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  1. A polarimetry-based field-deployable non-interruptive mirror soiling detection method

    The soiling level of heliostat mirrors in Concentrated Solar Power (CSP) fields is one of the key factors that significantly influences optical efficiency. State-of-the-art methods of monitoring heliostats soiling levels still face various challenges, including slow speed, labor-intensive operations, resolution and accuracy constraints or interruptions to solar field operations. Here, we present a rapid, cost-effective, and non-intrusive method for mirror soiling detection based on polarimetric imaging, referred to as Polarimetric Imaging-based Mirror Soiling (PIMS). The compact PIMS device is designed for integration with unmanned aerial vehicles (UAVs), enabling rapid, large-area assessments of heliostat mirrors for efficient soiling detection. Our methodmore » utilizes the correlation between the Degree of Linear Polarization (DoLP) and surface soiling level based on Mie scattering theory and Monte Carlo simulations. Field deployment of the PIMS method requires minimal device installation, and its UAV-based operation allows for soiling detection without interrupting plant activities. The PIMS method holds the potential for mirror soiling detection across various concentrated solar power (CSP) plants and can be further adapted for other types of solar fields, such as parabolic trough systems.« less
  2. Heliostat optical error inspection with polarimetric imaging drone

    On a Concentrated Solar Power (CSP) field, optical errors have significant impacts on the collection efficiency of heliostats. Fast, cost-effective, labor-efficient, and non-intrusive autonomous field inspection remains a challenge. Approaches using imaging drone, i.e., Unmanned Aerial Vehicle (UAV) system integrated with high resolution visible imaging sensors, have been developed to address these challenges; however, these approaches are often limited by insufficient imaging contrast. Here, in this study, we report a polarimetry-based method with a polarization imaging system integrated on UAV to enhance imaging contrast for in-situ detection of heliostat mirrors without interrupting field operation. We developed an optical model formore » skylight polarization pattern to simulate the polarization images of heliostat mirrors and obtained optimized waypoints for polarimetric imaging drone flight path to capture images with enhanced contrast. The polarimetric imaging-based method improved the success rate of edge detections in scenarios which were challenging for mirror edge detection with conventional imaging sensors. We have performed field tests to achieve significantly enhanced heliostat edge detection success rate and investigate the feasibility of integrating polarimetric imaging method with existing imaging-based heliostat inspection methods, i.e., Polarimetric Imaging Heliostat Inspection Method (PIHIM). Our preliminary field test results suggest that the PIHIM hold the promise to enable sufficient imaging contrast for real-time autonomous imaging and detection of heliostat field, thus suitable for non-interruptive fast CSP field inspection during its operation.« less
  3. Room‐Temperature Mid‐Infrared Detection Using Metasurface‐Absorber‐Integrated Phononic Crystal Oscillator

    Mid-infrared (MIR) detectors find extensive applications in chemical sensing, spectroscopy, communications, biomedical diagnosis, and space exploration. Alternative to semiconductor MIR photodiodes and bolometers, mechanical-resonator-based MIR detectors show advantages in higher sensitivity and lower noise at room temperature, especially toward longer wavelength infrared. Here, uncooled room-temperature MIR detectors based on lithium niobate surface acoustic wave phononic crystal (PnC) resonators integrated with wavelength-and-polarization-selective metasurface absorber arrays are demonstrated. The detection is based on the resonant frequency shift induced by the local temperature change due to MIR absorptions. The PnC resonator is configured in an oscillating mode, enabling active readout and low-frequency noise.more » The 1-GHz oscillator-based MIR detector shows a relative frequency deviation of 5.24 × 10−10 Hz−1/2 at an integration time of 50 µs, leading to an incident noise equivalent power of 197 pW Hz−1/2 when input 6-µm MIR light is modulated at 1.8 kHz, and a large dynamic range of 107 in incident MIR power. The device architecture is compatible with the scalable manufacturing process and can be readily extended to a broader spectral range by tailoring the absorbing wavelengths of metasurface absorbers.« less
  4. Spectral interferometry-based microwave-frequency vibrometry for integrated acoustic wave devices

    Microwave phononics is a promising platform for sensing, computing, and quantum information science; thus, sensitive and high-throughput characterization tools are needed not only for device verification and optimization but also for revealing transient and nonlinear dynamics. Existing interferometric optical vibrometers for 2D mapping are challenged by operating point stabilization, surface reflectivity contrast, and long acquisition time. Here, we use spectral interferometry, which is insensitive to these factors and utilizes a continuous raster scanning scheme for vibration mapping with high throughput. We intensity-modulate our broadband light source with an electro-optic modulator to resolve vibrations at microwave frequencies. Our system requires nomore » fast photodetector or digitizer operating in the microwave frequency range. We image the 1 GHz vibration field of a 300 × 150 µm2 area of an entire surface acoustic wave device in 10 min with simultaneous surface profilometry. Our system has a vibration sensitivity of 120 fm/sqrt(Hz) and a linear throughput of 0.77 mm/s on the chip surface. The technique offers capabilities for characterizing a wide range of acoustic wave and micromechanical devices to better understand their behavior and performance.« less
  5. Scalable Nanoimprint Manufacturing of Functional Multilayer Metasurface Devices

