Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy

Kalinin, Sergei V.; Ziatdinov, Maxim; Hinkle, Jacob; Jesse, Stephen; Ghosh, Ayana; Kelley, Kyle P.; Lupini, Andrew R.; Sumpter, Bobby G.; Vasudevan, Rama K.

doi:10.1021/acsnano.1c02104

Title: Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy

Journal Article · 15 July 2021 · ACS Nano

DOI: https://doi.org/10.1021/acsnano.1c02104 · OSTI ID:1857888

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; Hinkle, Jacob; Jesse, Stephen; Ghosh, Ayana;

; Lupini, Andrew R.;

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1857888

Journal Information:: ACS Nano, Journal Name: ACS Nano Journal Issue: 8 Vol. 15; ISSN 1936-0851

Publisher:: American Chemical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

References (173)

Polarization Dynamics in Ferroelectric Capacitors: Local Perspective on Emergent Collective Behavior and Memory Effects K. Vasudevan, Rama; Marincel, Daniel; Jesse, Stephen Advanced Functional Materials, Vol. 23, Issue 20 https://doi.org/10.1002/adfm.201203422	journal	April 2013
Electronically Nonadiabatic Structural Transformations Promoted by Electron Beams Lingerfelt, David B.; Ganesh, Panchapakesan; Jakowski, Jacek Advanced Functional Materials, Vol. 29, Issue 52 https://doi.org/10.1002/adfm.201901901	journal	June 2019
Beyond Ternary OPV: High‐Throughput Experimentation and Self‐Driving Laboratories Optimize Multicomponent Systems Langner, Stefan; Häse, Florian; Perea, José Darío Advanced Materials, Vol. 32, Issue 14 https://doi.org/10.1002/adma.201907801	journal	April 2020
A Deep Learning Approach to Identify Local Structures in Atomic-Resolution Transmission Electron Microscopy Images Madsen, Jacob; Liu, Pei; Kling, Jens Advanced Theory and Simulations, Vol. 1, Issue 8 https://doi.org/10.1002/adts.201800037	journal	July 2018
A Bayesian Approach to Predict Solubility Parameters Sanchez-Lengeling, Benjamin; Roch, Loïc M.; Perea, José Darío Advanced Theory and Simulations, Vol. 2, Issue 1 https://doi.org/10.1002/adts.201800069	journal	September 2018
Patterning: Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision (Small 44/2015) Jesse, Stephen; He, Qian; Lupini, Andrew R. Small, Vol. 11, Issue 44 https://doi.org/10.1002/smll.201570264	journal	November 2015
Building Structures Atom by Atom via Electron Beam Manipulation Dyck, Ondrej; Kim, Songkil; Jimenez-Izal, Elisa Small, Vol. 14, Issue 38 https://doi.org/10.1002/smll.201801771	journal	August 2018
Fast Scanning Probe Microscopy via Machine Learning: Non‐Rectangular Scans with Compressed Sensing and Gaussian Process Optimization Kelley, Kyle P.; Ziatdinov, Maxim; Collins, Liam Small, Vol. 16, Issue 37 https://doi.org/10.1002/smll.202002878	journal	August 2020
A First Course in Bayesian Statistical Methods Hoff, Peter D. Springer Texts in Statistics https://doi.org/10.1007/978-0-387-92407-6	book	January 2009
Adaptive Design of Experiments Based on Gaussian Processes Burnaev, Evgeny; Panov, Maxim Statistical Learning and Data Sciences https://doi.org/10.1007/978-3-319-17091-6_7	book	January 2015
Materials Data Infrastructure: A Case Study of the Citrination Platform to Examine Data Import, Storage, and Access O’Mara, Jordan; Meredig, Bryce; Michel, Kyle JOM, Vol. 68, Issue 8 https://doi.org/10.1007/s11837-016-1984-0	journal	June 2016
Scanning tunneling spectroscopy Feenstra, Randall M. Surface Science, Vol. 299-300 https://doi.org/10.1016/0039-6028(94)90710-2	journal	January 1994
Ion-induced crystallization and amorphization at crystal/amorphous interfaces of silicon Wang, Zhong-Lie; Itoh, Noriaki; Matsunami, Noriaki Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 100, Issue 4 https://doi.org/10.1016/0168-583X(95)00369-X	journal	June 1995
Current imaging tunneling spectroscopy of metallic deposits on silicon Asenjo, A.; Gómez-Rodríguez, J. M.; Baró, A. M. Ultramicroscopy, Vol. 42-44 https://doi.org/10.1016/0304-3991(92)90381-S	journal	July 1992
Experimental tests on double-resolution coherent imaging via STEM Rodenburg, J. M.; McCallum, B. C.; Nellist, P. D. Ultramicroscopy, Vol. 48, Issue 3 https://doi.org/10.1016/0304-3991(93)90105-7	journal	March 1993
Beyond the conventional information limit: the relevant coherence function Nellist, P. D.; Rodenburg, J. M. Ultramicroscopy, Vol. 54, Issue 1 https://doi.org/10.1016/0304-3991(94)90092-2	journal	May 1994
Regrowth of amorphous regions in semiconductors by sub-threshold electron beams Robertson, I. M.; Jenčič, I. Journal of Nuclear Materials, Vol. 239 https://doi.org/10.1016/S0022-3115(96)00485-0	journal	December 1996
Automated detection of particles, clusters and islands in scanning probe microscopy images Jak, M. J. J.; Konstapel, C.; van Kreuningen, A. Surface Science, Vol. 494, Issue 2 https://doi.org/10.1016/S0039-6028(01)01487-X	journal	November 2001
Dynamic atomic force microscopy methods García, R. Surface Science Reports, Vol. 47, Issue 6-8 https://doi.org/10.1016/S0167-5729(02)00077-8	journal	September 2002
