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Title: Diagnosis of a two wire X-pinch by X-ray absorption spectroscopy utilizing a doubly curved ellipsoidal crystal

X-ray absorption spectroscopy is a powerful tool for the diagnosis of plasmas over a wide range of both temperature and density. However, such a measurement is often limited to probing plasmas with temperatures well below that of the x-ray source in order to avoid object plasma emission lines from obscuring important features of the absorption spectrum. This has excluded many plasmas from being investigated by this technique. We have developed an x-ray spectrometer that provides the ability to record absorption spectra from higher temperature plasmas than the usual approach allows without the risk of data contamination by line radiation emitted by the plasma under study. This is accomplished using a doubly curved mica crystal which is bent both elliptically and cylindrically. We present here initial absorption spectra obtained from an aluminum x-pinch plasma.
Authors:
; ; ; ;  [1]
  1. Cornell University, 439 Rhodes Hall, Ithaca, NY 14853 (United States)
Publication Date:
OSTI Identifier:
22390817
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1639; Journal Issue: 1; Conference: 9. International Conference on Dense Z Pinches, Napa, CA (United States), 3-7 Aug 2014; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ALUMINIUM; CRYSTALS; ELECTRON TEMPERATURE; ION TEMPERATURE; LINEAR PINCH DEVICES; PLASMA DIAGNOSTICS; PROBES; X-RAY SOURCES; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY