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Title: Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation.

Abstract not provided.
Authors:
; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1255787
Report Number(s):
SAND2015-4235C
590329
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Nuclear and Space Radiation Effects Conference held July 13-17, 2015 in Boston, MA.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English