Tailoring diffuse reflectance of inhomogeneous films containing microplatelets

Journal Article · Mon Oct 05 00:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4932576· OSTI ID:22482203

Baker, John M.; Flom, Zachary; Krishnamurthy, Srini ^[1]

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1. Applied Optics Laboratory, SRI International, Menlo Park, California 94025 (United States)

We develop an analytical model for calculating the diffuse reflectance of inhomogeneous films containing aligned microplatelets with diameters much greater than the wavelength. The scattering parameters are derived by modeling the platelets as one-dimensional thin films, and the overall diffuse reflectance of the slab is calculated using the Kubelka-Munk model. Our model predicts that reflection minima and maxima arising from coherent interference within the platelets are preserved in the diffuse reflectance of the disordered slab. Experimental validation of the model is provided by reflectance measurements (0.3–15 μm) of a solid aerosol film of aligned hexagonal boron nitride platelets.

• OSTI ID: 22482203
• Journal Information: Applied Physics Letters, Vol. 107, Issue 14; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
AEROSOLS
BORON NITRIDES
INTERFERENCE
REFLECTION
SCATTERING
SIMULATION
SLABS
THIN FILMS
VALIDATION
WAVELENGTHS