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Title: Micro-X-ray Fluorescence (MXRF) Direct Solids

MXRF complements other imaging techniques such as SEM-EDS, and MXRF is a method of choice for: Large area analyses (up to 100 cm2 areas); True NDA – No damage from X-ray beam; Medium and high atomic number elemental analyses; Non-conducting materials (eg. plastics, HEPA filters, etc.); Samples incompatible with vacuum (eg. liquids, moist samples). Presented are several MXRF BSAP-related applications.
Authors:
 [1]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
OSTI Identifier:
1172204
Report Number(s):
LA-UR--15-21580
DOE Contract Number:
AC52-06NA25396
Resource Type:
Technical Report
Research Org:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA); DHS
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY