A-site stoichiometry and piezoelectric response in thin film PbZr1-xTixO3

Marincel, Dan; Jesse, Stephen; Belianinov, Alex; Okatan, Mahmut Baris; Kalinin, Sergei V.; Jackson, T. N.; Randall, Clive; Trolier-McKinstry, Susan E

doi:10.1063/1.4921869

Title: A-site stoichiometry and piezoelectric response in thin film PbZr_1-xTi_xO₃

Journal Article · Fri May 29 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4921869· OSTI ID:1265758

Marincel, Dan ^[1]; Jesse, Stephen ^[2]; Belianinov, Alex ^[2]; Okatan, Mahmut Baris ^[2]; Kalinin, Sergei V. ^[2]; Jackson, T. N. ^[1]; Randall, Clive ^[1]; Trolier-McKinstry, Susan E ^[1]

Pennsylvania State Univ., University Park, PA (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Lead zirconate titanate (PZT) films with Zr/Ti ratios of 52/48 and 30/70 annealed at varying partial pressures of PbO within the perovskite phase field exhibited permittivities of 1150 and 600, respectively, with loss tangents of 0.02. Many of the functional properties, including the permittivity, piezoelectricity as indicated via the Rayleigh coefficients, and the aging rates were found to be weakly dependent of the lead content in the single phase field. Minor polarization electric field hysteresis loops and piezoelectric coefficient e_31,f values after a hot poling process suggest that the point defect helps stabilize the aligned domain states. Measurements of the local nonlinear response show an increased low response cluster size with decreasing PbO content, indicating that PbO deficiency acts to reduce domain wall motion where it is already low

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1265758

Journal Information:: Journal of Applied Physics, Vol. 117; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 13 works

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Polarity dependent DC resistance degradation and electrical breakdown in Nb doped PZT films Akkopru-Akgun, Betul; Zhu, Wanlin; Randall, Clive A. APL Materials, Vol. 7, Issue 12 https://doi.org/10.1063/1.5115391	journal	December 2019
Scaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process-Structure-Property Relations Ihlefeld, Jon F.; Harris, David T.; Keech, Ryan Journal of the American Ceramic Society, Vol. 99, Issue 8 https://doi.org/10.1111/jace.14387	journal	July 2016
Influence of PbO content on the dielectric failure of Nb-doped {100}-oriented lead zirconate titanate films Zhu, Wanlin; Borman, Trent; DeCesaris, Kory Journal of the American Ceramic Society, Vol. 102, Issue 4 https://doi.org/10.1111/jace.16000	journal	September 2018
Influence of PbO stoichiometry on the properties of PZT ceramics and multilayer actuators Oldenkotte, Moritz; Kungl, Hans; Eichel, Rüdiger‐A. Journal of the American Ceramic Society, Vol. 102, Issue 9 https://doi.org/10.1111/jace.16417	journal	March 2019
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Title: A-site stoichiometry and piezoelectric response in thin film PbZr_1-xTi_xO₃