Nanocrystalline Cu{sub 2}ZnSnSe{sub 4} thin films for solar cells application: Microdiffraction and structural characterization
- Departmento de Física, Grupo de Materiales Nanoestructurados y sus Aplicaciones, Universidad Nacional de Colombia, Bogotá 11001 (Colombia)
This work presents a study of the structural characterization of Cu{sub 2}ZnSnSe{sub 4} (CZTSe) thin films by X-ray diffraction (XRD) and microdiffraction measurements. Samples were deposited varying both mass (M{sub X}) and substrate temperature (T{sub S}) at which the Cu and ZnSe composites were evaporated. CZTSe samples were deposited by co-evaporation method in three stages. From XRD measurements, it was possible to establish, with increased Ts, the presence of binary phases associated with the quaternary composite during the material's growth process. A stannite-type structure in Cu{sub 2}ZnSnSe{sub 4} thin films and sizes of the crystallites varying between 30 and 40 nm were obtained. X-ray microdiffraction was used to investigate interface orientations and strain distributions when deposition parameters were varied. It was found that around the main peak, 2ϴ = 27.1°, the Cu{sub 1.8}Se and ZnSe binary phases predominate, which are formed during the subsequent material selenization stage. A Raman spectroscopy study revealed Raman shifts associated with the binary composites observed via XRD.
- OSTI ID:
- 22597834
- Journal Information:
- Journal of Applied Physics, Vol. 120, Issue 5; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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