampus UI Depok (Indonesia)
In recent study, the number of BaZrTiO{sub 3} layers were successively deposited on the Si-substrate by spin-coating process. The increasing of layers number affects the films structure which has been observed in XRD, while the ferroelectric properties have been analyzed by Sawyer-Tower. Perovskite tetragonal is observed in all films by the c-a axis ratio around 1.002 to 1.018, and the crystallite sizes were calculated from 75 nm to 129 nm. The maximum polarization value was found to be decreased during the increase of numbers of layers from 3 to 4 layers. On the contrary, the value was noticeably increased to the highest value when 5 layers film was applied. The highest maximum polarization were recorded at 31.68 µC/cm{sup 2} and 34.12 µC/cm{sup 2} respectively for 5 layer BZT films in each 8 at.% and 10 at.% Zr content under electrical fields injection as triangle signal of Alternating Current (AC) 50 V/60 Hz. As the number of layers increases, the polarization field magnitude is significantly decreased. The general results of structure and ferroelectric properties of BZT films have been studied in the influence of layers number to enhance the electrical behavior.
- OSTI ID:
- 22606698
- Journal Information:
- AIP Conference Proceedings, Vol. 1729, Issue 1; Conference: ISCPMS 2015: 1. international symposium on current progress in mathematics and sciences, Depok (Indonesia), 3-4 Nov 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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