Determination of the five parameter grain boundary character distribution of nanocrystalline alpha-zirconium thin films using transmission electron microscopy

Ghamarian, I.; Samani, P.; Rohrer, G. S.; Collins, Peter

doi:10.1016/j.actamat.2017.03.041

Title: Determination of the five parameter grain boundary character distribution of nanocrystalline alpha-zirconium thin films using transmission electron microscopy

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Abstract

Grain boundary engineering and other fundamental materials science problems (e.g., phase transformations and physical properties) require an improvement in the understanding of the type and population of grain boundaries in a given system – yet, databases are limited in number and spare in detail, including for hcp crystals such as zirconium. One way to rapidly obtain databases to analyze is to use small-grained materials and high spatial resolution orientation microscopy techniques, such as ASTAR™/precession electron diffraction. To demonstrate this, a study of grain boundary character distributions was conducted for α-zirconium deposited at room temperature on fused silica substrates using physical vapor deposition. The orientation maps of the nanocrystalline thin films were acquired by the ASTARα/precession electron diffraction technique, a new transmission electron microscope based orientation microscopy method. The reconstructed grain boundaries were classified as pure tilt, pure twist, 180°-twist and 180°-tilt grain boundaries based on the distribution of grain boundary planes with respect to the angle/axis of misorientation associated with grain boundaries. The results of the current study were compared to the results of a similar study on α-titanium and the molecular dynamics results of grain boundary energy for α-titanium.

Authors:

Ghamarian, I. ^[1]; Samani, P. ^[1]; Rohrer, G. S. ^[2]; Collins, Peter ^[3]

Iowa State Univ., Ames, IA (United States); Colorado School of Mines, Golden, CO (United States)
Carnegie Mellon Univ., Pittsburgh, PA (United States)
Iowa State Univ., Ames, IA (United States); Iowa State Univ., Ames, IA (United States); Colorado School of Mines, Golden, CO (United States); Ames Lab., Ames, IA (United States)

Publication Date:: Fri Mar 24 00:00:00 EDT 2017

Research Org.:: Ames Lab., Ames, IA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1368044

Report Number(s):: IS-J 9297
Journal ID: ISSN 1359-6454; PII: S1359645417302331

Grant/Contract Number:: 1624748; AC02-07CH11358

Resource Type:: Accepted Manuscript

Journal Name:: Acta Materialia

Additional Journal Information:: Journal Volume: 130; Journal ID: ISSN 1359-6454

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE

Citation Formats


                    Ghamarian, I., Samani, P., Rohrer, G. S., and Collins, Peter. Determination of the five parameter grain boundary character distribution of nanocrystalline alpha-zirconium thin films using transmission electron microscopy.  United States: N. p., 2017. 
Web.  doi:10.1016/j.actamat.2017.03.041.

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                    Ghamarian, I., Samani, P., Rohrer, G. S., & Collins, Peter. Determination of the five parameter grain boundary character distribution of nanocrystalline alpha-zirconium thin films using transmission electron microscopy.  United States.  https://doi.org/10.1016/j.actamat.2017.03.041

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                    Ghamarian, I., Samani, P., Rohrer, G. S., and Collins, Peter. Fri .  
"Determination of the five parameter grain boundary character distribution of nanocrystalline alpha-zirconium thin films using transmission electron microscopy".  United States.  https://doi.org/10.1016/j.actamat.2017.03.041.  https://www.osti.gov/servlets/purl/1368044.

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@article{osti_1368044,

  title        = {Determination of the five parameter grain boundary character distribution of nanocrystalline alpha-zirconium thin films using transmission electron microscopy},

  author       = {Ghamarian, I. and Samani, P. and Rohrer, G. S. and Collins, Peter},

  abstractNote = {Grain boundary engineering and other fundamental materials science problems (e.g., phase transformations and physical properties) require an improvement in the understanding of the type and population of grain boundaries in a given system – yet, databases are limited in number and spare in detail, including for hcp crystals such as zirconium. One way to rapidly obtain databases to analyze is to use small-grained materials and high spatial resolution orientation microscopy techniques, such as ASTAR™/precession electron diffraction. To demonstrate this, a study of grain boundary character distributions was conducted for α-zirconium deposited at room temperature on fused silica substrates using physical vapor deposition. The orientation maps of the nanocrystalline thin films were acquired by the ASTARα/precession electron diffraction technique, a new transmission electron microscope based orientation microscopy method. The reconstructed grain boundaries were classified as pure tilt, pure twist, 180°-twist and 180°-tilt grain boundaries based on the distribution of grain boundary planes with respect to the angle/axis of misorientation associated with grain boundaries. The results of the current study were compared to the results of a similar study on α-titanium and the molecular dynamics results of grain boundary energy for α-titanium.},

  doi          = {10.1016/j.actamat.2017.03.041},

  journal      = {Acta Materialia},

  number       = ,

  volume       = 130,

  place        = {United States},

  year         = {Fri Mar 24 00:00:00 EDT 2017},

  month        = {Fri Mar 24 00:00:00 EDT 2017}

}

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