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Title: Indirect measurement of thermal conductivity in silicon nanowires

We report indirect measurements of thermal conductivity in silicon nanostructures. We have exploited a measurement technique based on the Joule self-heating of silicon nanowires. A standard model for the electron mobility has been used to determine the temperature through the accurate measurement of the nanowire resistance. We have applied this technique to devices fabricated with a top-down process that yields nanowires together with large silicon areas used both as electrical and as thermal contacts. As there is crystalline continuity between the nanowires and the large contact areas, our thermal conductivity measurements are not affected by any temperature drop due to the contact thermal resistance. Our results confirm the observed reduction of thermal conductivity in nanostructures and are comparable with those previously reported in the literature, achieved with more complex measurement techniques.
Authors:
; ;  [1]
  1. Dipartimento di Ingegneria della Informazione, Università di Pisa, Via G.Caruso, I-56122 Pisa (Italy)
Publication Date:
OSTI Identifier:
22277975
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 8; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; COMPARATIVE EVALUATIONS; CRYSTALS; ELECTRIC CONDUCTIVITY; ELECTRON MOBILITY; JOULE HEATING; QUANTUM WIRES; SILICON; THERMAL CONDUCTIVITY