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Title: Conductivity Induced by High-Field Terahertz Waves in Dielectric Material

Abstract

An intense, sub-picosecond, relativistic electron beam traversing a dielectric lined waveguide generates very large amplitude electric fields at terahertz (THz) frequencies through the wakefield mechanism. In recent work employing this technique to accelerate charged particles, generation of high-power, narrowband THz radiation was demonstrated [ ]. The radiated waves contain fields with measured amplitude exceeding 2 GV/m, orders of magnitude greater than those available by other THz generation techniques at narrow bandwidth. For fields approaching the GV/m level, a strong damping has been observed in SiO2. This wave attenuation with onset near 850 MV/m, is consistent with changes to the conductivity of the dielectric lining and is characterized by a distinctive latching mechanism that is reversible on longer time scales. Here, we describe the detailed measurements that serve to clarify the underlying physical mechanisms leading to strong field-induced damping of THz radiation (hω = 1.59 meV, f = 0.38 THz) in SiO2, a bulk, wide band-gap (8.9 eV) dielectric.

Authors:
ORCiD logo [1];  [2];  [3];  [4];  [2];  [4];  [2];  [2];  [4];  [2]
  1. Univ. of California, Los Angeles, CA (United States). Dept. of Physics and Astronomy; SLAC National Accelerator Lab., Menlo Park, CA (United States)
  2. Univ. of California, Los Angeles, CA (United States). Dept. of Physics and Astronomy
  3. Univ. of California, Los Angeles, CA (United States). Dept. of Physics and Astronomy; Univ. of California, Berkeley, CA (United States). Lawrence Berkeley National Lab.
  4. SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Contributing Org.:
University of California, Los Angeles
OSTI Identifier:
1560104
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 123; Journal Issue: 13; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; Dielectric Wakefield Accelerators; Electrical Conductivity; Materials analysis & modification by accelerators

Citation Formats

O’Shea, Brendan D., Andonian, Gerard, Barber, Samuel K., Clarke, Christine Isabel, Hoang, Phuc D., Hogan, Mark J., Naranjo, Brian, Williams, Oliver Brian, Yakimenko, Vitaly, and Rosenzweig, James B. Conductivity Induced by High-Field Terahertz Waves in Dielectric Material. United States: N. p., 2019. Web. doi:10.1103/PhysRevLett.123.134801.
O’Shea, Brendan D., Andonian, Gerard, Barber, Samuel K., Clarke, Christine Isabel, Hoang, Phuc D., Hogan, Mark J., Naranjo, Brian, Williams, Oliver Brian, Yakimenko, Vitaly, & Rosenzweig, James B. Conductivity Induced by High-Field Terahertz Waves in Dielectric Material. United States. https://doi.org/10.1103/PhysRevLett.123.134801
O’Shea, Brendan D., Andonian, Gerard, Barber, Samuel K., Clarke, Christine Isabel, Hoang, Phuc D., Hogan, Mark J., Naranjo, Brian, Williams, Oliver Brian, Yakimenko, Vitaly, and Rosenzweig, James B. Mon . "Conductivity Induced by High-Field Terahertz Waves in Dielectric Material". United States. https://doi.org/10.1103/PhysRevLett.123.134801. https://www.osti.gov/servlets/purl/1560104.
@article{osti_1560104,
title = {Conductivity Induced by High-Field Terahertz Waves in Dielectric Material},
author = {O’Shea, Brendan D. and Andonian, Gerard and Barber, Samuel K. and Clarke, Christine Isabel and Hoang, Phuc D. and Hogan, Mark J. and Naranjo, Brian and Williams, Oliver Brian and Yakimenko, Vitaly and Rosenzweig, James B.},
abstractNote = {An intense, sub-picosecond, relativistic electron beam traversing a dielectric lined waveguide generates very large amplitude electric fields at terahertz (THz) frequencies through the wakefield mechanism. In recent work employing this technique to accelerate charged particles, generation of high-power, narrowband THz radiation was demonstrated [ ]. The radiated waves contain fields with measured amplitude exceeding 2 GV/m, orders of magnitude greater than those available by other THz generation techniques at narrow bandwidth. For fields approaching the GV/m level, a strong damping has been observed in SiO2. This wave attenuation with onset near 850 MV/m, is consistent with changes to the conductivity of the dielectric lining and is characterized by a distinctive latching mechanism that is reversible on longer time scales. Here, we describe the detailed measurements that serve to clarify the underlying physical mechanisms leading to strong field-induced damping of THz radiation (hω = 1.59 meV, f = 0.38 THz) in SiO2, a bulk, wide band-gap (8.9 eV) dielectric.},
doi = {10.1103/PhysRevLett.123.134801},
journal = {Physical Review Letters},
number = 13,
volume = 123,
place = {United States},
year = {Mon Sep 23 00:00:00 EDT 2019},
month = {Mon Sep 23 00:00:00 EDT 2019}
}

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