A nitrilo-tri-acetic-acid/acetic acid route for the deposition of epitaxial cerium oxide films as high temperature superconductor buffer layers
- Department of Inorganic and Physical Chemistry, Ghent University, Krijgslaan 281 - S3, 9000 Gent (Belgium)
A water based cerium oxide precursor solution using nitrilo-tri-acetic-acid (NTA) and acetic acid as complexing agents is described in detail. This precursor solution is used for the deposition of epitaxial CeO{sub 2} layers on Ni-5at%W substrates by dip-coating. The influence of the complexation behavior on the formation of transparent, homogeneous solutions and gels has been studied. It is found that ethylenediamine plays an important role in the gelification. The growth conditions for cerium oxide films were Ar-5% gas processing atmosphere, a solution concentration level of 0.25 M, a dwell time of 60 min at 900 {sup o}C and 5-30 min at 1050 {sup o}C. X-ray diffraction (XRD), scanning electron microscope (SEM), atomic force microscopy (AFM), pole figures and spectroscopic ellipsometry were used to characterize the CeO{sub 2} films with different thicknesses. Attenuated total reflection-Fourier transform infrared (ATR-FTIR) was used to determine the carbon residue level in the surface of the cerium oxide film, which was found to be lower than 0.01%. Textured films with a thickness of 50 nm were obtained. - Graphical abstract: Study of the complexation and hydrolysis behavior of Ce{sup 4+} ions in the presence of nitrilo-tri-acetic acid and the subsequent development of an aqueous chemical solution deposition route suited for the processing of textured CeO{sub 2} buffer layers on Ni-W tapes.
- OSTI ID:
- 21432481
- Journal Information:
- Journal of Solid State Chemistry, Vol. 183, Issue 9; Other Information: DOI: 10.1016/j.jssc.2010.07.009; PII: S0022-4596(10)00291-4; Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; ISSN 0022-4596
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ACETIC ACID
ATOMIC FORCE MICROSCOPY
CERIUM IONS
CERIUM OXIDES
DIP COATING
EPITAXY
FOURIER TRANSFORMATION
HIGH-TC SUPERCONDUCTORS
INFRARED SPECTRA
SCANNING ELECTRON MICROSCOPY
SOL-GEL PROCESS
TEMPERATURE RANGE 1000-4000 K
THIN FILMS
X-RAY DIFFRACTION
CARBOXYLIC ACIDS
CERIUM COMPOUNDS
CHALCOGENIDES
CHARGED PARTICLES
COHERENT SCATTERING
CRYSTAL GROWTH METHODS
DEPOSITION
DIFFRACTION
ELECTRON MICROSCOPY
FILMS
INTEGRAL TRANSFORMATIONS
IONS
MICROSCOPY
MONOCARBOXYLIC ACIDS
ORGANIC ACIDS
ORGANIC COMPOUNDS
OXIDES
OXYGEN COMPOUNDS
RARE EARTH COMPOUNDS
SCATTERING
SPECTRA
SUPERCONDUCTORS
SURFACE COATING
TEMPERATURE RANGE
TRANSFORMATIONS
TYPE-II SUPERCONDUCTORS