System analysis of force feedback microscopy

Journal Article · Thu Feb 06 23:00:00 EST 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4864127· OSTI ID:22278122

Rodrigues, Mario S. ^[1]; Costa, Luca ^[2]; Chevrier, Joël ^[2]; Comin, Fabio ^[2]

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1. CFMC/Dep. de Física, Universidade de Lisboa, Campo Grande, 1749-016 Lisboa (Portugal)
2. European Synchrotron Radiation Facility, 6 rue Jules Horowitz BP 220, 38043 Grenoble Cedex (France)

It was shown recently that the Force Feedback Microscope (FFM) can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects of the associated real time control of the tip position. We take into account lever parameters such as the lever characteristics in its environment, spring constant, mass, dissipation coefficient, and the operating conditions such as controller gains and interaction force. We show how the controller parameters are determined so that the FFM functions at its best and estimate the bandwidth of the system under these conditions.

• OSTI ID: 22278122
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 5 Vol. 115; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ATOMIC FORCE MICROSCOPY
FEEDBACK
GAIN
MASS
MICROSCOPES
RESOLUTION
SYSTEMS ANALYSIS