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Title: Intrinsic Defect Properties in Halide Double Perovskites for Optoelectronic Applications

Abstract

Lead-free halide double perovskites with the formula of quaternary A 2 + B+B ' 3 + X 6 - have recently attracted intense interest as alternatives to lead-halide-perovskite-based optoelectronic materials for their nontoxicity and enhanced chemical and thermodynamic stability. However, the understanding of intrinsic defect properties and their effects on carrier transport and Fermi level tuning is still limited. In this paper, we show that, by exploring the phase diagram of a halide double perovskite, one can control the effects of intrinsic defects on carrier trapping and Fermi-level pinning. Furthermore, we reveal the ideal growth conditions to grow p type Cs 2 AgIn Cl 6 and Cs 2 AgBi Cl 6 as well as semi-insulating Cs 2 AgBi Br 6 with low trap density for targeted photovoltaic or visible light/radiation detection application.

Authors:
 [1];  [1];  [1]; ORCiD logo [2];  [1]
  1. Jilin Univ., Changchun (China). State Key Lab. of Superhard Materials, Key Lab. of Automobile Materials of MOE
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
National Natural Science Foundation of China (NSFC); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
OSTI Identifier:
1784206
Grant/Contract Number:  
AC05-00OR22725; 61722403; 11674121
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review Applied
Additional Journal Information:
Journal Volume: 10; Journal Issue: 4; Journal ID: ISSN 2331-7019
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; electronic structure; optoelectronics; point defects; vacancies; perovskite; photovoltaic absorbers; semiconductor compounds; first-principles

Citation Formats

Li, Tianshu, Zhao, Xingang, Yang, Dongwen, Du, Mao-Hua, and Zhang, Lijun. Intrinsic Defect Properties in Halide Double Perovskites for Optoelectronic Applications. United States: N. p., 2018. Web. doi:10.1103/physrevapplied.10.041001.
Li, Tianshu, Zhao, Xingang, Yang, Dongwen, Du, Mao-Hua, & Zhang, Lijun. Intrinsic Defect Properties in Halide Double Perovskites for Optoelectronic Applications. United States. https://doi.org/10.1103/physrevapplied.10.041001
Li, Tianshu, Zhao, Xingang, Yang, Dongwen, Du, Mao-Hua, and Zhang, Lijun. Thu . "Intrinsic Defect Properties in Halide Double Perovskites for Optoelectronic Applications". United States. https://doi.org/10.1103/physrevapplied.10.041001. https://www.osti.gov/servlets/purl/1784206.
@article{osti_1784206,
title = {Intrinsic Defect Properties in Halide Double Perovskites for Optoelectronic Applications},
author = {Li, Tianshu and Zhao, Xingang and Yang, Dongwen and Du, Mao-Hua and Zhang, Lijun},
abstractNote = {Lead-free halide double perovskites with the formula of quaternary A2+B+B'3+X6- have recently attracted intense interest as alternatives to lead-halide-perovskite-based optoelectronic materials for their nontoxicity and enhanced chemical and thermodynamic stability. However, the understanding of intrinsic defect properties and their effects on carrier transport and Fermi level tuning is still limited. In this paper, we show that, by exploring the phase diagram of a halide double perovskite, one can control the effects of intrinsic defects on carrier trapping and Fermi-level pinning. Furthermore, we reveal the ideal growth conditions to grow p type Cs2AgInCl6 and Cs2AgBiCl6 as well as semi-insulating Cs2AgBiBr6 with low trap density for targeted photovoltaic or visible light/radiation detection application.},
doi = {10.1103/physrevapplied.10.041001},
journal = {Physical Review Applied},
number = 4,
volume = 10,
place = {United States},
year = {Thu Oct 11 00:00:00 EDT 2018},
month = {Thu Oct 11 00:00:00 EDT 2018}
}

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