Electron beam induced regrowth of ion implantation damage in Si and Ge Jenčič, I.; Robertson, I. M.; Skvarč, J. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 148, Issue 1-4 https://doi.org/10.1016/S0168-583X(98)00781-2	journal	January 1999
A spherical-aberration-corrected 200kV transmission electron microscope Haider, Max; Rose, Harald; Uhlemann, Stephan Ultramicroscopy, Vol. 75, Issue 1 https://doi.org/10.1016/S0304-3991(98)00048-5	journal	October 1998
Extracting information from sequences of spatially resolved EELS spectra using multivariate statistical analysis Bonnet, N.; Brun, N.; Colliex, C. Ultramicroscopy, Vol. 77, Issue 3-4 https://doi.org/10.1016/S0304-3991(99)00042-X	journal	July 1999
Crystallization from amorphous structure to hexagonal quantum dots induced by an electron beam on CdTe thin films Becerril, M.; Zelaya-Angel, O.; Medina-Torres, A. C. Journal of Crystal Growth, Vol. 311, Issue 5 https://doi.org/10.1016/j.jcrysgro.2008.12.056	journal	February 2009
Design Principles and Top Non-Fullerene Acceptor Candidates for Organic Photovoltaics Lopez, Steven A.; Sanchez-Lengeling, Benjamin; de Goes Soares, Julio Joule, Vol. 1, Issue 4 https://doi.org/10.1016/j.joule.2017.10.006	journal	December 2017
Deep Rotation Equivariant Network Li, Junying; Yang, Zichen; Liu, Haifeng Neurocomputing, Vol. 290 https://doi.org/10.1016/j.neucom.2018.02.029	journal	May 2018
Force measurements with the atomic force microscope: Technique, interpretation and applications Butt, Hans-Jürgen; Cappella, Brunero; Kappl, Michael Surface Science Reports, Vol. 59, Issue 1-6 https://doi.org/10.1016/j.surfrep.2005.08.003	journal	October 2005
Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images Bosman, M.; Watanabe, M.; Alexander, D. T. L. Ultramicroscopy, Vol. 106, Issue 11-12, p. 1024-1032 https://doi.org/10.1016/j.ultramic.2006.04.016	journal	October 2006
An electron microscope for the aberration-corrected era Krivanek, O. L.; Corbin, G. J.; Dellby, N. Ultramicroscopy, Vol. 108, Issue 3 https://doi.org/10.1016/j.ultramic.2007.07.010	journal	February 2008
Measurement method of aberration from Ronchigram by autocorrelation function Sawada, H.; Sannomiya, T.; Hosokawa, F. Ultramicroscopy, Vol. 108, Issue 11 https://doi.org/10.1016/j.ultramic.2008.04.095	journal	October 2008
REPRINT OF: Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns Barthel, J.; Thust, A. Ultramicroscopy, Vol. 111, Issue 7 https://doi.org/10.1016/j.ultramic.2011.01.010	journal	June 2011
Electron Energy Loss Spectroscopy imaging of surface plasmons at the nanometer scale Colliex, Christian; Kociak, Mathieu; Stéphan, Odile Ultramicroscopy, Vol. 162 https://doi.org/10.1016/j.ultramic.2015.11.012	journal	March 2016
Current status and future directions for in situ transmission electron microscopy Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke Ultramicroscopy, Vol. 170 https://doi.org/10.1016/j.ultramic.2016.08.007	journal	November 2016
Manipulating low-dimensional materials down to the level of single atoms with electron irradiation Susi, Toma; Meyer, Jannik C.; Kotakoski, Jani Ultramicroscopy, Vol. 180 https://doi.org/10.1016/j.ultramic.2017.03.005	journal	September 2017
A continuous sampling pattern design algorithm for atomic force microscopy images Luo, Yufan; Andersson, Sean B. Ultramicroscopy, Vol. 196 https://doi.org/10.1016/j.ultramic.2018.10.013	journal	January 2019
Spatial and spectral dynamics in STEM hyperspectral imaging using random scan patterns Zobelli, Alberto; Woo, Steffi Y.; Tararan, Anna Ultramicroscopy, Vol. 212 https://doi.org/10.1016/j.ultramic.2019.112912	journal	May 2020
K-space Navigation for Accurate High-angle Tilting and Control of the TEAM Sample Stage Duden, T.; Radmilovic, V.; Schmid, A. Microscopy and Microanalysis, Vol. 15, Issue S2 https://doi.org/10.1017/S143192760909847X	journal	July 2009
Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) With Nonrectangular Scans Li, Xin; Dyck, Ondrej; Kalinin, Sergei V. Microscopy and Microanalysis, Vol. 24, Issue 6 https://doi.org/10.1017/S143192761801543X	journal	December 2018
Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python. Meyer, Chris; Dellby, Niklas; Hachtel, Jordan A. Microscopy and Microanalysis, Vol. 25, Issue S2 https://doi.org/10.1017/S143192761900134X	journal	August 2019
py4DSTEM: Open Source Software for 4D-STEM Data Analysis Savitzky, Benjamin H.; Hughes, Lauren; Bustillo, Karen C. Microscopy and Microanalysis, Vol. 25, Issue S2 https://doi.org/10.1017/S1431927619001351	journal	August 2019
USID and Pycroscopy – Open Source Frameworks for Storing and Analyzing Imaging and Spectroscopy Data Somnath, Suhas; Smith, Chris R.; Laanait, Nouamane Microscopy and Microanalysis, Vol. 25, Issue S2 https://doi.org/10.1017/S1431927619001831	journal	August 2019
A Universal Scripting Engine for Transmission Electron Microscopy LeBeau, James; Kumar, Abinash; Hauwiller, Matthew Microscopy and Microanalysis, Vol. 26, Issue S2 https://doi.org/10.1017/S1431927620023338	journal	July 2020
