Terahertz antireflection coating enabled by a subwavelength metallic mesh capped with a thin dielectric film

Huang, Li; Chen, Hou -Tong; Zeng, Beibei; Chang, Chun -Chieh

doi:10.11906/TST.001-009.2016.03.01

Title: Terahertz antireflection coating enabled by a subwavelength metallic mesh capped with a thin dielectric film

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Abstract

Metamaterials/metasurfaces have enabled unprecedented manipulation of electromagnetic waves. Here we present a new design of metasurface structure functioning as antireflection coatings. The structure consists of a subwavelength metallic mesh capped with a thin dielectric layer on top of a substrate. By tailoring the geometric parameters of the metallic mesh and the refractive index and thickness of the capping dielectric film, reflection from the substrate can be completely eliminated at a specific frequency. Compared to traditional methods such as coatings with single- or multi-layer dielectric films, the metasurface antireflection coatings are much thinner and the requirement of index matching is largely lifted. Here, this approach is particularly suitable for antireflection coatings in the technically challenging terahertz frequency range and is also applicable in other frequency regimes.

Authors:

Huang, Li ^[1];

^[2]; Zeng, Beibei ^[2];

^[2]

Harbin Institute of Technology, Heilongjiang (China)
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Publication Date:: Wed Mar 30 00:00:00 EDT 2016

Research Org.:: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1364586

Report Number(s):: LA-UR-16-20538
Journal ID: ISSN 1941-7411

Grant/Contract Number:: AC52-06NA25396

Resource Type:: Accepted Manuscript

Journal Name:: Terahertz Science & Technology

Additional Journal Information:: Journal Volume: 9; Journal Issue: 1; Journal ID: ISSN 1941-7411

Publisher:: Scinco, Inc

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; material science; metasurfaces; antireflection coatings; terahertz; interference

Citation Formats


                    Huang, Li, Chen, Hou -Tong, Zeng, Beibei, and Chang, Chun -Chieh. Terahertz antireflection coating enabled by a subwavelength metallic mesh capped with a thin dielectric film.  United States: N. p., 2016. 
Web.  doi:10.11906/TST.001-009.2016.03.01.

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                    Huang, Li, Chen, Hou -Tong, Zeng, Beibei, & Chang, Chun -Chieh. Terahertz antireflection coating enabled by a subwavelength metallic mesh capped with a thin dielectric film.  United States.  https://doi.org/10.11906/TST.001-009.2016.03.01

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                    Huang, Li, Chen, Hou -Tong, Zeng, Beibei, and Chang, Chun -Chieh. Wed .  
"Terahertz antireflection coating enabled by a subwavelength metallic mesh capped with a thin dielectric film".  United States.  https://doi.org/10.11906/TST.001-009.2016.03.01.  https://www.osti.gov/servlets/purl/1364586.

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@article{osti_1364586,

  title        = {Terahertz antireflection coating enabled by a subwavelength metallic mesh capped with a thin dielectric film},

  author       = {Huang, Li and Chen, Hou -Tong and Zeng, Beibei and Chang, Chun -Chieh},

  abstractNote = {Metamaterials/metasurfaces have enabled unprecedented manipulation of electromagnetic waves. Here we present a new design of metasurface structure functioning as antireflection coatings. The structure consists of a subwavelength metallic mesh capped with a thin dielectric layer on top of a substrate. By tailoring the geometric parameters of the metallic mesh and the refractive index and thickness of the capping dielectric film, reflection from the substrate can be completely eliminated at a specific frequency. Compared to traditional methods such as coatings with single- or multi-layer dielectric films, the metasurface antireflection coatings are much thinner and the requirement of index matching is largely lifted. Here, this approach is particularly suitable for antireflection coatings in the technically challenging terahertz frequency range and is also applicable in other frequency regimes.},

  doi          = {10.11906/TST.001-009.2016.03.01},

  journal      = {Terahertz Science & Technology},

  number       = 1,

  volume       = 9,

  place        = {United States},

  year         = {Wed Mar 30 00:00:00 EDT 2016},

  month        = {Wed Mar 30 00:00:00 EDT 2016}

}

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