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Title: Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components

A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.
Authors:
; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1107341
Report Number(s):
8,549,363
12/727,967
DOE Contract Number:
B554331
Resource Type:
Patent
Research Org:
International Business Machines Corporation (Armonk, NY)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
97 MATHEMATICS AND COMPUTING