Machine Learning for Electronically Excited States of Molecules Westermayr, Julia; Marquetand, Philipp Chemical Reviews https://doi.org/10.1021/acs.chemrev.0c00749	journal	November 2020
Automated Tip Conditioning for Scanning Tunneling Spectroscopy Wang, Shenkai; Zhu, Junmian; Blackwell, Raymond The Journal of Physical Chemistry A, Vol. 125, Issue 6 https://doi.org/10.1021/acs.jpca.0c10731	journal	February 2021
Toward Decoding the Relationship between Domain Structure and Functionality in Ferroelectrics via Hidden Latent Variables Kalinin, Sergei V.; Kelley, Kyle; Vasudevan, Rama K. ACS Applied Materials & Interfaces, Vol. 13, Issue 1 https://doi.org/10.1021/acsami.0c15085	journal	January 2021
Chemical Robotics Enabled Exploration of Stability in Multicomponent Lead Halide Perovskites via Machine Learning Higgins, Kate; Valleti, Sai Mani; Ziatdinov, Maxim ACS Energy Letters, Vol. 5, Issue 11 https://doi.org/10.1021/acsenergylett.0c01749	journal	October 2020
Dynamic Manipulation in Piezoresponse Force Microscopy: Creating Nonequilibrium Phases with Large Electromechanical Response Kelley, Kyle P.; Ren, Yao; Morozovska, Anna N. ACS Nano, Vol. 14, Issue 8 https://doi.org/10.1021/acsnano.0c04601	journal	August 2020
Directing Matter: Toward Atomic-Scale 3D Nanofabrication Jesse, Stephen; Borisevich, Albina Y.; Fowlkes, Jason D. ACS Nano, Vol. 10, Issue 6 https://doi.org/10.1021/acsnano.6b02489	journal	May 2016
Big, Deep, and Smart Data in Scanning Probe Microscopy Kalinin, Sergei V.; Strelcov, Evgheni; Belianinov, Alex ACS Nano, Vol. 10, Issue 10 https://doi.org/10.1021/acsnano.6b04212	journal	September 2016
Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations Ziatdinov, Maxim; Dyck, Ondrej; Maksov, Artem ACS Nano, Vol. 11, Issue 12 https://doi.org/10.1021/acsnano.7b07504	journal	October 2016
Autonomous Scanning Probe Microscopy in Situ Tip Conditioning through Machine Learning Rashidi, Mohammad; Wolkow, Robert A. ACS Nano, Vol. 12, Issue 6 https://doi.org/10.1021/acsnano.8b02208	journal	May 2018
Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale Strelcov, Evgheni; Kim, Yunseok; Jesse, Stephen Nano Letters, Vol. 13, Issue 8 https://doi.org/10.1021/nl400780d	journal	July 2013
Deep Data Analysis of Conductive Phenomena on Complex Oxide Interfaces: Physics from Data Mining Strelcov, Evgheni; Belianinov, Alexei; Hsieh, Ying-Hui ACS Nano, Vol. 8, Issue 6 https://doi.org/10.1021/nn502029b	journal	May 2014
Discovery of Wall-Selective Carbon Nanotube Growth Conditions via Automated Experimentation Nikolaev, Pavel; Hooper, Daylond; Perea-López, Nestor ACS Nano, Vol. 8, Issue 10 https://doi.org/10.1021/nn503347a	journal	October 2014
Electron microscopy image enhanced Haider, Maximilian; Uhlemann, Stephan; Schwan, Eugen Nature, Vol. 392, Issue 6678 https://doi.org/10.1038/33823	journal	April 1998
Positioning single atoms with a scanning tunnelling microscope Eigler, D. M.; Schweizer, E. K. Nature, Vol. 344, Issue 6266 https://doi.org/10.1038/344524a0	journal	April 1990
Imaging the effects of individual zinc impurity atoms on superconductivity in Bi2Sr2CaCu2O8+δ Pan, S. H.; Hudson, E. W.; Lang, K. M. Nature, Vol. 403, Issue 6771 https://doi.org/10.1038/35001534	journal	February 2000
Resolution beyond the 'information limit' in transmission electron microscopy Nellist, P. D.; McCallum, B. C.; Rodenburg, J. M. Nature, Vol. 374, Issue 6523 https://doi.org/10.1038/374630a0	journal	April 1995
Fire up the atom forge Kalinin, Sergei V.; Borisevich, Albina; Jesse, Stephen Nature, Vol. 539, Issue 7630 https://doi.org/10.1038/539485a	journal	November 2016
Detection of magnetic circular dichroism using a transmission electron microscope Schattschneider, P.; Rubino, S.; Hébert, C. Nature, Vol. 441, Issue 7092 https://doi.org/10.1038/nature04778	journal	May 2006
Production and application of electron vortex beams Verbeeck, J.; Tian, H.; Schattschneider, P. Nature, Vol. 467, Issue 7313 https://doi.org/10.1038/nature09366	journal	September 2010
Vibrational spectroscopy in the electron microscope Krivanek, Ondrej L.; Lovejoy, Tracy C.; Dellby, Niklas Nature, Vol. 514, Issue 7521 https://doi.org/10.1038/nature13870	journal	October 2014
Human-level control through deep reinforcement learning Mnih, Volodymyr; Kavukcuoglu, Koray; Silver, David Nature, Vol. 518, Issue 7540 https://doi.org/10.1038/nature14236	journal	February 2015
Mastering the game of Go with deep neural networks and tree search Silver, David; Huang, Aja; Maddison, Chris J. Nature, Vol. 529, Issue 7587 https://doi.org/10.1038/nature16961	journal	January 2016
Damage-free vibrational spectroscopy of biological materials in the electron microscope Rez, Peter; Aoki, Toshihiro; March, Katia Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms10945	journal	March 2016
Big–deep–smart data in imaging for guiding materials design Kalinin, Sergei V.; Sumpter, Bobby G.; Archibald, Richard K. Nature Materials, Vol. 14, Issue 10 https://doi.org/10.1038/nmat4395	journal	September 2015
