Application of Micro-XRF for Nuclear Materials Characterization and Problem Solving

Conference · Thu Aug 02 04:00:00 EDT 2012

DOI:https://doi.org/10.1017/S0885715613000201· OSTI ID:1048358

Worley, Christopher G ^[1]; Tandon, Lav ^[1]; Martinez, Patrick T ^[1]; Decker, Diana L ^[1]; Schwartz, Daniel S ^[1]

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1. Los Alamos National Laboratory

Micro-X-ray fluorescence (MXRF) used for >> 20 years To date MXRF has been underutilized for nuclear materials (NM) spatially-resolved elemental characterization. Scanning electron microscopy (SEM) with EDX much more common for NM characterization at a micro scale. But MXRF fills gap for larger 10's microns to cm{sup 2} scales. Will present four interesting NM applications using MXRF. Demonstrated unique value of MXRF for various plutonium applications. Although SEM has much higher resolution, MXRF clearly better for these larger scale samples (especially non-conducting samples). MXRF useful to quickly identify insoluble particles in Pu/Np oxide. MXRF vital to locating HEPA filter Pu particles over cm{sup 2} areas which were then extracted for SEM morphology and particle size distribution analysis. MXRF perfect for surface swipes which are far too large for practical SEM imaging, and loose residue would contaminate SEM vacuum chamber. MXRF imaging of ER Plutonium metal warrants further studies to explore metal elemental heterogeneity.

• Research Organization: Los Alamos National Laboratory (LANL)
• Sponsoring Organization: DHS
• DOE Contract Number: AC52-06NA25396
• OSTI ID: 1048358
• Report Number(s): LA-UR-12-23811
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
DISTRIBUTION
FLUORESCENCE
MORPHOLOGY
PARTICLE SIZE
PLUTONIUM
RESIDUES
RESOLUTION
SCANNING ELECTRON MICROSCOPY