Growth and characterization of detector-grade CdMnTe by the vertical Bridgman technique
Journal Article
·
· Journal of Crystal Growth
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Brookhaven National Lab. (BNL), Upton, NY (United States); Alabama A&M Univ., Normal, AL (United States)
We grew Cd1-xMnxTe crystals with a nominal Mn concentration of 5% by the vertical Bridgman growth technique. The compositional variation along the length of the grown ingot was studied by powder X-ray diffraction. The composition was found to be uniform along the growth direction. The achieved resistivity was 1-2.5 x1010 ohm-cm with a mobility-lifetime (μτ) product value for electrons of ~1.7x10-3 cm2/V. An energy resolution of ~7.5% at 662 keV was achieved for a 9-mm long Frisch grid detector fabricated from an ingot grown using as-received starting materials.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States); Alabama A&M Univ., Normal, AL (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Nonproliferation; Dept. of Homeland Security (DHS) (United States); Nuclear Regulatory Commission (NRC) (United States)
- Grant/Contract Number:
- SC0012704; 2012-DN-077-ARI065-03; NRC-27-10-514
- OSTI ID:
- 1438178
- Alternate ID(s):
- OSTI ID: 1251781
- Report Number(s):
- BNL-205682-2018-JAAM; PII: S0022024815007368
- Journal Information:
- Journal of Crystal Growth, Vol. 437; ISSN 0022-0248
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 25 works
Citation information provided by
Web of Science
Web of Science
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