skip to main content

SciTech ConnectSciTech Connect

Title: C ion-implanted TiO{sub 2} thin film for photocatalytic applications

Third-generation TiO{sub 2} photocatalysts were prepared by implantation of C{sup +} ions into 110 nm thick TiO{sub 2} films. An accurate structural investigation was performed by Rutherford backscattering spectrometry, secondary ion mass spectrometry, X-ray diffraction, Raman-luminescence spectroscopy, and UV/VIS optical characterization. The C doping locally modified the TiO{sub 2} pure films, lowering the band-gap energy from 3.3 eV to a value of 1.8 eV, making the material sensitive to visible light. The synthesized materials are photocatalytically active in the degradation of organic compounds in water under both UV and visible light irradiation, without the help of any additional thermal treatment. These results increase the understanding of the C-doped titanium dioxide, helpful for future environmental applications.
Authors:
; ; ;  [1] ;  [1] ;  [2] ;  [1] ;  [2] ;  [3]
  1. CNR-IMM MATIS, Via S. Sofia 64, 95123 Catania (Italy)
  2. (Italy)
  3. Université de Toulouse, CEMES CNRS, 29 rue Marvig, BP 94347, 31055 Toulouse Cedex 4 (France)
Publication Date:
OSTI Identifier:
22399276
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 10; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CARBON IONS; DOPED MATERIALS; ENERGY GAP; EV RANGE; HEAT TREATMENTS; ION IMPLANTATION; IRRADIATION; LUMINESCENCE; MASS SPECTROSCOPY; ORGANIC COMPOUNDS; PHOTOCATALYSIS; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS; TITANIUM OXIDES; VISIBLE RADIATION; WATER; X-RAY DIFFRACTION