Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy
Abstract
Machine learning and artificial intelligence (ML/AI) are rapidly becoming an indispensable part of physics research, with domain applications ranging from theory and materials prediction to high-throughput data analysis. In parallel, the recent successes in applying ML/AI methods for autonomous systems from robotics to self-driving cars to organic and inorganic synthesis are generating enthusiasm for the potential of these techniques to enable automated and autonomous experiments (AE) in imaging. Here, we aim to analyze the major pathways toward AE in imaging methods with sequential image formation mechanisms, focusing on scanning probe microscopy (SPM) and (scanning) transmission electron microscopy ((S)TEM). We argue that automated experiments should necessarily be discussed in a broader context of the general domain knowledge that both informs the experiment and is increased as the result of the experiment. As such, this analysis should explore the human and ML/AI roles prior to and during the experiment and consider the latencies, biases, and prior knowledge of the decision-making process. Similarly, such discussion should include the limitations of the existing imaging systems, including intrinsic latencies, non-idealities, and drifts comprising both correctable and stochastic components. We further pose that the role of the AE in microscopy is not the exclusion of humanmore »
- Authors:
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1857888
- Alternate Identifier(s):
- OSTI ID: 1813222
- Grant/Contract Number:
- 34532; AC05-00OR22725
- Resource Type:
- Published Article
- Journal Name:
- ACS Nano
- Additional Journal Information:
- Journal Name: ACS Nano Journal Volume: 15 Journal Issue: 8; Journal ID: ISSN 1936-0851
- Publisher:
- American Chemical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; machine learning; artificial intelligence; automated experiments; scanning probe microscopy; reinforcement learning; Gaussian process regression; Bayesian optimization; scanning transmission electron microscopy; autonomous; imaging; algorithms; neural networks; mathematical methods
Citation Formats
Kalinin, Sergei V., Ziatdinov, Maxim, Hinkle, Jacob, Jesse, Stephen, Ghosh, Ayana, Kelley, Kyle P., Lupini, Andrew R., Sumpter, Bobby G., and Vasudevan, Rama K. Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy. United States: N. p., 2021.
Web. doi:10.1021/acsnano.1c02104.
Kalinin, Sergei V., Ziatdinov, Maxim, Hinkle, Jacob, Jesse, Stephen, Ghosh, Ayana, Kelley, Kyle P., Lupini, Andrew R., Sumpter, Bobby G., & Vasudevan, Rama K. Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy. United States. https://doi.org/10.1021/acsnano.1c02104
Kalinin, Sergei V., Ziatdinov, Maxim, Hinkle, Jacob, Jesse, Stephen, Ghosh, Ayana, Kelley, Kyle P., Lupini, Andrew R., Sumpter, Bobby G., and Vasudevan, Rama K. Fri .
"Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy". United States. https://doi.org/10.1021/acsnano.1c02104.
@article{osti_1857888,
title = {Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy},
author = {Kalinin, Sergei V. and Ziatdinov, Maxim and Hinkle, Jacob and Jesse, Stephen and Ghosh, Ayana and Kelley, Kyle P. and Lupini, Andrew R. and Sumpter, Bobby G. and Vasudevan, Rama K.},
abstractNote = {Machine learning and artificial intelligence (ML/AI) are rapidly becoming an indispensable part of physics research, with domain applications ranging from theory and materials prediction to high-throughput data analysis. In parallel, the recent successes in applying ML/AI methods for autonomous systems from robotics to self-driving cars to organic and inorganic synthesis are generating enthusiasm for the potential of these techniques to enable automated and autonomous experiments (AE) in imaging. Here, we aim to analyze the major pathways toward AE in imaging methods with sequential image formation mechanisms, focusing on scanning probe microscopy (SPM) and (scanning) transmission electron microscopy ((S)TEM). We argue that automated experiments should necessarily be discussed in a broader context of the general domain knowledge that both informs the experiment and is increased as the result of the experiment. As such, this analysis should explore the human and ML/AI roles prior to and during the experiment and consider the latencies, biases, and prior knowledge of the decision-making process. Similarly, such discussion should include the limitations of the existing imaging systems, including intrinsic latencies, non-idealities, and drifts comprising both correctable and stochastic components. We further pose that the role of the AE in microscopy is not the exclusion of human operators (as is the case for autonomous driving), but rather automation of routine operations such as microscope tuning, etc., prior to the experiment, and conversion of low latency decision making processes on the time scale spanning from image acquisition to human-level high-order experiment planning. Finally, we argue that ML/AI can dramatically alter the (S)TEM and SPM fields; however, this process is likely to be highly nontrivial and initiated by combined human-ML workflows and will bring challenges both from the microscope and ML/AI sides. At the same time, these methods will enable opportunities and paradigms for scientific discovery and nanostructure fabrication.},
doi = {10.1021/acsnano.1c02104},
journal = {ACS Nano},
number = 8,
volume = 15,
place = {United States},
year = {Fri Jul 16 00:00:00 EDT 2021},
month = {Fri Jul 16 00:00:00 EDT 2021}
}
https://doi.org/10.1021/acsnano.1c02104
Works referenced in this record:
Dynamic piezoresponse force microscopy: Spatially resolved probing of polarization dynamics in time and voltage domains
journal, September 2012
- Kumar, A.; Ehara, Y.; Wada, A.
