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Pulse shape measurements for neutron/gamma discrimination using the TOFPET2 ASIC
Abstract
Many highly pixelated organic scintillator detection systems would benefit from independent readout of each scintillator pixel. Recent advances in Silicon Photomultiplier (SiPM) technology makes this goal feasible, however the data acquisition from potentially hundreds or thousands of channels requires a low-cost and compact solution. For pixelated neutron detection with organic scintillators, the capability to distinguish between neutron and gamma interactions using Pulse Shape Discrimination (PSD) is required along with pulse charge and time of arrival. The TOFPET2 ASIC from PETsys Electronics is a 64-channel readout chip providing pulse time and charge integration measurements from SiPMs, and is specifically designed for time-of-flight positron-emission tomography. Using an 8 × 8 array of 6 mm × 6 mm J-series SiPMs from SensL/OnSemi (ArrayJ-60035-64P-PCB), we have studied the energy and PSD performance of the TOFPET2 ASIC using a 4 × 4 array of 6 mm × 6 mm × 30 mm trans-Stilbene crystals from Inrad Optics and a custom SiPM routing board from PETsys Electronics. In conclusion, using a time-over-threshold method, we measure a maximum PSD figure-of-merit of approximately 1.2 at 478 keV (the Compton edge of 662 keV) for a J-series SiPM operating at an over-voltage of 3V.
- Authors:
-
- Sandia National Lab. (SNL-CA), Livermore, CA (United States)
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-CA), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Nonproliferation
- OSTI Identifier:
- 2311646
- Report Number(s):
- SAND-2023-06452J
Journal ID: ISSN 1748-0221
- Grant/Contract Number:
- NA0003525
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Instrumentation
- Additional Journal Information:
- Journal Volume: 18; Journal Issue: 07; Journal ID: ISSN 1748-0221
- Publisher:
- Institute of Physics (IOP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; Front-end electronics for detector readout; Neutron detectors (cold, thermal, fast neutrons); Neutron radiography; Particle identification methods
Citation Formats
Weinfurther, Kyle James, Marleau, Peter, and Sweany, M. Pulse shape measurements for neutron/gamma discrimination using the TOFPET2 ASIC. United States: N. p., 2023.
Web. doi:10.1088/1748-0221/18/07/p07015.
Weinfurther, Kyle James, Marleau, Peter, & Sweany, M. Pulse shape measurements for neutron/gamma discrimination using the TOFPET2 ASIC. United States. https://doi.org/10.1088/1748-0221/18/07/p07015
Weinfurther, Kyle James, Marleau, Peter, and Sweany, M. Thu .
"Pulse shape measurements for neutron/gamma discrimination using the TOFPET2 ASIC". United States. https://doi.org/10.1088/1748-0221/18/07/p07015.
@article{osti_2311646,
title = {Pulse shape measurements for neutron/gamma discrimination using the TOFPET2 ASIC},
author = {Weinfurther, Kyle James and Marleau, Peter and Sweany, M.},
abstractNote = {Many highly pixelated organic scintillator detection systems would benefit from independent readout of each scintillator pixel. Recent advances in Silicon Photomultiplier (SiPM) technology makes this goal feasible, however the data acquisition from potentially hundreds or thousands of channels requires a low-cost and compact solution. For pixelated neutron detection with organic scintillators, the capability to distinguish between neutron and gamma interactions using Pulse Shape Discrimination (PSD) is required along with pulse charge and time of arrival. The TOFPET2 ASIC from PETsys Electronics is a 64-channel readout chip providing pulse time and charge integration measurements from SiPMs, and is specifically designed for time-of-flight positron-emission tomography. Using an 8 × 8 array of 6 mm × 6 mm J-series SiPMs from SensL/OnSemi (ArrayJ-60035-64P-PCB), we have studied the energy and PSD performance of the TOFPET2 ASIC using a 4 × 4 array of 6 mm × 6 mm × 30 mm trans-Stilbene crystals from Inrad Optics and a custom SiPM routing board from PETsys Electronics. In conclusion, using a time-over-threshold method, we measure a maximum PSD figure-of-merit of approximately 1.2 at 478 keV (the Compton edge of 662 keV) for a J-series SiPM operating at an over-voltage of 3V.},
doi = {10.1088/1748-0221/18/07/p07015},
journal = {Journal of Instrumentation},
number = 07,
volume = 18,
place = {United States},
year = {Thu Jul 06 00:00:00 EDT 2023},
month = {Thu Jul 06 00:00:00 EDT 2023}
}
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