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Title: Investigation of the optical properties of MoS{sub 2} thin films using spectroscopic ellipsometry

Spectroscopic ellipsometry (SE) characterization of layered transition metal dichalcogenide (TMD) thin films grown by vapor phase sulfurization is reported. By developing an optical dispersion model, the extinction coefficient and refractive index, as well as the thickness of molybdenum disulfide (MoS{sub 2}) films, were extracted. In addition, the optical band gap was obtained from SE and showed a clear dependence on the MoS{sub 2} film thickness, with thinner films having a larger band gap energy. These results are consistent with theory and observations made on MoS{sub 2} flakes prepared by exfoliation, showing the viability of vapor phase derived TMDs for optical applications.
Authors:
; ;  [1] ;  [2] ;  [3] ; ;  [3] ;  [4] ;  [1] ;  [2] ;  [5]
  1. School of Chemistry, Trinity College Dublin, Dublin 2 (Ireland)
  2. (CRANN), Trinity College Dublin, Dublin 2 (Ireland)
  3. Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College Dublin, Dublin 2 (Ireland)
  4. (Ireland)
  5. (AMBER) Centre, Trinity College Dublin, Dublin 2 (Ireland)
Publication Date:
OSTI Identifier:
22257743
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 104; Journal Issue: 10; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ELLIPSOMETRY; MOLYBDENUM SULFIDES; OPTICAL DISPERSION; REFRACTIVE INDEX; THIN FILMS; TRANSITION ELEMENTS