Optical phonons in PbTe/CdTe multilayer heterostructures

Journal Article · Fri May 15 00:00:00 EDT 2015 · Semiconductors

DOI:https://doi.org/10.1134/S1063782615050176· OSTI ID:22469959

Novikova, N. N.; Yakovlev, V. A. ^[1]; Karczewski, G. ^[2]; Aleshchenko, Yu. A.; Muratov, A. V.; Zavaritskaya, T. N.; Melnik, N. N. ^[3]

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1. Russian Academy of Sciences, Institute for Spectroscopy (Russian Federation)
2. Polish Academy of Sciences, Institute of Physics (Poland)
3. Russian Academy of Sciences, Lebedev Physical Institute (Russian Federation)

The infrared reflection spectra of PbTe/CdTe multilayer nanostructures grown by molecular-beam epitaxy are measured in the frequency range of 20–5000 cm{sup −1} at room temperature. The thicknesses and high-frequency dielectric constants of the PbTe and CdTe layers and the frequencies of the transverse optical (TO) phonons in these structures are determined from dispersion analysis of the spectra. It is found that the samples under study are characterized by two TO phonon frequencies, equal to 28 and 47 cm{sup −1}. The first frequency is close to that of TO phonons in bulk PbTe, and the second is assigned to the optical mode in structurally distorted interface layers. The Raman-scattering spectra upon excitation with the radiation of an Ar{sup +} laser at 514.5 nm are measured at room and liquid-nitrogen temperatures. The weak line at 106 cm{sup −1} observed in these spectra is attributed to longitudinal optical phonons in the interface layers.

• OSTI ID: 22469959
• Journal Information: Semiconductors, Vol. 49, Issue 5; Other Information: Copyright (c) 2015 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7826
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ARGON IONS
CADMIUM TELLURIDES
EXCITATION
FREQUENCY DEPENDENCE
INTERFACES
LASERS
LAYERS
LEAD TELLURIDES
LIQUIDS
MOLECULAR BEAM EPITAXY
NANOSTRUCTURES
NITROGEN
OPTICAL MODES
PALLADIUM TELLURIDES
PERMITTIVITY
PHONONS
RAMAN EFFECT
RAMAN SPECTROSCOPY
REFLECTION
TEMPERATURE RANGE 0273-0400 K