Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
- Institute of Physics, Academia Sinica, Taipei 115, Taiwan (China)
- Xradia Inc., 5052 Commercial Circle, Concord, California 94520 (United States)
- National Synchrotron Radiation Research Center, Hsinchu 300, Taiwan (China)
- Center for Nanomedicine, National Health Research Institutes, Miaoli 350, Taiwan (China)
- X-ray Imaging Center, Pohang University of Science and Technology, Pohang 790-784 (Korea, Republic of)
- Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne (Switzerland)
Substantial improvements in the nanofabrication and characteristics of gold Fresnel zone plates yielded unprecedented resolution levels in hard-x-ray microscopy. Tests performed on a variety of specimens with 8-10 keV photons demonstrated a first-order lateral resolution below 40 nm based on the Rayleigh criterion. Combined with the use of a phase contrast technique, this makes it possible to view features in the 30 nm range; good-quality images can be obtained at video rate, down to 50 ms/frame. The important repercussions on materials science, nanotechnology, and the life sciences are discussed.
- OSTI ID:
- 21120584
- Journal Information:
- Applied Physics Letters, Vol. 92, Issue 10; Other Information: DOI: 10.1063/1.2857476; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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