Point-projection x-ray radiography using an X pinch as the radiation source
Using an X pinch as a source of radiation for point-projection radiography, it is possible to project a high-resolution (1--10 {mu}m) shadow image of dense plasma or test objects onto x-ray-sensitive film. The emission characteristics of X pinches composed of a wide variety of materials have been studied using several diagnostics. The pulse duration and shape of the x-ray bursts were measured in the 1.5--6 keV band using fast diamond PCDs and an x-ray streak camera with sweep speeds as fast as 10 ns for the full sweep (3.5 cm). To investigate the line and continuum radiation emitted by the X pinches, a convex spectrograph using a mica or KAP crystal, and a spectrograph based on a spherically bent mica crystal were used. Summarizing the data, including radiography results, wires known to have slower expansion rates and high boiling temperatures (NiCr, Ti, Nb, Mo, Pd, Ta, W, and Pt) appeared to yield the smallest x-ray source sizes, i.e., gave the best spatial resolution in radiographs and provided subnanosecond time resolution. All of these materials yield intense continuum radiation with energy up to 6 keV, and the highest resolution images are achieved using only the continuum radiation from the X pinch.
- Sponsoring Organization:
- (US)
- OSTI ID:
- 40204866
- Journal Information:
- Review of Scientific Instruments, Vol. 72, Issue 1; Other Information: Othernumber: RSINAK000072000001000667000001; 683101CON; PBD: Jan 2001; ISSN 0034-6748
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
Similar Records
Determination of the size and structure of an X-pinch x-ray source from the diffraction pattern produced by microfabricated slits
Time-resolved investigation of subnanosecond radiation from Al wire hybrid X pinches