Sample handler for x-ray tomographic microscopy and image-guided failure assessment

Journal Article · Fri Jul 15 00:00:00 EDT 2005 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1979475· OSTI ID:20722978

Wyss, Peter; Thurner, Philipp; Broennimann, Rolf; Sennhauser, Urs; Stampanoni, Marco; Abela, Rafael; Mueller, Ralph ^[1]

---

1. EMPA, Swiss Federal Laboratories for Materials Testing and Research, Electronics/Metrology, Ueberlandstrasse 129, CH-8600 Duebendorf (Switzerland)

X-ray tomographic microscopy (XTM) yields a three-dimensional data model of an investigated specimen. XTM providing micrometer resolution requires synchrotron light, high resolution area detectors, and a precise sample handler. The sample handler has a height of 270 mm only, is usable for 1 {mu}m resolution, and is able to carry loading machines with a weight of up to 20 kg. This allows exposing samples to load between scans for image-guided failure assessment. This system has been used in the XTM end station of the materials science beamline of the Swiss Light Source at the Paul Scherrer Institut.

• OSTI ID: 20722978
• Journal Information: Review of Scientific Instruments, Vol. 76, Issue 7; Other Information: DOI: 10.1063/1.1979475; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGES
FAILURES
HEIGHT
IMAGES
LOADING
MICROSCOPY
RESOLUTION
SAMPLE HOLDERS
SWISS LIGHT SOURCE
SYNCHROTRONS
THREE-DIMENSIONAL CALCULATIONS
TOMOGRAPHY
VISIBLE RADIATION
X RADIATION