Hard x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution.
Substantial improvements in the nanofabrication and characteristics of gold Fresnel zone plates yielded unprecedented resolution levels in hard-x-ray microscopy. Tests performed on a variety of specimens with 8-10 keV photons demonstrated a first-order lateral resolution below 40 nm based on the Rayleigh criterion. Combined with the use of a phase contrast technique, this makes it possible to view features in the 30 nm range; good-quality images can be obtained at video rate, down to 50 ms/frame. The important repercussions on materials science, nanotechnology, and the life sciences are discussed.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); National Science and Technology Program for Nanosciences and Nanotechnology; Thematic Research Project of Academia Sinica; National Synchrotron Radiation Research Center (Taiwan); Creative Research Initiatives of MOST/KOSEF; Leenards and Jeantet Foundations; EPFL; Swiss Fonde National de la Recherche Scientifique
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 927999
- Report Number(s):
- ANL/XSD/JA-61165; APPLAB; TRN: US0804687
- Journal Information:
- Appl. Phys. Lett., Vol. 92, Issue Mar. 10, 2008; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- ENGLISH
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