Note: Advancement in tip etching for preparation of tunable size scanning tunneling microscopy tips

Corbett, J. P.; Pandya, S. G.; Mandru, A. -O.; Pak, J.; Kordesch, M. E.; Smith, A. R.

doi:10.1063/1.4907706

Title: Note: Advancement in tip etching for preparation of tunable size scanning tunneling microscopy tips

Journal Article · Thu Feb 12 00:00:00 EST 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4907706· OSTI ID:1737521

Corbett, J. P. ^[1]; Pandya, S. G. ^[1];

^[1]; Pak, J. ^[1]; Kordesch, M. E. ^[1];

^[1]

Ohio Univ., Athens, OH (United States). Nanoscale and Quantum Phenomena Inst.

The two aspects of a scanning tunneling microscopy tip, the macroscopic profile and the nanoscale apex, can be tailored by controlling the tension during electrochemical etching and the solution-electrode contact area via acetone vapor. The apex diameter is shown to be proportional to the square root of the tension, and is demonstrated over apex diameters of 150-500 nm. The apex was found to be created in four distinct shapes where a secondary etching can reshape the tip into a single geometry. Improvement in tip height and stability of the profile are demonstrated versus a non-acetone fabrication control.

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Research Organization:: Ohio Univ., Athens, OH (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division

Grant/Contract Number:: FG02-06ER46317

OSTI ID:: 1737521

Alternate ID(s):: OSTI ID: 1228543

Report Number(s):: 7-6; TRN: US2205337

Journal Information:: Review of Scientific Instruments, Vol. 86, Issue 2; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 3 works

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References (11)

Effects of tip size and asymmetry on scanning tunneling microscope topographs Snyder, Eric J.; Eklund, Elliott A.; Williams, R. Stanley Surface Science, Vol. 239, Issue 1-2 https://doi.org/10.1016/0039-6028(90)90603-6	journal	December 1990
Short CommunicationThe electrochemical etching of tungsten STM tips Kerfriden, Sophie; Nahlé, Ayssar H.; Campbell, Sheelagh A. Electrochimica Acta, Vol. 43, Issue 12-13 https://doi.org/10.1016/S0013-4686(97)00316-2	journal	May 1998
The engineering properties of tungsten and tungsten alloys Schmidt, F. F.; Ogden, H. R. https://doi.org/10.21236/AD0425547	report	September 1963
Method of electrochemical etching of tungsten tips with controllable profiles Chang, Wei-Tse; Hwang, Ing-Shouh; Chang, Mu-Tung Review of Scientific Instruments, Vol. 83, Issue 8 https://doi.org/10.1063/1.4745394	journal	August 2012
The art and science and other aspects of making sharp tips Melmed, Allan J. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 9, Issue 2 https://doi.org/10.1116/1.585467	journal	March 1991
Very sharp platinum tips for scanning tunneling microscopy Libioulle, L.; Houbion, Y.; Gilles, J. ‐M. Review of Scientific Instruments, Vol. 66, Issue 1 https://doi.org/10.1063/1.1146153	journal	January 1995
Tungstate sharpening: A versatile method for extending the profile of ultra sharp tungsten probes Stone, R.; Rosamond, M.; Coleman, K. Review of Scientific Instruments, Vol. 84, Issue 3 https://doi.org/10.1063/1.4797483	journal	March 2013
Preparation of platinum/iridium scanning probe microscopy tips So/rensen, A. H.; Hvid, U.; Mortensen, M. W. Review of Scientific Instruments, Vol. 70, Issue 7 https://doi.org/10.1063/1.1149891	journal	July 1999
Etch-stop method for reliably fabricating sharp yet mechanically stable scanning tunneling microscope tips Basnet, Gobind; Kevin Schoelz, James; Xu, Peng Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 31, Issue 4 https://doi.org/10.1116/1.4812796	journal	July 2013
Efficient electrochemical etching method to fabricate sharp metallic tips for scanning probe microscopes Kim, Pilkyu; Kim, Jun Ho; Jeong, Mun Seok Review of Scientific Instruments, Vol. 77, Issue 10 https://doi.org/10.1063/1.2358703	journal	October 2006
Effect of fabrication process parameters on the apex-radius of STM tungsten nanotip Tahmasebipour, Gh.; Hojjat, Y.; Ahmadi, V. Scanning, Vol. 31, Issue 2 https://doi.org/10.1002/sca.20142	journal	March 2009

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77 NANOSCIENCE AND NANOTECHNOLOGY
36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
scanning tunneling microscopy
electrochemical etching
tip apex diameter
acetone vapor

Title: Note: Advancement in tip etching for preparation of tunable size scanning tunneling microscopy tips

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References (11)

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