Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Collins, Liam; Ahmadi, Mahshid; Wu, Ting; Hu, Bin; Kalinin, Sergei V.; Jesse, Stephen

doi:10.1021/acsnano.7b02114

Title: Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Journal Article · Sun Aug 06 00:00:00 EDT 2017 · ACS Nano

DOI:https://doi.org/10.1021/acsnano.7b02114· OSTI ID:1399933

^[1]; Ahmadi, Mahshid ^[2]; Wu, Ting ^[2]; Hu, Bin ^[2]; Kalinin, Sergei V. ^[1]; Jesse, Stephen ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Univ. of Tennessee, Knoxville, TN (United States)

The atomic force microscope (AFM) offers unparalleled insight into structure and material functionality across nanometer length scales. However, the spatial resolution afforded by the AFM tip is counterpoised by slow detection speeds compared to other common microscopy techniques (e.g. optical, scanning electron microscopy etc.). In this work, we develop an AFM imaging approach allowing ultrafast reconstruction of the tip-sample forces having ~2 orders of magnitude higher time resolution than standard detection methods. Fast free force recovery (F3R) overcomes the widely-viewed temporal bottleneck in AFM, i.e. the mechanical bandwidth of the cantilever, enabling time-resolved imaging at sub-bandwidth speeds. We demonstrate quantitative recovery of electrostatic forces with ~10 µs temporal resolution, free from cantilever ring-down effects. We further apply the F3R method to Kelvin probe force microscopy (KPFM) measurements. F3R-KPFM is an open loop imaging approach (i.e. no bias feedback), allowing ultrafast surface potential measurements (e.g. < 20 µs) to be performed at regular KPFM scan speeds. F3R-KPFM is demonstrated for exploration of ion migration in organometallic halide perovskites materials and shown to allow spatio-temporal imaging of positively charged ion migration under applied electric field, as well as subsequent formation of accumulated charges at the perovskite/electrode interface. In this work we demonstrate quantitative F3R-KPFM measurements – however, we fully expect the F3R approach to be valid for all modes of non-contact AFM operation, including non-invasive probing of ultrafast electrical and magnetic dynamics.

View Accepted Manuscript (DOE)

Cite

Export

Save

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1399933

Journal Information:: ACS Nano, Vol. 11, Issue 9; ISSN 1936-0851

Publisher:: American Chemical Society (ACS)Copyright Statement

Country of Publication:: United States

Language:: English

Citation Metrics:

Cited by: 61 works

Citation information provided by
Web of Science

References (89)