Sketched oxide single-electron transistor Cheng, Guanglei; Siles, Pablo F.; Bi, Feng Nature Nanotechnology, Vol. 6, Issue 6 https://doi.org/10.1038/nnano.2011.56	journal	April 2011
A single-atom transistor Fuechsle, Martin; Miwa, Jill A.; Mahapatra, Suddhasatta Nature Nanotechnology, Vol. 7, Issue 4 https://doi.org/10.1038/nnano.2012.21	journal	February 2012
Advanced scanning probe lithography Garcia, Ricardo; Knoll, Armin W.; Riedo, Elisa Nature Nanotechnology, Vol. 9, Issue 8 https://doi.org/10.1038/nnano.2014.157	journal	August 2014
Differential phase-contrast microscopy at atomic resolution Shibata, Naoya; Findlay, Scott D.; Kohno, Yuji Nature Physics, Vol. 8, Issue 8 https://doi.org/10.1038/nphys2337	journal	June 2012
A bridge for accelerating materials by design Sumpter, Bobby G.; Vasudevan, Rama K.; Potok, Thomas npj Computational Materials, Vol. 1, Issue 1 https://doi.org/10.1038/npjcompumats.2015.8	journal	November 2015
Ultrafast current imaging by Bayesian inversion Somnath, S.; Law, K. J. H.; Morozovska, A. N. Nature Communications, Vol. 9, Issue 1 https://doi.org/10.1038/s41467-017-02455-7	journal	February 2018
Learning surface molecular structures via machine vision Ziatdinov, Maxim; Maksov, Artem; Kalinin, Sergei V. npj Computational Materials, Vol. 3, Issue 1 https://doi.org/10.1038/s41524-017-0038-7	journal	August 2017
Deep learning analysis of defect and phase evolution during electron beam-induced transformations in WS2 Maksov, Artem; Dyck, Ondrej; Wang, Kai npj Computational Materials, Vol. 5, Issue 1 https://doi.org/10.1038/s41524-019-0152-9	journal	February 2019
Ensemble learning-iterative training machine learning for uncertainty quantification and automated experiment in atom-resolved microscopy Ghosh, Ayana; Sumpter, Bobby G.; Dyck, Ondrej npj Computational Materials, Vol. 7, Issue 1 https://doi.org/10.1038/s41524-021-00569-7	journal	July 2021
Deep-neural-network solution of the electronic Schrödinger equation Hermann, Jan; Schätzle, Zeno; Noé, Frank Nature Chemistry, Vol. 12, Issue 10 https://doi.org/10.1038/s41557-020-0544-y	journal	September 2020
Machine learning for molecular and materials science Butler, Keith T.; Davies, Daniel W.; Cartwright, Hugh Nature, Vol. 559, Issue 7715 https://doi.org/10.1038/s41586-018-0337-2	journal	July 2018
Software tools for automated transmission electron microscopy Schorb, Martin; Haberbosch, Isabella; Hagen, Wim J. H. Nature Methods, Vol. 16, Issue 6 https://doi.org/10.1038/s41592-019-0396-9	journal	May 2019
A Kriging-Based Approach to Autonomous Experimentation with Applications to X-Ray Scattering Noack, Marcus M.; Yager, Kevin G.; Fukuto, Masafumi Scientific Reports, Vol. 9, Issue 1 https://doi.org/10.1038/s41598-019-48114-3	journal	August 2019
Advances in Kriging-Based Autonomous X-Ray Scattering Experiments Noack, Marcus M.; Doerk, Gregory S.; Li, Ruipeng Scientific Reports, Vol. 10, Issue 1 https://doi.org/10.1038/s41598-020-57887-x	journal	January 2020
Artificial-intelligence-driven scanning probe microscopy Krull, A.; Hirsch, P.; Rother, C. Communications Physics, Vol. 3, Issue 1 https://doi.org/10.1038/s42005-020-0317-3	journal	March 2020
Correlative Multimodal Probing of Ionically-Mediated Electromechanical Phenomena in Simple Oxides Kim, Yunseok; Strelcov, Evgheni; Hwang, In Rok Scientific Reports, Vol. 3, Issue 1 https://doi.org/10.1038/srep02924	journal	October 2013
Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy Shibata, Naoya; Findlay, Scott D.; Sasaki, Hirokazu Scientific Reports, Vol. 5, Issue 1 https://doi.org/10.1038/srep10040	journal	June 2015
Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways Sang, Xiahan; Lupini, Andrew R.; Ding, Jilai Scientific Reports, Vol. 7, Issue 1 https://doi.org/10.1038/srep43585	journal	March 2017
Nano-chemistry and scanning probe nanolithographies Garcia, Ricardo; Martinez, Ramses V.; Martinez, Javier Chem. Soc. Rev., Vol. 35, Issue 1 https://doi.org/10.1039/B501599P	journal	January 2006
Multivariate statistical methods for the analysis of microscope image series: applications in materials science Bonnet, N. Journal of Microscopy, Vol. 190, Issue 1‐2 https://doi.org/10.1046/j.1365-2818.1998.3250876.x	journal	April 1998
Local oxidation of silicon surfaces by dynamic force microscopy: Nanofabrication and water bridge formation Garcı́a, Ricardo; Calleja, Montserrat; Pérez-Murano, Francesc Applied Physics Letters, Vol. 72, Issue 18 https://doi.org/10.1063/1.121340	journal	May 1998
Nano-oxidation of silicon surfaces: Comparison of noncontact and contact atomic-force microscopy methods Tello, Marta; Garcı́a, Ricardo Applied Physics Letters, Vol. 79, Issue 3 https://doi.org/10.1063/1.1385582	journal	July 2001
Nanoscale domain patterning of lead zirconate titanate materials using electron beams Ferris, J. H.; Li, D. B.; Kalinin, S. V. Applied Physics Letters, Vol. 84, Issue 5 https://doi.org/10.1063/1.1644327	journal	February 2004
Materials contrast in piezoresponse force microscopy Kalinin, Sergei V.; Eliseev, Eugene A.; Morozovska, Anna N. Applied Physics Letters, Vol. 88, Issue 23 https://doi.org/10.1063/1.2206992	journal	June 2006
