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Title: TOMCAT: A beamline for TOmographic Microscopy and Coherent rAdiology experimenTs

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2436193· OSTI ID:21052651
; ; ; ; ; ; ;  [1]; ;  [2]
  1. Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen (Switzerland)
  2. Division of Mechanical Engineering Sciences, Paul Scherrer Institut, CH-5232 Villigen (Switzerland)

Synchrotron-based X-ray Tomographic Microscopy (SRXTM) is nowadays a powerful technique for non-destructive, high-resolution investigations of a broad kind of materials. High-brilliance and high-coherence third generation synchrotron radiation facilities allow micrometer and sub-micrometer, quantitative, three-dimensional imaging within very short time and extend the traditional absorption imaging technique to edge-enhanced and phase-sensitive measurements. At the Swiss Light Source, a new, tomography dedicated beamline called TOMCAT has been built recently. The new beamline get photons from a 2.9 T superbend with a critical energy of 11.1 keV. This makes energies above 20 keV easily accessible. To guarantee the best beam quality (stability and homogeneity), the number of optical elements has been kept to a minimum. A Double Crystal Multilayer Monochromator (DCMM) covers an energy range between 8 and 45 keV with a bandwidth of a few percent down to 10-4. The beamline can also be operated in white-beam mode, providing the ideal conditions for real-time coherent radiology.

OSTI ID:
21052651
Journal Information:
AIP Conference Proceedings, Vol. 879, Issue 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436193; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English

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