- Journal of Applied Physics, Vol. 112, Issue 5
Dynamic atomic force microscopy methods
journal, September 2002
- García, R.
- Surface Science Reports, Vol. 47, Issue 6-8
Non-raster sampling in atomic force microscopy: A compressed sensing approach
conference, June 2012
- Andersson, S. B.; Pao, L. Y.
- 2012 American Control Conference - ACC 2012, 2012 American Control Conference (ACC)
The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images
journal, October 2013
- Stevens, Andrew; Yang, Hao; Carin, Lawrence
- Microscopy, Vol. 63, Issue 1
Building Structures Atom by Atom via Electron Beam Manipulation
journal, August 2018
- Dyck, Ondrej; Kim, Songkil; Jimenez-Izal, Elisa
- Small, Vol. 14, Issue 38
Extracting information from sequences of spatially resolved EELS spectra using multivariate statistical analysis
journal, July 1999
- Bonnet, N.; Brun, N.; Colliex, C.
- Ultramicroscopy, Vol. 77, Issue 3-4
Materials Data Infrastructure: A Case Study of the Citrination Platform to Examine Data Import, Storage, and Access
journal, June 2016
- O’Mara, Jordan; Meredig, Bryce; Michel, Kyle
- JOM, Vol. 68, Issue 8
Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope
journal, January 2019
- Hachtel, Jordan A.; Huang, Jingsong; Popovs, Ilja
- Science, Vol. 363, Issue 6426
Current imaging tunneling spectroscopy of metallic deposits on silicon
journal, July 1992
- Asenjo, A.; Gómez-Rodríguez, J. M.; Baró, A. M.
- Ultramicroscopy, Vol. 42-44
Toward Decoding the Relationship between Domain Structure and Functionality in Ferroelectrics via Hidden Latent Variables
journal, January 2021
- Kalinin, Sergei V.; Kelley, Kyle; Vasudevan, Rama K.
- ACS Applied Materials & Interfaces, Vol. 13, Issue 1
USID and Pycroscopy – Open Source Frameworks for Storing and Analyzing Imaging and Spectroscopy Data
journal, August 2019
- Somnath, Suhas; Smith, Chris R.; Laanait, Nouamane
- Microscopy and Microanalysis, Vol. 25, Issue S2
Learning dexterous in-hand manipulation
journal, November 2019
- Andrychowicz, OpenAI: Marcin; Baker, Bowen; Chociej, Maciek
- The International Journal of Robotics Research, Vol. 39, Issue 1
Nano-chemistry and scanning probe nanolithographies
journal, January 2006
- Garcia, Ricardo; Martinez, Ramses V.; Martinez, Javier
- Chem. Soc. Rev., Vol. 35, Issue 1
Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations
journal, October 2016
- Ziatdinov, Maxim; Dyck, Ondrej; Maksov, Artem
- ACS Nano, Vol. 11, Issue 12
Ultrafast current imaging by Bayesian inversion
journal, February 2018
- Somnath, S.; Law, K. J. H.; Morozovska, A. N.