Irradiation behavior of SrTiO[sub 3] at temperatures close to the critical temperature for amorphization Zhang, Y.; Wang, C. M.; Engelhard, M. H. Journal of Applied Physics, Vol. 100, Issue 11 https://doi.org/10.1063/1.2399932	journal	January 2006
Electron-beam induced recrystallization in amorphous apatite Bae, In-Tae; Zhang, Yanwen; Weber, William J. Applied Physics Letters, Vol. 90, Issue 2 https://doi.org/10.1063/1.2430779	journal	January 2007
Electromechanical detection in scanning probe microscopy: Tip models and materials contrast Eliseev, Eugene A.; Kalinin, Sergei V.; Jesse, Stephen Journal of Applied Physics, Vol. 102, Issue 1 https://doi.org/10.1063/1.2749463	journal	July 2007
Rapid multidimensional data acquisition in scanning probe microscopy applied to local polarization dynamics and voltage dependent contact mechanics Jesse, Stephen; Maksymovych, Peter; Kalinin, Sergei V. Applied Physics Letters, Vol. 93, Issue 11 https://doi.org/10.1063/1.2980031	journal	September 2008
Nanopatterning of carbonaceous structures by field-induced carbon dioxide splitting with a force microscope Garcia, R.; Losilla, N. S.; Martínez, J. Applied Physics Letters, Vol. 96, Issue 14 https://doi.org/10.1063/1.3374885	journal	April 2010
Spatially resolved probing of Preisach density in polycrystalline ferroelectric thin films Guo, S.; Ovchinnikov, O. S.; Curtis, M. E. Journal of Applied Physics, Vol. 108, Issue 8 https://doi.org/10.1063/1.3493738	journal	October 2010
“Water-cycle” mechanism for writing and erasing nanostructures at the LaAlO3/SrTiO3 interface Bi, Feng; Bogorin, Daniela F.; Cen, Cheng Applied Physics Letters, Vol. 97, Issue 17 https://doi.org/10.1063/1.3506509	journal	October 2010
Automated probe microscopy via evolutionary optimization at the atomic scale Woolley, Richard A. J.; Stirling, Julian; Radocea, Adrian Applied Physics Letters, Vol. 98, Issue 25 https://doi.org/10.1063/1.3600662	journal	June 2011
Dynamic piezoresponse force microscopy: Spatially resolved probing of polarization dynamics in time and voltage domains Kumar, A.; Ehara, Y.; Wada, A. Journal of Applied Physics, Vol. 112, Issue 5 https://doi.org/10.1063/1.4746080	journal	September 2012
Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm Huang, Peng; Andersson, Sean B. Review of Scientific Instruments, Vol. 85, Issue 6 https://doi.org/10.1063/1.4881682	journal	June 2014
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy Béché, A.; Goris, B.; Freitag, B. Applied Physics Letters, Vol. 108, Issue 9 https://doi.org/10.1063/1.4943086	journal	February 2016
Implementing an accurate and rapid sparse sampling approach for low-dose atomic resolution STEM imaging Kovarik, L.; Stevens, A.; Liyu, A. Applied Physics Letters, Vol. 109, Issue 16 https://doi.org/10.1063/1.4965720	journal	October 2016
Placing single atoms in graphene with a scanning transmission electron microscope Dyck, Ondrej; Kim, Songkil; Kalinin, Sergei V. Applied Physics Letters, Vol. 111, Issue 11 https://doi.org/10.1063/1.4998599	journal	September 2017
Subsampled STEM-ptychography Stevens, Andrew; Yang, Hao; Hao, Weituo Applied Physics Letters, Vol. 113, Issue 3 https://doi.org/10.1063/1.5040496	journal	July 2018
Rosette-scan video-rate atomic force microscopy: Trajectory patterning and control design Nikooienejad, Nastaran; Maroufi, Mohammad; Moheimani, S. O. Reza Review of Scientific Instruments, Vol. 90, Issue 7 https://doi.org/10.1063/1.5098499	journal	July 2019
Building ferroelectric from the bottom up: The machine learning analysis of the atomic-scale ferroelectric distortions Ziatdinov, M.; Nelson, C.; Vasudevan, R. K. Applied Physics Letters, Vol. 115, Issue 5 https://doi.org/10.1063/1.5109520	journal	July 2019
Guided search for desired functional responses via Bayesian optimization of generative model: Hysteresis loop shape engineering in ferroelectrics Kalinin, Sergei V.; Ziatdinov, Maxim; Vasudevan, Rama K. Journal of Applied Physics, Vol. 128, Issue 2 https://doi.org/10.1063/5.0011917	journal	July 2020
Predictability as a probe of manifest and latent physics: The case of atomic scale structural, chemical, and polarization behaviors in multiferroic Sm-doped BiFeO ₃ Ziatdinov, Maxim; Creange, Nicole; Zhang, Xiaohang Applied Physics Reviews, Vol. 8, Issue 1 https://doi.org/10.1063/5.0016792	journal	March 2021
Nanoelectromechanics of piezoelectric indentation and applications to scanning probe microscopies of ferroelectric materials Karapetian *, E.; Kachanov, M.; Kalinin, S. V. Philosophical Magazine, Vol. 85, Issue 10 https://doi.org/10.1080/14786430412331324680	journal	April 2005
An adaptive non-raster scanning method in atomic force microscopy for simple sample shapes Zhang, Kaiqiang; Hatano, Toshiaki; Tien, Thang Measurement Science and Technology, Vol. 26, Issue 3 https://doi.org/10.1088/0957-0233/26/3/035401	journal	February 2015
Sub-10 nanometre fabrication: molecular templating, electron-beam sculpting and crystallization of metallic nanowires Remeika, M.; Bezryadin, A. Nanotechnology, Vol. 16, Issue 8 https://doi.org/10.1088/0957-4484/16/8/032	journal	May 2005