    Optical metasurfaces, consisting of subwavelength-scale meta-atom arrays, hold great promise of overcoming the fundamental limitations of conventional optics. Due to their structural complexity, metasurfaces usually require high-resolution yet slow and expensive fabrication processes. Here, using a metasurface polarimetric imaging device as an example, the photonic structures and the Nanoimprint lithography (NIL) processes are designed, creating two separate NIL molds over a patterning area of > 20 mm2 with designed Moiré alignment markers by electron-beam writing, and further subsequently integrate silicon and aluminum metasurface structures on a chip. Uniquely, the silicon and aluminum metasurfaces are fabricated by using the nanolithography andmore » 3D pattern-transfer capabilities of NIL, respectively, achieving nanometer-scale linewidth uniformity, sub-200 nm translational overlay accuracy, and <0.017 rotational alignment error while significantly reducing fabrication complexity and surface roughness. Here, the micro-sized multilayer metasurfaces have high circular polarization extinction ratios as large as ≈20 and ≈80 in blue and red wavelengths. Further, the metasurface chip-integrated CMOS imager demonstrates high accuracy in broad-band, full Stokes parameter analysis in the visible wavelength ranges and single-shot polarimetric imaging. This novel, NIL-based, multilayered nanomanufacturing approach is applicable to the scalable production of large-area functional structures for ultra-compact optic, electronic, and quantum devices.« less
  6. Metasurface‐Based Mueller Matrix Microscope

    In conventional optical microscopes, image contrast of objects mainly results from the differences in light intensity and/or color. Muller matrix optical microscopes (MMMs), on the other hand, can provide significantly enhanced image contrast and rich information about objects by analyzing their interactions with polarized light. However, state-of-the-art MMMs are fundamentally limited by bulky and slow polarization state generators and analyzers. Here, the study demonstrates a metasurface-based MMM, i.e., Meta-MMM, which is equipped with a chip-integrated, single-shot metasurface polarization state analyzer (Meta-PSA). The Meta-MMM is featured with high-speed measurement (≈2s per Muller matrix (MM) image), superior operation stability, dual-color operation, andmore » high measurement accuracy (measurement error 1–2%) for MM imaging. The Meta-MMM is applied to nanostructure characterization, surface morphology analysis, and discovering birefringent structures in honeybee wings. As a result, the Meta-MMMs hold the promise to revolutionize various applications from biological imaging, medical diagnosis, and material characterization to industry inspection and space exploration.« less
  7. Toward Autonomous Field Inspection of CSP Collectors With a Polarimetric Imaging Drone

    We developed a polarimetric imaging drone to perform field inspections of heliostats and carried out field tests at Sandia’s National Solar Thermal Test Facility (NSTTF). The preliminary results show that Degree of Linear Polarization (DOLP) and Angle of Polarization (AOP) images greatly enhanced the edge detection results compared with the conventional visible images, supporting fast and accurate detection of heliostat mirror edges and cracks. The system holds the promise to enable future automated detection of heliostats optical errors and mirror defects.
  8. Chip-integrated metasurface full-Stokes polarimetric imaging sensor

    Abstract Polarimetric imaging has a wide range of applications for uncovering features invisible to human eyes and conventional imaging sensors. Chip-integrated, fast, cost-effective, and accurate full-Stokes polarimetric imaging sensors are highly desirable in many applications, which, however, remain elusive due to fundamental material limitations. Here we present a chip-integrated Meta surface-based Full-Stokes Polar imetric Im aging sensor (MetaPolarIm) realized by integrating an ultrathin (~600 nm) metasurface polarization filter array (MPFA) onto a visible imaging sensor with CMOS compatible fabrication processes. The MPFA is featured with broadband dielectric-metal hybrid chiral metasurfaces and double-layer nanograting polarizers. This chip-integrated polarimetric imaging sensor enables single-shotmore » full-Stokes imaging (speed limited by the CMOS imager) with the most compact form factor, records high measurement accuracy, dual-color operation (green and red) and a field of view up to 40 degrees. MetaPolarIm holds great promise to enable transformative applications in autonomous vision, industry inspection, space exploration, medical imaging and diagnosis.« less

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