Asymmetry in serial femtosecond crystallography data
Abstract
Serial crystallography is an increasingly important approach to protein crystallography that exploits both X-ray free-electron laser (XFEL) and synchrotron radiation. Serial crystallography recovers complete X-ray diffraction data by processing and merging diffraction images from thousands of randomly oriented non-uniform microcrystals, of which all observations are partial Bragg reflections. Random fluctuations in the XFEL pulse energy spectrum, variations in the size and shape of microcrystals, integrating over millions of weak partial observations and instabilities in the XFEL beam position lead to new types of experimental errors. The quality of Bragg intensity estimates deriving from serial crystallography is therefore contingent upon assumptions made while modeling these data. Here it is observed that serial femtosecond crystallography (SFX) Bragg reflections do not follow a unimodal Gaussian distribution and it is recommended that an idealized assumption of single Gaussian peak profiles be relaxed to incorporate apparent asymmetries when processing SFX data. The phenomenon is illustrated by re-analyzing data collected from microcrystals of theBlastochloris viridisphotosynthetic reaction center and comparing these intensity observations with conventional synchrotron data. The results show that skewness in the SFX observations captures the essence of the Wilson plot and an empirical treatment is suggested that can help to separate the diffraction Braggmore »
- Authors:
-
- Univ. of Gothenburg (Sweden). Dept. of Chemistry and Molecular Biology
- Univ. of Gothenburg (Sweden). Dept. of Chemistry and Molecular Biology; Univ. of Southern California, Los Angeles, CA (United States). Dept. of Chemistry, Bridge Inst.
- Publication Date:
- Research Org.:
- Stanford Linear Accelerator Center (SLAC), CA (United States). Linac Coherent Light Source (LCLS)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1625836
- Grant/Contract Number:
- AC02-76SF00515
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Acta Crystallographica. Section A, Foundations and Advances (Online)
- Additional Journal Information:
- Journal Name: Acta Crystallographica. Section A, Foundations and Advances (Online); Journal Volume: 73; Journal Issue: 2; Journal ID: ISSN 2053-2733
- Publisher:
- International Union of Crystallography
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; Chemistry; Crystallography; ex-Gaussian distribution; serial femtosecond crystallography; Bragg reflections; systematic absences; intensity distribution
Citation Formats
Sharma, Amit, Johansson, Linda, Dunevall, Elin, Wahlgren, Weixiao Y., Neutze, Richard, and Katona, Gergely. Asymmetry in serial femtosecond crystallography data. United States: N. p., 2017.
Web. doi:10.1107/s2053273316018696.
Sharma, Amit, Johansson, Linda, Dunevall, Elin, Wahlgren, Weixiao Y., Neutze, Richard, & Katona, Gergely. Asymmetry in serial femtosecond crystallography data. United States. https://doi.org/10.1107/s2053273316018696
Sharma, Amit, Johansson, Linda, Dunevall, Elin, Wahlgren, Weixiao Y., Neutze, Richard, and Katona, Gergely. Mon .
"Asymmetry in serial femtosecond crystallography data". United States. https://doi.org/10.1107/s2053273316018696. https://www.osti.gov/servlets/purl/1625836.
@article{osti_1625836,
title = {Asymmetry in serial femtosecond crystallography data},
author = {Sharma, Amit and Johansson, Linda and Dunevall, Elin and Wahlgren, Weixiao Y. and Neutze, Richard and Katona, Gergely},
abstractNote = {Serial crystallography is an increasingly important approach to protein crystallography that exploits both X-ray free-electron laser (XFEL) and synchrotron radiation. Serial crystallography recovers complete X-ray diffraction data by processing and merging diffraction images from thousands of randomly oriented non-uniform microcrystals, of which all observations are partial Bragg reflections. Random fluctuations in the XFEL pulse energy spectrum, variations in the size and shape of microcrystals, integrating over millions of weak partial observations and instabilities in the XFEL beam position lead to new types of experimental errors. The quality of Bragg intensity estimates deriving from serial crystallography is therefore contingent upon assumptions made while modeling these data. Here it is observed that serial femtosecond crystallography (SFX) Bragg reflections do not follow a unimodal Gaussian distribution and it is recommended that an idealized assumption of single Gaussian peak profiles be relaxed to incorporate apparent asymmetries when processing SFX data. The phenomenon is illustrated by re-analyzing data collected from microcrystals of theBlastochloris viridisphotosynthetic reaction center and comparing these intensity observations with conventional synchrotron data. The results show that skewness in the SFX observations captures the essence of the Wilson plot and an empirical treatment is suggested that can help to separate the diffraction Bragg intensity from the background.},
doi = {10.1107/s2053273316018696},
journal = {Acta Crystallographica. Section A, Foundations and Advances (Online)},
number = 2,
volume = 73,
place = {United States},
year = {Mon Jan 30 00:00:00 EST 2017},
month = {Mon Jan 30 00:00:00 EST 2017}
}
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