Implementation of a portable diagnostic system for Thomson scattering measurements on an electrothermal arc source
Abstract
To fulfill the increasing needs of diagnostic support for researchers in plasma technology, a portable diagnostic package (PDP) equipped for both laser Thomson scattering (TS) and optical emission spectroscopy has been designed and constructed at Oak Ridge National Laboratory (ORNL), aiming to measure the temperature and number density of electrons and temperatures of ions in plasma devices. The PDP has been initially implemented on a high density and low temperature electrothermal arc source (ET-arc) at ORNL to test its TS capability. TS from the plasmas in the ET-arc has been obtained using the PDP. The electron temperature and number density were determined from TS spectra. These results were then compared to measurements from previous studies on the ET-arc. The TS diagnostic measured 0.8 ± 0.1, 1.3 ± 0.2, and 0.7 ± 0.1 eV and (4.4 ± 0.5) × 1021, (5.9 ± 0.7) × 1021, and (4.3 ± 0.5) x 1021 m-3, respectively, from three lines of sight that transect the plasma column.
- Publication Date:
- Sponsoring Org.:
- USDOE Advanced Research Projects Agency - Energy (ARPA-E)
- OSTI Identifier:
- 1897546
- Grant/Contract Number:
- No. DE-AC05- 00OR22725
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Name: Review of Scientific Instruments Journal Volume: 93 Journal Issue: 11; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
Citation Formats
He, Z., Kafle, N., Gebhart, T. E., Biewer, T. M., and Zhang, Z. Implementation of a portable diagnostic system for Thomson scattering measurements on an electrothermal arc source. United States: N. p., 2022.
Web. doi:10.1063/5.0101835.
He, Z., Kafle, N., Gebhart, T. E., Biewer, T. M., & Zhang, Z. Implementation of a portable diagnostic system for Thomson scattering measurements on an electrothermal arc source. United States. https://doi.org/10.1063/5.0101835
He, Z., Kafle, N., Gebhart, T. E., Biewer, T. M., and Zhang, Z. Wed .
"Implementation of a portable diagnostic system for Thomson scattering measurements on an electrothermal arc source". United States. https://doi.org/10.1063/5.0101835.
@article{osti_1897546,
title = {Implementation of a portable diagnostic system for Thomson scattering measurements on an electrothermal arc source},
author = {He, Z. and Kafle, N. and Gebhart, T. E. and Biewer, T. M. and Zhang, Z.},
abstractNote = {To fulfill the increasing needs of diagnostic support for researchers in plasma technology, a portable diagnostic package (PDP) equipped for both laser Thomson scattering (TS) and optical emission spectroscopy has been designed and constructed at Oak Ridge National Laboratory (ORNL), aiming to measure the temperature and number density of electrons and temperatures of ions in plasma devices. The PDP has been initially implemented on a high density and low temperature electrothermal arc source (ET-arc) at ORNL to test its TS capability. TS from the plasmas in the ET-arc has been obtained using the PDP. The electron temperature and number density were determined from TS spectra. These results were then compared to measurements from previous studies on the ET-arc. The TS diagnostic measured 0.8 ± 0.1, 1.3 ± 0.2, and 0.7 ± 0.1 eV and (4.4 ± 0.5) × 1021, (5.9 ± 0.7) × 1021, and (4.3 ± 0.5) x 1021 m-3, respectively, from three lines of sight that transect the plasma column.},
doi = {10.1063/5.0101835},
journal = {Review of Scientific Instruments},
number = 11,
volume = 93,
place = {United States},
year = {Wed Nov 09 00:00:00 EST 2022},
month = {Wed Nov 09 00:00:00 EST 2022}
}
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