Force feedback microscopy based on an optical beam deflection scheme
- CFMC, Faculdade de Ciências, Universidade de Lisboa, Campo Grande, 1749-016 Lisboa (Portugal)
- Institut NEEL, F-38042 Grenoble (France)
- European Synchrotron Radiation Facility, 6 rue Jules Horowitz BP 220, 38043 Grenoble Cedex (France)
Force feedback microscopy circumvents the jump to contact in atomic force microscopy when using soft cantilevers and quantitatively measures the interaction properties at the nanoscale by simultaneously providing force, force gradient, and dissipation. The force feedback microscope developed so far used an optical cavity to measure the tip displacement. In this Letter, we show that the more conventional optical beam deflection scheme can be used to the same purpose. With this instrument, we have followed the evolution of the Brownian motion of the tip under the influence of a water bridge.
- OSTI ID:
- 22303951
- Journal Information:
- Applied Physics Letters, Vol. 105, Issue 1; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
Similar Records
System analysis of force feedback microscopy
Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision
Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy
Journal Article
·
Fri Feb 07 00:00:00 EST 2014
· Journal of Applied Physics
·
OSTI ID:22303951
+1 more
Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision
Journal Article
·
Sun Mar 15 00:00:00 EDT 2015
· Review of Scientific Instruments
·
OSTI ID:22303951
Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy
Journal Article
·
Sun May 15 00:00:00 EDT 2005
· Review of Scientific Instruments
·
OSTI ID:22303951
+2 more