Scanning tunneling microscopy Binnig, G.; Rohrer, H. Surface Science, Vol. 126, Issue 1-3 https://doi.org/10.1016/0039-6028(83)90716-1	journal	March 1983
Atomic Force Microscope Binnig, G.; Quate, C. F.; Gerber, Ch. Physical Review Letters, Vol. 56, Issue 9 https://doi.org/10.1103/PhysRevLett.56.930	journal	March 1986
Atomic resolution with atomic force microscope Binnig, G.; Gerber, Ch.; Stoll, E. Surface Science, Vol. 189-190 https://doi.org/10.1016/S0039-6028(87)80407-7	journal	October 1987
Atomic force microscope–force mapping and profiling on a sub 100‐Å scale Martin, Y.; Williams, C. C.; Wickramasinghe, H. K. Journal of Applied Physics, Vol. 61, Issue 10 https://doi.org/10.1063/1.338807	journal	May 1987
Magnetic force microscopy of the submicron magnetic assembly in a magnetotactic bacterium Proksch, R. B.; Schäffer, T. E.; Moskowitz, B. M. Applied Physics Letters, Vol. 66, Issue 19 https://doi.org/10.1063/1.113508	journal	May 1995
Magnetic Force Microscopy Hartmann, U. Annual Review of Materials Science, Vol. 29, Issue 1 https://doi.org/10.1146/annurev.matsci.29.1.53	journal	August 1999
Deposition and imaging of localized charge on insulator surfaces using a force microscope Stern, J. E.; Terris, B. D.; Mamin, H. J. Applied Physics Letters, Vol. 53, Issue 26 https://doi.org/10.1063/1.100162	journal	December 1988
High‐resolution capacitance measurement and potentiometry by force microscopy Martin, Yves; Abraham, David W.; Wickramasinghe, H. Kumar Applied Physics Letters, Vol. 52, Issue 13 https://doi.org/10.1063/1.99224	journal	March 1988
Kelvin probe force microscopy Nonnenmacher, M.; O’Boyle, M. P.; Wickramasinghe, H. K. Applied Physics Letters, Vol. 58, Issue 25 https://doi.org/10.1063/1.105227	journal	June 1991
Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy Fumagalli, Laura; Ferrari, Giorgio; Sampietro, Marco Applied Physics Letters, Vol. 91, Issue 24 https://doi.org/10.1063/1.2821119	journal	December 2007
Quantitative Nanoscale Dielectric Microscopy of Single-Layer Supported Biomembranes Fumagalli, Laura; Ferrari, Giorgio; Sampietro, Marco Nano Letters, Vol. 9, Issue 4 https://doi.org/10.1021/nl803851u	journal	April 2009
Label-free identification of single dielectric nanoparticles and viruses with ultraweak polarization forces Fumagalli, Laura; Esteban-Ferrer, Daniel; Cuervo, Ana Nature Materials, Vol. 11, Issue 9 https://doi.org/10.1038/nmat3369	journal	July 2012
Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy Riedel, C.; Arinero, R.; Tordjeman, Ph. Journal of Applied Physics, Vol. 106, Issue 2 https://doi.org/10.1063/1.3182726	journal	July 2009
Kelvin Probe Force Microscopy of Periodic Ferroelectric Domain Structure in KTiOPO ₄ Crystals Shvebelman, Maria M.; Agronin, Alex G.; Urenski, Ronen P. Nano Letters, Vol. 2, Issue 5 https://doi.org/10.1021/nl025523e	journal	May 2002
Electrostatic force microscopy: principles and some applications to semiconductors Girard, Paul Nanotechnology, Vol. 12, Issue 4 https://doi.org/10.1088/0957-4484/12/4/321	journal	November 2001
Kelvin probe force microscopy and its application Melitz, Wilhelm; Shen, Jian; Kummel, Andrew C. Surface Science Reports, Vol. 66, Issue 1 https://doi.org/10.1016/j.surfrep.2010.10.001	journal	January 2011
KPFM and PFM of Biological Systems Rodriguez, B. J.; Kalinin, S. V. Kelvin Probe Force Microscopy https://doi.org/10.1007/978-3-642-22566-6_12	book	September 2011
Structural study of Langmuir–Blodgett films by scanning surface potential microscopy Fujihira, Masamichi Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 12, Issue 3 https://doi.org/10.1116/1.587242	journal	May 1994
Effect of SP-C on surface potential distribution in pulmonary surfactant: Atomic force microscopy and Kelvin probe force microscopy study Hane, Francis; Moores, Brad; Amrein, Matthias Ultramicroscopy, Vol. 109, Issue 8 https://doi.org/10.1016/j.ultramic.2009.03.046	journal	July 2009
