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Title: Spatial luminescence imaging of dopant incorporation in CdTe Films

Abstract

State-of-the-art cathodoluminescence (CL) spectrum imaging with spectrum-per-pixel CL emission mapping is applied to spatially profile how dopant elements are incorporated into Cadmium telluride (CdTe). Emission spectra and intensity monitor the spatial distribution of additional charge carriers through characteristic variations in the CL emission based on computational modeling. Our results show that grain boundaries play a role in incorporating dopants in CdTe exposed to copper, phosphorus, and intrinsic point defects in CdTe. Furthermore, the image analysis provides critical, unique feedback to understand dopant incorporation and activation in the inhomogeneous CdTe material, which has struggled to reach high levels of hole density.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. National Renewable Energy Lab. (NREL), Golden, CO (United States)
Publication Date:
Research Org.:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
OSTI Identifier:
1342822
Alternate Identifier(s):
OSTI ID: 1361747
Report Number(s):
NREL/JA-5K00-67135
Journal ID: ISSN 0021-8979
Grant/Contract Number:  
AC36-08GO28308
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 121; Journal Issue: 4; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; cadmium telluride; cathodoluminescence; dopant distribution; grain boundaries

Citation Formats

Guthrey, Harvey, Moseley, John, Colegrove, Eric, Burst, James, Albin, David, Metzger, Wyatt K., and Al-Jassim, Mowafak. Spatial luminescence imaging of dopant incorporation in CdTe Films. United States: N. p., 2017. Web. doi:10.1063/1.4974459.
Guthrey, Harvey, Moseley, John, Colegrove, Eric, Burst, James, Albin, David, Metzger, Wyatt K., & Al-Jassim, Mowafak. Spatial luminescence imaging of dopant incorporation in CdTe Films. United States. https://doi.org/10.1063/1.4974459
Guthrey, Harvey, Moseley, John, Colegrove, Eric, Burst, James, Albin, David, Metzger, Wyatt K., and Al-Jassim, Mowafak. Wed . "Spatial luminescence imaging of dopant incorporation in CdTe Films". United States. https://doi.org/10.1063/1.4974459. https://www.osti.gov/servlets/purl/1342822.
@article{osti_1342822,
title = {Spatial luminescence imaging of dopant incorporation in CdTe Films},
author = {Guthrey, Harvey and Moseley, John and Colegrove, Eric and Burst, James and Albin, David and Metzger, Wyatt K. and Al-Jassim, Mowafak},
abstractNote = {State-of-the-art cathodoluminescence (CL) spectrum imaging with spectrum-per-pixel CL emission mapping is applied to spatially profile how dopant elements are incorporated into Cadmium telluride (CdTe). Emission spectra and intensity monitor the spatial distribution of additional charge carriers through characteristic variations in the CL emission based on computational modeling. Our results show that grain boundaries play a role in incorporating dopants in CdTe exposed to copper, phosphorus, and intrinsic point defects in CdTe. Furthermore, the image analysis provides critical, unique feedback to understand dopant incorporation and activation in the inhomogeneous CdTe material, which has struggled to reach high levels of hole density.},
doi = {10.1063/1.4974459},
journal = {Journal of Applied Physics},
number = 4,
volume = 121,
place = {United States},
year = {Wed Jan 25 00:00:00 EST 2017},
month = {Wed Jan 25 00:00:00 EST 2017}
}

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Works referencing / citing this record:

Exceeding 20% efficiency with in situ group V doping in polycrystalline CdTe solar cells
journal, August 2019