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale Jesse, Stephen; Kalinin, Sergei V.; Proksch, Roger Nanotechnology, Vol. 18, Issue 43 https://doi.org/10.1088/0957-4484/18/43/435503	journal	September 2007
Adaptive probe trajectory scanning probe microscopy for multiresolution measurements of interface geometry Ovchinnikov, Oleg S.; Jesse, S.; Kalinin, S. V. Nanotechnology, Vol. 20, Issue 25 https://doi.org/10.1088/0957-4484/20/25/255701	journal	June 2009
Fast spiral-scan atomic force microscopy Mahmood, I. A.; Reza Moheimani, S. O. Nanotechnology, Vol. 20, Issue 36 https://doi.org/10.1088/0957-4484/20/36/365503	journal	August 2009
Functional recognition imaging using artificial neural networks: applications to rapid cellular identification via broadband electromechanical response Nikiforov, M. P.; Reukov, V. V.; Thompson, G. L. Nanotechnology, Vol. 20, Issue 40 https://doi.org/10.1088/0957-4484/20/40/405708	journal	September 2009
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy Jesse, Stephen; Kalinin, Sergei V. Nanotechnology, Vol. 20, Issue 8 https://doi.org/10.1088/0957-4484/20/8/085714	journal	February 2009
High-speed cycloid-scan atomic force microscopy Yong, Y. K.; Moheimani, S. O. R.; Petersen, I. R. Nanotechnology, Vol. 21, Issue 36 https://doi.org/10.1088/0957-4484/21/36/365503	journal	August 2010
High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories Tuma, Tomas; Lygeros, John; Kartik, V. Nanotechnology, Vol. 23, Issue 18 https://doi.org/10.1088/0957-4484/23/18/185501	journal	April 2012
Improved accuracy and speed in scanning probe microscopy by image reconstruction from non-gridded position sensor data Ziegler, Dominik; Meyer, Travis R.; Farnham, Rodrigo Nanotechnology, Vol. 24, Issue 33 https://doi.org/10.1088/0957-4484/24/33/335703	journal	July 2013
Deep data mining in a real space: separation of intertwined electronic responses in a lightly doped BaFe ₂ As ₂ Ziatdinov, Maxim; Maksov, Artem; Li, Li Nanotechnology, Vol. 27, Issue 47 https://doi.org/10.1088/0957-4484/27/47/475706	journal	October 2016
Data mining graphene: correlative analysis of structure and electronic degrees of freedom in graphenic monolayers with defects Ziatdinov, Maxim; Fujii, Shintaro; Kiguchi, Manabu Nanotechnology, Vol. 27, Issue 49 https://doi.org/10.1088/0957-4484/27/49/495703	journal	November 2016
Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control Gruverman, A.; Auciello, O.; Ramesh, R. Nanotechnology, Vol. 8, Issue 3A https://doi.org/10.1088/0957-4484/8/3A/008	journal	September 1997
Towards the low-dose characterization of beam sensitive nanostructures via implementation of sparse image acquisition in scanning transmission electron microscopy Hwang, Sunghwan; Han, Chang Wan; Venkatakrishnan, Singanallur V. Measurement Science and Technology, Vol. 28, Issue 4 https://doi.org/10.1088/1361-6501/aa57df	journal	February 2017
Direct atomic fabrication and dopant positioning in Si using electron beams with active real-time image-based feedback Jesse, Stephen; Hudak, Bethany M.; Zarkadoula, Eva Nanotechnology, Vol. 29, Issue 25 https://doi.org/10.1088/1361-6528/aabb79	journal	April 2018
The NOMAD laboratory: from data sharing to artificial intelligence Draxl, Claudia; Scheffler, Matthias Journal of Physics: Materials, Vol. 2, Issue 3 https://doi.org/10.1088/2515-7639/ab13bb	journal	May 2019
Progress in aberration-corrected scanning transmission electron microscopy Dellby, N.; Krivanek, O. L.; Nellist, P. D. Microscopy, Vol. 50, Issue 3 https://doi.org/10.1093/jmicro/50.3.177	journal	May 2001
Atomic-resolution spectroscopic imaging: past, present and future Pennycook, S. J.; Varela, M.; Lupini, A. R. Journal of Electron Microscopy, Vol. 58, Issue 3 https://doi.org/10.1093/jmicro/dfn030	journal	January 2009
Monochromated STEM with a 30 meV-wide, atom-sized electron probe Krivanek, Ondrej L.; Lovejoy, Tracy C.; Dellby, Niklas Microscopy, Vol. 62, Issue 1 https://doi.org/10.1093/jmicro/dfs089	journal	January 2013
The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images Stevens, Andrew; Yang, Hao; Carin, Lawrence Microscopy, Vol. 63, Issue 1 https://doi.org/10.1093/jmicro/dft042	journal	October 2013
Nanoelectromechanics of piezoresponse force microscopy Kalinin, Sergei V.; Karapetian, Edgar; Kachanov, Mark Physical Review B, Vol. 70, Issue 18 https://doi.org/10.1103/PhysRevB.70.184101	journal	November 2004
Resolution-function theory in piezoresponse force microscopy: Wall imaging, spectroscopy, and lateral resolution Morozovska, Anna N.; Eliseev, Eugene A.; Bravina, Svetlana L. Physical Review B, Vol. 75, Issue 17 https://doi.org/10.1103/PhysRevB.75.174109	journal	May 2007
Detection of magnetic circular dichroism on the two-nanometer scale Schattschneider, Peter; Stöger-Pollach, Michael; Rubino, Stefano Physical Review B, Vol. 78, Issue 10 https://doi.org/10.1103/PhysRevB.78.104413	journal	September 2008