Label-free and high-resolution protein/DNA nanoarray analysis using Kelvin probe force microscopy Sinensky, Asher K.; Belcher, Angela M. Nature Nanotechnology, Vol. 2, Issue 10 https://doi.org/10.1038/nnano.2007.293	journal	September 2007
Real-space observation of unbalanced charge distribution inside a perovskite-sensitized solar cell Bergmann, Victor W.; Weber, Stefan A. L.; Javier Ramos, F. Nature Communications, Vol. 5, Issue 1 https://doi.org/10.1038/ncomms6001	journal	September 2014
Surface potential measurement of aged Li-ion batteries using Kelvin probe microscopy Nagpure, Shrikant C.; Bhushan, Bharat; Babu, S. S. Journal of Power Sources, Vol. 196, Issue 3 https://doi.org/10.1016/j.jpowsour.2010.08.031	journal	February 2011
Internal potential mapping of charged solid-state-lithium ion batteries using in situ Kelvin probe force microscopy Masuda, Hideki; Ishida, Nobuyuki; Ogata, Yoichiro Nanoscale, Vol. 9, Issue 2 https://doi.org/10.1039/C6NR07971G	journal	January 2017
In-situ nanoscale mapping of surface potential in all-solid-state thin film Li-ion battery using Kelvin probe force microscopy Zhu, Jing; Zeng, Kaiyang; Lu, Li Journal of Applied Physics, Vol. 111, Issue 6 https://doi.org/10.1063/1.3699214	journal	March 2012
Li distribution in graphite anodes: A Kelvin Probe Force Microscopy approach Luchkin, Sergey Yu.; Amanieu, Hugues-Yanis; Rosato, Daniele Journal of Power Sources, Vol. 268 https://doi.org/10.1016/j.jpowsour.2014.06.143	journal	December 2014
Fast time-resolved electrostatic force microscopy: Achieving sub-cycle time resolution Karatay, Durmus U.; Harrison, Jeffrey S.; Glaz, Micah S. Review of Scientific Instruments, Vol. 87, Issue 5 https://doi.org/10.1063/1.4948396	journal	May 2016
Impact of microstructure on local carrier lifetime in perovskite solar cells de Quilettes, D. W.; Vorpahl, S. M.; Stranks, S. D. Science, Vol. 348, Issue 6235 https://doi.org/10.1126/science.aaa5333	journal	April 2015
Charge Recombination in Organic Photovoltaic Devices with High Open-Circuit Voltages Westenhoff, Sebastian; Howard, Ian A.; Hodgkiss, Justin M. Journal of the American Chemical Society, Vol. 130, Issue 41 https://doi.org/10.1021/ja803054g	journal	October 2008
Facet-dependent photovoltaic efficiency variations in single grains of hybrid halide perovskite Leblebici, Sibel Y.; Leppert, Linn; Li, Yanbo Nature Energy, Vol. 1, Issue 8 https://doi.org/10.1038/nenergy.2016.93	journal	July 2016
Interface engineering of highly efficient perovskite solar cells Zhou, H.; Chen, Q.; Li, G. Science, Vol. 345, Issue 6196 https://doi.org/10.1126/science.1254050	journal	July 2014
Benefit of Grain Boundaries in Organic–Inorganic Halide Planar Perovskite Solar Cells Yun, Jae S.; Ho-Baillie, Anita; Huang, Shujuan The Journal of Physical Chemistry Letters, Vol. 6, Issue 5 https://doi.org/10.1021/acs.jpclett.5b00182	journal	February 2015
Microscopic Investigation of Grain Boundaries in Organolead Halide Perovskite Solar Cells Li, Jiang-Jun; Ma, Jing-Yuan; Ge, Qian-Qing ACS Applied Materials & Interfaces, Vol. 7, Issue 51 https://doi.org/10.1021/acsami.5b09801	journal	December 2015
Enhancing Ion Migration in Grain Boundaries of Hybrid Organic-Inorganic Perovskites by Chlorine Yang, Bin; Brown, Chance C.; Huang, Jingsong Advanced Functional Materials, Vol. 27, Issue 26 https://doi.org/10.1002/adfm.201700749	journal	May 2017
High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy Sommerhalter, Ch.; Matthes, Th. W.; Glatzel, Th. Applied Physics Letters, Vol. 75, Issue 2 https://doi.org/10.1063/1.124357	journal	July 1999
Accuracy and resolution limits of Kelvin probe force microscopy Zerweck, Ulrich; Loppacher, Christian; Otto, Tobias Physical Review B, Vol. 71, Issue 12 https://doi.org/10.1103/PhysRevB.71.125424	journal	March 2005
The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes Ma, Zong Min; Kou, Lili; Naitoh, Yoshitaka Nanotechnology, Vol. 24, Issue 22 https://doi.org/10.1088/0957-4484/24/22/225701	journal	April 2013
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy Mélin, T.; Barbet, S.; Diesinger, H. Review of Scientific Instruments, Vol. 82, Issue 3 https://doi.org/10.1063/1.3516046	journal	March 2011
Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study Barbet, S.; Popoff, M.; Diesinger, H. Journal of Applied Physics, Vol. 115, Issue 14 https://doi.org/10.1063/1.4870710	journal	April 2014
Open loop Kelvin probe force microscopy with single and multi-frequency excitation Collins, L.; Kilpatrick, J. I.; Weber, S. A. L. Nanotechnology, Vol. 24, Issue 47 https://doi.org/10.1088/0957-4484/24/47/475702	journal	October 2013
Time-resolved electrostatic force microscopy of polymer solar cells Coffey, David C.; Ginger, David S. Nature Materials, Vol. 5, Issue 9 https://doi.org/10.1038/nmat1712	journal	August 2006
Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging Reid, Obadiah G.; Rayermann, Glennis E.; Coffey, David C. The Journal of Physical Chemistry C, Vol. 114, Issue 48 https://doi.org/10.1021/jp1056607	journal	October 2010
Submicrosecond Time Resolution Atomic Force Microscopy for Probing Nanoscale Dynamics Giridharagopal, Rajiv; Rayermann, Glennis E.; Shao, Guozheng Nano Letters, Vol. 12, Issue 2 https://doi.org/10.1021/nl203956q	journal	January 2012
Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits Murawski, J.; Graupner, T.; Milde, P. Journal of Applied Physics, Vol. 118, Issue 15 https://doi.org/10.1063/1.4933289	journal	October 2015
Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy Murawski, J.; Mönch, T.; Milde, P. Journal of Applied Physics, Vol. 118, Issue 24 https://doi.org/10.1063/1.4938529	journal	December 2015
Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy Garrett, Joseph L.; Munday, Jeremy N. Nanotechnology, Vol. 27, Issue 24 https://doi.org/10.1088/0957-4484/27/24/245705	journal	May 2016
Real-Time Nanoscale Open-Circuit Voltage Dynamics of Perovskite Solar Cells Garrett, Joseph L.; Tennyson, Elizabeth M.; Hu, Miao Nano Letters, Vol. 17, Issue 4 https://doi.org/10.1021/acs.nanolett.7b00289	journal	March 2017
Measurement of Surface Photovoltage by Atomic Force Microscopy under Pulsed Illumination Schumacher, Zeno; Miyahara, Yoichi; Spielhofer, Andreas Physical Review Applied, Vol. 5, Issue 4 https://doi.org/10.1103/PhysRevApplied.5.044018	journal	April 2016
The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach Schumacher, Zeno; Spielhofer, Andreas; Miyahara, Yoichi Applied Physics Letters, Vol. 110, Issue 5 https://doi.org/10.1063/1.4975629	journal	January 2017
Microsecond photocapacitance transients observed using a charged microcantilever as a gated mechanical integrator Dwyer, Ryan P.; Nathan, Sarah R.; Marohn, John A. Science Advances, Vol. 3, Issue 6 https://doi.org/10.1126/sciadv.1602951	journal	June 2017
Local potential and polarization screening on ferroelectric surfaces Kalinin, Sergei V.; Bonnell, Dawn A. Physical Review B, Vol. 63, Issue 12 https://doi.org/10.1103/PhysRevB.63.125411	journal	March 2001
Complete information acquisition in dynamic force microscopy Belianinov, Alexei; Kalinin, Sergei V.; Jesse, Stephen Nature Communications, Vol. 6, Issue 1 https://doi.org/10.1038/ncomms7550	journal	March 2015
Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution Martin, Y.; Wickramasinghe, H. K. Applied Physics Letters, Vol. 50, Issue 20 https://doi.org/10.1063/1.97800	journal	May 1987
Atomic force microscope with magnetic force modulation Florin, Ernst‐Ludwig; Radmacher, Manfred; Fleck, Bernhard Review of Scientific Instruments, Vol. 65, Issue 3 https://doi.org/10.1063/1.1145130	journal	March 1994
Photothermal modulation for oscillating mode atomic force microscopy in solution Ratcliff, Glenn C.; Erie, Dorothy A.; Superfine, Richard Applied Physics Letters, Vol. 72, Issue 15 https://doi.org/10.1063/1.121224	journal	April 1998
Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments Labuda, A.; Kobayashi, K.; Kiracofe, D. AIP Advances, Vol. 1, Issue 2 https://doi.org/10.1063/1.3601872	journal	January 2011
Probing Local Bias-Induced Transitions Using Photothermal Excitation Contact Resonance Atomic Force Microscopy and Voltage Spectroscopy Li, Qian; Jesse, Stephen; Tselev, Alexander ACS Nano, Vol. 9, Issue 2 https://doi.org/10.1021/nn506753u	journal	January 2015
A detailed analysis of the optical beam deflection technique for use in atomic force microscopy Putman, Constant A. J.; De Grooth, Bart G.; Van Hulst, Niek F. Journal of Applied Physics, Vol. 72, Issue 1 https://doi.org/10.1063/1.352149	journal	July 1992
Calibration of atomic‐force microscope tips Hutter, Jeffrey L.; Bechhoefer, John Review of Scientific Instruments, Vol. 64, Issue 7 https://doi.org/10.1063/1.1143970	journal	July 1993
Calibration of rectangular atomic force microscope cantilevers Sader, John E.; Chon, James W. M.; Mulvaney, Paul Review of Scientific Instruments, Vol. 70, Issue 10 https://doi.org/10.1063/1.1150021	journal	October 1999
Noninvasive determination of optical lever sensitivity in atomic force microscopy Higgins, M. J.; Proksch, R.; Sader, J. E. Review of Scientific Instruments, Vol. 77, Issue 1 https://doi.org/10.1063/1.2162455	journal	January 2006
Characterization and optimization of scan speed for tapping-mode atomic force microscopy Sulchek, T.; Yaralioglu, G. G.; Quate, C. F. Review of Scientific Instruments, Vol. 73, Issue 8 https://doi.org/10.1063/1.1488679	journal	August 2002
Calibration of higher eigenmodes of cantilevers Labuda, Aleksander; Kocun, Marta; Lysy, Martin Review of Scientific Instruments, Vol. 87, Issue 7 https://doi.org/10.1063/1.4955122	journal	July 2016
Quantifying electrostatic force contributions in electrically biased nanoscale interactions Maragliano, C.; Glia, A.; Stefancich, M. Journal of Applied Physics, Vol. 115, Issue 12 https://doi.org/10.1063/1.4869663	journal	March 2014
Breaking the limits of structural and mechanical imaging of the heterogeneous structure of coal macerals Collins, L.; Tselev, A.; Jesse, S. Nanotechnology, Vol. 25, Issue 43 https://doi.org/10.1088/0957-4484/25/43/435402	journal	October 2014
Full Information Acquisition in Scanning Probe Microscopy Jesse, S.; Somnath, S.; Collins, L. Microscopy Today, Vol. 25, Issue 4 https://doi.org/10.1017/S1551929517000633	journal	July 2017
Imaging via complete cantilever dynamic detection: general dynamic mode imaging and spectroscopy in scanning probe microscopy Somnath, Suhas; Collins, Liam; Matheson, Michael A. Nanotechnology, Vol. 27, Issue 41 https://doi.org/10.1088/0957-4484/27/41/414003	journal	September 2016
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy Jesse, Stephen; Kalinin, Sergei V. Nanotechnology, Vol. 20, Issue 8 https://doi.org/10.1088/0957-4484/20/8/085714	journal	February 2009
Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface Hudlet, S.; Saint Jean, M.; Guthmann, C. The European Physical Journal B, Vol. 2, Issue 1 https://doi.org/10.1007/s100510050219	journal	April 1998
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy Collins, Liam; Belianinov, Alex; Somnath, Suhas Nanotechnology, Vol. 27, Issue 10 https://doi.org/10.1088/0957-4484/27/10/105706	journal	February 2016
G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics Collins, Liam; Belianinov, Alex; Proksch, Roger Applied Physics Letters, Vol. 108, Issue 19 https://doi.org/10.1063/1.4948601	journal	May 2016
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space Collins, Liam; Belianinov, Alex; Somnath, Suhas Scientific Reports, Vol. 6, Issue 1 https://doi.org/10.1038/srep30557	journal	August 2016
The emergence of perovskite solar cells Green, Martin A.; Ho-Baillie, Anita; Snaith, Henry J. Nature Photonics, Vol. 8, Issue 7, p. 506-514 https://doi.org/10.1038/nphoton.2014.134	journal	July 2014
