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Title: Interface Carriers and Enhanced Electron-Phonon Coupling Effect in Al2O3/TiO2 Heterostructure Revealed by Resonant Inelastic Soft X-Ray Scattering

Abstract

The electronic structure and the electron-phonon couplings in a novel mass-production-compatible Al2O3/TiO2 2D electron system (2DES) are investigated using resonant inelastic soft X-ray scattering. The experimental data from the samples of various TiO2 thicknesses unequivocally show that the Ti3+ state indeed exists at the deep interface to serve as an n-type dopant for the 2DES. Here, the electronic structure of Ti3+ species is scrutinized as entirely separated from that of the Ti4+ host lattice. Furthermore, features of sub-eV energy loss phonon modes are clearly observed, indicating substantial electron-phonon coupling effects. Such low energy loss features are enhanced in thinner TiO2 samples, implying that polaronic local lattice deformation is enhanced due to the presence of Ti3+. These findings suggest that the 2DES properties can be controlled via well-established TiO2 engineering, thereby enthroning the binary oxide heterostructure as a promising candidate for 2DES device applications.

Authors:
 [1]; ORCiD logo [2]; ORCiD logo [1]; ORCiD logo [1];  [3];  [3]; ORCiD logo [3]; ORCiD logo [4]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)
  3. Hanyang Univ., Ansan (Korea)
  4. Jeonbuk National Univ., Jeonju (Korea)
Publication Date:
Research Org.:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); Basic Science Research Program
OSTI Identifier:
1807543
Alternate Identifier(s):
OSTI ID: 1797842; OSTI ID: 1804881
Grant/Contract Number:  
AC02-05CH11231; AC02-76SF00515; 2018R1D1A1B07043427
Resource Type:
Accepted Manuscript
Journal Name:
Advanced Functional Materials
Additional Journal Information:
Journal Volume: 31; Journal Issue: 35; Journal ID: ISSN 1616-301X
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 2D electron gas; aluminum oxide; dd excitation; electron-phonon coupling; oxide heterostructures; resonant inelastic X-ray scattering; titanium oxide

Citation Formats

Shao, Yu‐Cheng, Kuo, Cheng‐Tai, Feng, Xuefei, Chuang, Yi‐De, Seok, Tae Jun, Choi, Ji Hyeon, Park, Tae Joo, and Cho, Deok‐Yong. Interface Carriers and Enhanced Electron-Phonon Coupling Effect in Al2O3/TiO2 Heterostructure Revealed by Resonant Inelastic Soft X-Ray Scattering. United States: N. p., 2021. Web. doi:10.1002/adfm.202104430.
Shao, Yu‐Cheng, Kuo, Cheng‐Tai, Feng, Xuefei, Chuang, Yi‐De, Seok, Tae Jun, Choi, Ji Hyeon, Park, Tae Joo, & Cho, Deok‐Yong. Interface Carriers and Enhanced Electron-Phonon Coupling Effect in Al2O3/TiO2 Heterostructure Revealed by Resonant Inelastic Soft X-Ray Scattering. United States. https://doi.org/10.1002/adfm.202104430
Shao, Yu‐Cheng, Kuo, Cheng‐Tai, Feng, Xuefei, Chuang, Yi‐De, Seok, Tae Jun, Choi, Ji Hyeon, Park, Tae Joo, and Cho, Deok‐Yong. Sun . "Interface Carriers and Enhanced Electron-Phonon Coupling Effect in Al2O3/TiO2 Heterostructure Revealed by Resonant Inelastic Soft X-Ray Scattering". United States. https://doi.org/10.1002/adfm.202104430. https://www.osti.gov/servlets/purl/1807543.
@article{osti_1807543,
title = {Interface Carriers and Enhanced Electron-Phonon Coupling Effect in Al2O3/TiO2 Heterostructure Revealed by Resonant Inelastic Soft X-Ray Scattering},
author = {Shao, Yu‐Cheng and Kuo, Cheng‐Tai and Feng, Xuefei and Chuang, Yi‐De and Seok, Tae Jun and Choi, Ji Hyeon and Park, Tae Joo and Cho, Deok‐Yong},
abstractNote = {The electronic structure and the electron-phonon couplings in a novel mass-production-compatible Al2O3/TiO2 2D electron system (2DES) are investigated using resonant inelastic soft X-ray scattering. The experimental data from the samples of various TiO2 thicknesses unequivocally show that the Ti3+ state indeed exists at the deep interface to serve as an n-type dopant for the 2DES. Here, the electronic structure of Ti3+ species is scrutinized as entirely separated from that of the Ti4+ host lattice. Furthermore, features of sub-eV energy loss phonon modes are clearly observed, indicating substantial electron-phonon coupling effects. Such low energy loss features are enhanced in thinner TiO2 samples, implying that polaronic local lattice deformation is enhanced due to the presence of Ti3+. These findings suggest that the 2DES properties can be controlled via well-established TiO2 engineering, thereby enthroning the binary oxide heterostructure as a promising candidate for 2DES device applications.},
doi = {10.1002/adfm.202104430},
journal = {Advanced Functional Materials},
number = 35,
volume = 31,
place = {United States},
year = {Sun Jun 20 00:00:00 EDT 2021},
month = {Sun Jun 20 00:00:00 EDT 2021}
}

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