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Title: A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization

Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurementmore » (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.« less
Authors:
; ; ; ; ; ;  [1] ;  [2] ; ;  [3]
  1. Department of Physics, The Ohio State University, Columbus, Ohio 43210 (United States)
  2. Werum Software and Systems CIS AG, Wulf-Werum-Straße 3, 21337 Lüneburg (Germany)
  3. National Instruments, Austin, Texas 78759 (United States)
Publication Date:
OSTI Identifier:
22392279
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 12; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; DETECTION; ELECTRONIC EQUIPMENT; FEEDBACK; FIELD EFFECT TRANSISTORS; GRAPHENE; MICROSCOPES; PERTURBATION THEORY; PROBES; SIGNALS