Advances in secondary ion mass spectrometry for N-doped niobium

Angle, Jonathan W.; Palczewski, Ari D.; Reece, Charles E.; Stevie, Fred A.; Kelley, Michael J.

doi:10.1116/6.0000848

Title: Advances in secondary ion mass spectrometry for N-doped niobium

Abstract

Accurate secondary ion mass spectroscopy measurement of nitrogen in niobium relies on the use of closely equivalent standards, made by ion implantation, to convert nitrogen signal intensity to nitrogen content by determination of relative sensitivity factors (RSFs). Accurate RSF values for ppm-range nitrogen contents are increasingly critical, as more precision is sought in processes for next-generation superconducting radiofrequency (SRF) accelerator cavities. Furthermore, factors influencing RSF value measurements were investigated with the aim of reliably attaining better than 10% accuracy in nitrogen concentrations at various depths into the bulk. This has been accomplished for materials typical of SRF cavities at the cost of increased attention to all aspects.

Authors:

Angle, Jonathan W. ^[1]; Palczewski, Ari D. ^[2];

^[2]; Stevie, Fred A. ^[3];

^[4]

Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
North Carolina State Univ., Raleigh, NC (United States). Analytical Instrumentation Facility
Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States); Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)

Publication Date:: Mon Mar 22 00:00:00 EDT 2021

Research Org.:: Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Nuclear Physics (NP)

OSTI Identifier:: 1771945

Report Number(s):: JLAB-ACC-20-3287; DOE/OR/23177-5079
Journal ID: ISSN 2166-2746; TRN: US2206922

Grant/Contract Number:: SC0014475; A05-06OR23177

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Vacuum Science and Technology B

Additional Journal Information:: Journal Volume: 39; Journal Issue: 2; Journal ID: ISSN 2166-2746

Publisher:: American Vacuum Society / AIP

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; electron backscatter diffraction; particle accelerators; superconductivity; depth profiling techniques; ion implantation; secondary ion mass spectrometry

Citation Formats


                    Angle, Jonathan W., Palczewski, Ari D., Reece, Charles E., Stevie, Fred A., and Kelley, Michael J. Advances in secondary ion mass spectrometry for N-doped niobium.  United States: N. p., 2021. 
Web.  doi:10.1116/6.0000848.

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                    Angle, Jonathan W., Palczewski, Ari D., Reece, Charles E., Stevie, Fred A., & Kelley, Michael J. Advances in secondary ion mass spectrometry for N-doped niobium.  United States.  https://doi.org/10.1116/6.0000848

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                    Angle, Jonathan W., Palczewski, Ari D., Reece, Charles E., Stevie, Fred A., and Kelley, Michael J. Mon .  
"Advances in secondary ion mass spectrometry for N-doped niobium".  United States.  https://doi.org/10.1116/6.0000848.  https://www.osti.gov/servlets/purl/1771945.

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@article{osti_1771945,

  title        = {Advances in secondary ion mass spectrometry for N-doped niobium},

  author       = {Angle, Jonathan W. and Palczewski, Ari D. and Reece, Charles E. and Stevie, Fred A. and Kelley, Michael J.},

  abstractNote = {Accurate secondary ion mass spectroscopy measurement of nitrogen in niobium relies on the use of closely equivalent standards, made by ion implantation, to convert nitrogen signal intensity to nitrogen content by determination of relative sensitivity factors (RSFs). Accurate RSF values for ppm-range nitrogen contents are increasingly critical, as more precision is sought in processes for next-generation superconducting radiofrequency (SRF) accelerator cavities. Furthermore, factors influencing RSF value measurements were investigated with the aim of reliably attaining better than 10% accuracy in nitrogen concentrations at various depths into the bulk. This has been accomplished for materials typical of SRF cavities at the cost of increased attention to all aspects.},

  doi          = {10.1116/6.0000848},

  journal      = {Journal of Vacuum Science and Technology B},

  number       = 2,

  volume       = 39,

  place        = {United States},

  year         = {Mon Mar 22 00:00:00 EDT 2021},

  month        = {Mon Mar 22 00:00:00 EDT 2021}

}

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Works referenced in this record:

Nitrogen and argon doping of niobium for superconducting radio frequency cavities: a pathway to highly efficient accelerating structures
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Physical Review Special Topics - Accelerators and Beams, Vol. 15, Issue 8
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Similar Records

Title: Advances in secondary ion mass spectrometry for N-doped niobium

Abstract

Citation Formats

Nitrogen and argon doping of niobium for superconducting radio frequency cavities: a pathway to highly efficient accelerating structures journal, August 2013

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