Solar cell efficiency tables (version 50) Green, Martin A.; Hishikawa, Yoshihiro; Warta, Wilhelm Progress in Photovoltaics: Research and Applications, Vol. 25, Issue 7 https://doi.org/10.1002/pip.2909	journal	June 2017
Efficient and stable solution-processed planar perovskite solar cells via contact passivation Tan, Hairen; Jain, Ankit; Voznyy, Oleksandr Science, Vol. 355, Issue 6326 https://doi.org/10.1126/science.aai9081	journal	February 2017
Metal-halide perovskites for photovoltaic and light-emitting devices Stranks, Samuel D.; Snaith, Henry J. Nature Nanotechnology, Vol. 10, Issue 5 https://doi.org/10.1038/nnano.2015.90	journal	May 2015
Resolving Weak Light of Sub-picowatt per Square Centimeter by Hybrid Perovskite Photodetectors Enabled by Noise Reduction Fang, Yanjun; Huang, Jinsong Advanced Materials, Vol. 27, Issue 17 https://doi.org/10.1002/adma.201500099	journal	March 2015
Detection of gamma photons using solution-grown single crystals of hybrid lead halide perovskites Yakunin, Sergii; Dirin, Dmitry N.; Shynkarenko, Yevhen Nature Photonics, Vol. 10, Issue 9 https://doi.org/10.1038/nphoton.2016.139	journal	July 2016
Sensitive X-ray detectors made of methylammonium lead tribromide perovskite single crystals Wei, Haotong; Fang, Yanjun; Mulligan, Padhraic Nature Photonics, Vol. 10, Issue 5 https://doi.org/10.1038/nphoton.2016.41	journal	March 2016
Perovskites: The Emergence of a New Era for Low-Cost, High-Efficiency Solar Cells Snaith, Henry J. The Journal of Physical Chemistry Letters, Vol. 4, Issue 21, p. 3623-3630 https://doi.org/10.1021/jz4020162	journal	October 2013
Ion Migration in Organometal Trihalide Perovskite and Its Impact on Photovoltaic Efficiency and Stability Yuan, Yongbo; Huang, Jinsong Accounts of Chemical Research, Vol. 49, Issue 2 https://doi.org/10.1021/acs.accounts.5b00420	journal	January 2016
Hysteresis, Stability, and Ion Migration in Lead Halide Perovskite Photovoltaics Miyano, Kenjiro; Yanagida, Masatoshi; Tripathi, Neeti The Journal of Physical Chemistry Letters, Vol. 7, Issue 12 https://doi.org/10.1021/acs.jpclett.6b00579	journal	May 2016
Can slow-moving ions explain hysteresis in the current–voltage curves of perovskite solar cells? Richardson, Giles; O'Kane, Simon E. J.; Niemann, Ralf G. Energy & Environmental Science, Vol. 9, Issue 4 https://doi.org/10.1039/C5EE02740C	journal	January 2016
Anomalous Hysteresis in Perovskite Solar Cells Snaith, Henry J.; Abate, Antonio; Ball, James M. The Journal of Physical Chemistry Letters, Vol. 5, Issue 9 https://doi.org/10.1021/jz500113x	journal	April 2014
Giant switchable photovoltaic effect in organometal trihalide perovskite devices Xiao, Zhengguo; Yuan, Yongbo; Shao, Yuchuan Nature Materials, Vol. 14, Issue 2 https://doi.org/10.1038/nmat4150	journal	December 2014
Electric-Field-Driven Reversible Conversion Between Methylammonium Lead Triiodide Perovskites and Lead Iodide at Elevated Temperatures Yuan, Yongbo; Wang, Qi; Shao, Yuchuan Advanced Energy Materials, Vol. 6, Issue 2 https://doi.org/10.1002/aenm.201501803	journal	December 2015
Anomalous photovoltaic effect in organic-inorganic hybrid perovskite solar cells Yuan, Yongbo; Li, Tao; Wang, Qi Science Advances, Vol. 3, Issue 3 https://doi.org/10.1126/sciadv.1602164	journal	March 2017
Local Time-Dependent Charging in a Perovskite Solar Cell Bergmann, Victor W.; Guo, Yunlong; Tanaka, Hideyuki ACS Applied Materials & Interfaces, Vol. 8, Issue 30 https://doi.org/10.1021/acsami.6b04104	journal	July 2016
Defect migration in methylammonium lead iodide and its role in perovskite solar cell operation Azpiroz, Jon M.; Mosconi, Edoardo; Bisquert, Juan Energy & Environmental Science, Vol. 8, Issue 7 https://doi.org/10.1039/C5EE01265A	journal	January 2015
High-quality bulk hybrid perovskite single crystals within minutes by inverse temperature crystallization Saidaminov, Makhsud I.; Abdelhady, Ahmed L.; Murali, Banavoth Nature Communications, Vol. 6, Article No. 7586 https://doi.org/10.1038/ncomms8586	journal	July 2015