Electron-beam-induced ferroelectric domain behavior in the transmission electron microscope: Toward deterministic domain patterning Hart, James L.; Liu, Shi; Lang, Andrew C. Physical Review B, Vol. 94, Issue 17 https://doi.org/10.1103/PhysRevB.94.174104	journal	November 2016
Achieving Atomic Resolution Magnetic Dichroism by Controlling the Phase Symmetry of an Electron Probe Rusz, Ján; Idrobo, Juan-Carlos; Bhowmick, Somnath Physical Review Letters, Vol. 113, Issue 14 https://doi.org/10.1103/PhysRevLett.113.145501	journal	September 2014
Subangstrom Resolution by Underfocused Incoherent Transmission Electron Microscopy Nellist, P. D.; Pennycook, S. J. Physical Review Letters, Vol. 81, Issue 19 https://doi.org/10.1103/PhysRevLett.81.4156	journal	November 1998
Atomically Precise Placement of Single Dopants in Si Schofield, S. R.; Curson, N. J.; Simmons, M. Y. Physical Review Letters, Vol. 91, Issue 13 https://doi.org/10.1103/PhysRevLett.91.136104	journal	September 2003
Ab initio solution of the many-electron Schrödinger equation with deep neural networks Pfau, David; Spencer, James S.; Matthews, Alexander G. D. G. Physical Review Research, Vol. 2, Issue 3 https://doi.org/10.1103/PhysRevResearch.2.033429	journal	September 2020
Spin glasses: Experimental facts, theoretical concepts, and open questions Binder, K.; Young, A. P. Reviews of Modern Physics, Vol. 58, Issue 4 https://doi.org/10.1103/RevModPhys.58.801	journal	October 1986
Spiral scanning: An alternative to conventional raster scanning in high-speed scanning probe microscopes Mahmood, I. A.; Moheimani, S. O. R. 2010 American Control Conference (ACC 2010), Proceedings of the 2010 American Control Conference https://doi.org/10.1109/ACC.2010.5530444	conference	June 2010
Non-raster sampling in atomic force microscopy: A compressed sensing approach Andersson, S. B.; Pao, L. Y. 2012 American Control Conference - ACC 2012, 2012 American Control Conference (ACC) https://doi.org/10.1109/ACC.2012.6315406	conference	June 2012
Fast scanning in AFM using non-raster sampling and time-optimal trajectories Huang, Peng; Andersson, Sean B. 2012 IEEE 51st Annual Conference on Decision and Control (CDC), 2012 IEEE 51st IEEE Conference on Decision and Control (CDC) https://doi.org/10.1109/CDC.2012.6426849	conference	December 2012
Curiosity-Driven Exploration by Self-Supervised Prediction Pathak, Deepak; Agrawal, Pulkit; Efros, Alexei A. 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) https://doi.org/10.1109/CVPRW.2017.70	conference	July 2017
Review of Deep Reinforcement Learning for Robot Manipulation Nguyen, Hai; La, Hung 2019 Third IEEE International Conference on Robotic Computing (IRC) https://doi.org/10.1109/IRC.2019.00120	conference	February 2019
Efficient Exploration Through Bayesian Deep Q-Networks Azizzadenesheli, Kamyar; Brunskill, Emma; Anandkumar, Animashree 2018 Information Theory and Applications Workshop (ITA) https://doi.org/10.1109/ITA.2018.8503252	conference	February 2018
Bayesian Fusion of Multi-Band Images Wei, Qi; Dobigeon, Nicolas; Tourneret, Jean-Yves IEEE Journal of Selected Topics in Signal Processing, Vol. 9, Issue 6 https://doi.org/10.1109/JSTSP.2015.2407855	journal	September 2015
Drift compensation for automatic nanomanipulation with scanning probe microscopes Mokaberi, B.; Requicha, A. A. G. IEEE Transactions on Automation Science and Engineering, Vol. 3, Issue 3 https://doi.org/10.1109/TASE.2006.875534	journal	July 2006
Video-Rate Non-Raster AFM Imaging With Cycloid Trajectory Nikooienejad, Nastaran; Alipour, Afshin; Maroufi, Mohammad IEEE Transactions on Control Systems Technology https://doi.org/10.1109/TCST.2018.2879939	journal	January 2018
Deep Reinforcement Learning for Multiagent Systems: A Review of Challenges, Solutions, and Applications Nguyen, Thanh Thi; Nguyen, Ngoc Duy; Nahavandi, Saeid IEEE Transactions on Cybernetics, Vol. 50, Issue 9 https://doi.org/10.1109/TCYB.2020.2977374	journal	September 2020
Hyperspectral and Multispectral Image Fusion Based on a Sparse Representation Wei, Qi; Bioucas-Dias, Jose; Dobigeon, Nicolas IEEE Transactions on Geoscience and Remote Sensing, Vol. 53, Issue 7 https://doi.org/10.1109/TGRS.2014.2381272	journal	July 2015
Video-Rate Lissajous-Scan Atomic Force Microscopy Yong, Yuen Kuan; Bazaei, Ali; Moheimani, S. O. Reza IEEE Transactions on Nanotechnology, Vol. 13, Issue 1 https://doi.org/10.1109/TNANO.2013.2292610	journal	January 2014
Prior Probabilities Jaynes, Edwin IEEE Transactions on Systems Science and Cybernetics, Vol. 4, Issue 3 https://doi.org/10.1109/TSSC.1968.300117	journal	January 1968
Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future Balke, Nina; Bdikin, Igor; Kalinin, Sergei V. Journal of the American Ceramic Society, Vol. 92, Issue 8 https://doi.org/10.1111/j.1551-2916.2009.03240.x	journal	August 2009