Cited By (15)

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements Mascaro, Aaron; Miyahara, Yoichi; Enright, Tyler Beilstein Journal of Nanotechnology, Vol. 10 https://doi.org/10.3762/bjnano.10.62	journal	January 2019
Time resolved surface photovoltage measurements using a big data capture approach to KPFM Collins, Liam; Ahmadi, Mahshid; Qin, Jiajun Nanotechnology, Vol. 29, Issue 44 https://doi.org/10.1088/1361-6528/aad873	journal	September 2018
Imaging Metal Halide Perovskites Material and Properties at the Nanoscale Howard, John M.; Lahoti, Richa; Leite, Marina S. Advanced Energy Materials https://doi.org/10.1002/aenm.201903161	journal	December 2019
Mapping piezoelectric response in nanomaterials using a dedicated non-destructive scanning probe technique Calahorra, Yonatan; Smith, Michael; Datta, Anuja Nanoscale, Vol. 9, Issue 48 https://doi.org/10.1039/c7nr06714c	journal	January 2017
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V. Reports on Progress in Physics, Vol. 81, Issue 8 https://doi.org/10.1088/1361-6633/aab560	journal	July 2018
High-throughput sequential excitation for nanoscale mapping of electrochemical strain in granular ceria Huang, Boyuan; Esfahani, Ehsan Nasr; Yu, Junxi Nanoscale, Vol. 11, Issue 48 https://doi.org/10.1039/c9nr07438d	journal	January 2019
Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques Kilpatrick, Jason I.; Collins, Liam; Weber, Stefan A. L. Review of Scientific Instruments, Vol. 89, Issue 12 https://doi.org/10.1063/1.5025432	journal	December 2018
Intermodulation spectroscopy as an alternative to pump-probe for the measurement of fast dynamics at the nanometer scale Borgani, Riccardo; Haviland, David B. Review of Scientific Instruments, Vol. 90, Issue 1 https://doi.org/10.1063/1.5060727	journal	January 2019
Heterogeneity at multiple length scales in halide perovskite semiconductors Tennyson, Elizabeth M.; Doherty, Tiarnan A. S.; Stranks, Samuel D. Nature Reviews Materials, Vol. 4, Issue 9 https://doi.org/10.1038/s41578-019-0125-0	journal	July 2019
Application of pan-sharpening algorithm for correlative multimodal imaging using AFM-IR Borodinov, Nikolay; Bilkey, Natasha; Foston, Marcus npj Computational Materials, Vol. 5, Issue 1 https://doi.org/10.1038/s41524-019-0186-z	journal	April 2019
Progress of Surface Science Studies on ABX ₃ ‐Based Metal Halide Perovskite Solar Cells Qiu, Longbin; He, Sisi; Ono, Luis K. Advanced Energy Materials, Vol. 10, Issue 13 https://doi.org/10.1002/aenm.201902726	journal	April 2020
Mapping piezoelectric response in nanomaterials using a dedicated non-destructive scanning probe technique Calahorra, Yonatan; Smith, Mike; Datta, Anuja Apollo - University of Cambridge Repository https://doi.org/10.17863/cam.18818	text	January 2017
Heterogeneity at multiple length scales in halide perovskite semiconductors Tennyson, Beth; Doherty, Tas; Stranks, Samuel Apollo - University of Cambridge Repository https://doi.org/10.17863/cam.41839	text	January 2019
Intermodulation spectroscopy as an alternative to pump-probe for the measurement of fast dynamics at the nanometer scale Borgani, Riccardo; Haviland, David B. arXiv https://doi.org/10.48550/arxiv.1809.08058	text	January 2018
High-veracity functional imaging in scanning probe microscopy via Graph-Bootstrapping Li, Xin; Collins, Liam; Miyazawa, Keisuke Nature Communications, Vol. 9, Issue 1 https://doi.org/10.1038/s41467-018-04887-1	journal	June 2018

Similar Records

Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space

Journal Article · Fri Aug 12 00:00:00 EDT 2016 · Scientific Reports · OSTI ID:1399933

Balke, Nina; Kalinin, Sergei V.; Jesse, Stephen; +3 more

Direct Imaging of Protein Organization in an Intact Bacterial Organelle Using High-Resolution Atomic Force Microscopy

Journal Article · Mon Nov 14 00:00:00 EST 2016 · ACS Nano · OSTI ID:1399933

Kumar, Sandip; Cartron, Michaël L.; Mullin, Nic; +4 more

High-speed atomic force microscope based on an astigmatic detection system

Journal Article · Wed Oct 15 00:00:00 EDT 2014 · Review of Scientific Instruments · OSTI ID:1399933

Liao, H. -S.; Chen, Y. -H.; Hwu, E. -T.; +5 more

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY

Title: Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Citation Formats

References (89)

Cited By (15)

Similar Records

Related Subjects