A Novel Non-Raster Scan Method for AFM Imaging Nikooienejad, Nastaran; Maroufi, Mohammad; Moheimani, S. O. Reza ASME 2018 Dynamic Systems and Control Conference, Volume 3: Modeling and Validation; Multi-Agent and Networked Systems; Path Planning and Motion Control; Tracking Control Systems; Unmanned Aerial Vehicles (UAVs) and Application; Unmanned Ground and Aerial Vehicles; Vibration in Mechanical Systems; Vibrations and Control of Systems; Vibrations: Modeling, Analysis, and Control https://doi.org/10.1115/DSCC2018-9049	conference	November 2018
Materials in nanotechnology: New structures, new properties, new complexity Bonnell, Dawn A. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 21, Issue 5 https://doi.org/10.1116/1.1600445	journal	September 2003
Sparse imaging for fast electron microscopy Anderson, Hyrum S.; Ilic-Helms, Jovana; Rohrer, Brandon IS&T/SPIE Electronic Imaging, SPIE Proceedings https://doi.org/10.1117/12.2008313	conference	February 2013
Building and exploring libraries of atomic defects in graphene: Scanning transmission electron and scanning tunneling microscopy study Ziatdinov, Maxim; Dyck, Ondrej; Li, Xin Science Advances, Vol. 5, Issue 9 https://doi.org/10.1126/sciadv.aaw8989	journal	September 2019
Autonomous robotic nanofabrication with reinforcement learning Leinen, Philipp; Esders, Malte; Schütt, Kristof T. Science Advances, Vol. 6, Issue 36 https://doi.org/10.1126/sciadv.abb6987	journal	September 2020
Exploring order parameters and dynamic processes in disordered systems via variational autoencoders Kalinin, Sergei V.; Dyck, Ondrej; Jesse, Stephen Science Advances, Vol. 7, Issue 17 https://doi.org/10.1126/sciadv.abd5084	journal	April 2021
Molecule Cascades Heinrich, A. J. Science, Vol. 298, Issue 5597 https://doi.org/10.1126/science.1076768	journal	October 2002
A general reinforcement learning algorithm that masters chess, shogi, and Go through self-play Silver, David; Hubert, Thomas; Schrittwieser, Julian Science, Vol. 362, Issue 6419 https://doi.org/10.1126/science.aar6404	journal	December 2018
Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope Hachtel, Jordan A.; Huang, Jingsong; Popovs, Ilja Science, Vol. 363, Issue 6426 https://doi.org/10.1126/science.aav5845	journal	January 2019
Band Excitation in Scanning Probe Microscopy: Recognition and Functional Imaging Jesse, S.; Vasudevan, R. K.; Collins, L. Annual Review of Physical Chemistry, Vol. 65, Issue 1 https://doi.org/10.1146/annurev-physchem-040513-103609	journal	April 2014
Imaging and Control of Domain Structures in Ferroelectric thin Films via Scanning Force Microscopy Gruverman, Alexei; Auciello, Orlando; Tokumoto, Hiroshi Annual Review of Materials Science, Vol. 28, Issue 1 https://doi.org/10.1146/annurev.matsci.28.1.101	journal	August 1998
Spiral Scanning Method for Atomic Force Microscopy Hung, Shao-Kang Journal of Nanoscience and Nanotechnology, Vol. 10, Issue 7 https://doi.org/10.1166/jnn.2010.2353	journal	July 2010
Learning dexterous in-hand manipulation Andrychowicz, OpenAI: Marcin; Baker, Bowen; Chociej, Maciek The International Journal of Robotics Research, Vol. 39, Issue 1 https://doi.org/10.1177/0278364919887447	journal	November 2019
Applying compressive sensing to TEM video: a substantial frame rate increase on any camera Stevens, Andrew; Kovarik, Libor; Abellan, Patricia Advanced Structural and Chemical Imaging, Vol. 1, Issue 10 https://doi.org/10.1186/s40679-015-0009-3	journal	August 2015
Detecting magnetic ordering with atomic size electron probes Idrobo, Juan Carlos; Rusz, Ján; Spiegelberg, Jakob Advanced Structural and Chemical Imaging, Vol. 2, Issue 1 https://doi.org/10.1186/s40679-016-0019-9	journal	May 2016
Dynamic scan control in STEM: spiral scans Sang, Xiahan; Lupini, Andrew R.; Unocic, Raymond R. Advanced Structural and Chemical Imaging, Vol. 2, Issue 1 https://doi.org/10.1186/s40679-016-0020-3	journal	June 2016
Spectroscopic imaging in piezoresponse force microscopy: New opportunities for studying polarization dynamics in ferroelectrics and multiferroics Vasudevan, R. K.; Jesse, S.; Kim, Y. MRS Communications, Vol. 2, Issue 3 https://doi.org/10.1557/mrc.2012.15	journal	July 2012
Artificial neural network correction for density-functional tight-binding molecular dynamics simulations Zhu, Junmian; Vuong, Van Quan; Sumpter, Bobby G. MRS Communications, Vol. 9, Issue 3 https://doi.org/10.1557/mrc.2019.80	journal	June 2019
A self-driving microscope and the Atomic Forge Dyck, Ondrej; Jesse, Stephen; Kalinin, Sergei V. MRS Bulletin, Vol. 44, Issue 09 https://doi.org/10.1557/mrs.2019.211	journal	September 2019
Feature tracking for high speed AFM: Experimental demonstration Hartman, Brett; Andersson, Sean B. 2017 American Control Conference (ACC) https://doi.org/10.23919/ACC.2017.7963046	conference	May 2017
A new-designed non-raster scan and precision control for increasing AFM imaging speed Chen, Huang-Chih; Fu, Li-Chen 2020 American Control Conference (ACC) https://doi.org/10.23919/ACC45564.2020.9147612	conference	July 2020
Gaussian Processes for Machine Learning Rasmussen, Carl Edward; Williams, Christopher K. I. The MIT Press https://doi.org/10.7551/mitpress/3206.001.0001	book	January 2005

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