- Nature Communications, Vol. 9, Issue 1
Crystallization from amorphous structure to hexagonal quantum dots induced by an electron beam on CdTe thin films
journal, February 2009
- Becerril, M.; Zelaya-Angel, O.; Medina-Torres, A. C.
- Journal of Crystal Growth, Vol. 311, Issue 5
Mastering the game of Go with deep neural networks and tree search
journal, January 2016
- Silver, David; Huang, Aja; Maddison, Chris J.
- Nature, Vol. 529, Issue 7587
A single-atom transistor
journal, February 2012
- Fuechsle, Martin; Miwa, Jill A.; Mahapatra, Suddhasatta
- Nature Nanotechnology, Vol. 7, Issue 4
Sub-10 nanometre fabrication: molecular templating, electron-beam sculpting and crystallization of metallic nanowires
journal, May 2005
- Remeika, M.; Bezryadin, A.
- Nanotechnology, Vol. 16, Issue 8
Deep Reinforcement Learning for Multiagent Systems: A Review of Challenges, Solutions, and Applications
journal, September 2020
- Nguyen, Thanh Thi; Nguyen, Ngoc Duy; Nahavandi, Saeid
- IEEE Transactions on Cybernetics, Vol. 50, Issue 9
Sketched oxide single-electron transistor
journal, April 2011
- Cheng, Guanglei; Siles, Pablo F.; Bi, Feng
- Nature Nanotechnology, Vol. 6, Issue 6
Implementing an accurate and rapid sparse sampling approach for low-dose atomic resolution STEM imaging
journal, October 2016
- Kovarik, L.; Stevens, A.; Liyu, A.
- Applied Physics Letters, Vol. 109, Issue 16
Electron beam induced regrowth of ion implantation damage in Si and Ge
journal, January 1999
- Jenčič, I.; Robertson, I. M.; Skvarč, J.
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 148, Issue 1-4
Fire up the atom forge
journal, November 2016
- Kalinin, Sergei V.; Borisevich, Albina; Jesse, Stephen
- Nature, Vol. 539, Issue 7630
Electron microscopy image enhanced
journal, April 1998
- Haider, Maximilian; Uhlemann, Stephan; Schwan, Eugen
- Nature, Vol. 392, Issue 6678
A bridge for accelerating materials by design
journal, November 2015
- Sumpter, Bobby G.; Vasudevan, Rama K.; Potok, Thomas
- npj Computational Materials, Vol. 1, Issue 1
Electron-beam-induced ferroelectric domain behavior in the transmission electron microscope: Toward deterministic domain patterning
journal, November 2016
- Hart, James L.; Liu, Shi; Lang, Andrew C.
- Physical Review B, Vol. 94, Issue 17
Nanoelectromechanics of piezoresponse force microscopy
journal, November 2004
- Kalinin, Sergei V.; Karapetian, Edgar; Kachanov, Mark
- Physical Review B, Vol. 70, Issue 18
Patterning: Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision (Small 44/2015)
journal, November 2015
- Jesse, Stephen; He, Qian; Lupini, Andrew R.
- Small, Vol. 11, Issue 44
Improved accuracy and speed in scanning probe microscopy by image reconstruction from non-gridded position sensor data
journal, July 2013
- Ziegler, Dominik; Meyer, Travis R.; Farnham, Rodrigo
- Nanotechnology, Vol. 24, Issue 33
Sparse imaging for fast electron microscopy
conference, February 2013
- Anderson, Hyrum S.; Ilic-Helms, Jovana; Rohrer, Brandon
- IS&T/SPIE Electronic Imaging, SPIE Proceedings
A general reinforcement learning algorithm that masters chess, shogi, and Go through self-play
journal, December 2018
- Silver, David; Hubert, Thomas; Schrittwieser, Julian
- Science, Vol. 362, Issue 6419
Nanoscale domain patterning of lead zirconate titanate materials using electron beams
journal, February 2004
- Ferris, J. H.; Li, D. B.; Kalinin, S. V.
- Applied Physics Letters, Vol. 84, Issue 5
High-speed cycloid-scan atomic force microscopy
journal, August 2010
- Yong, Y. K.; Moheimani, S. O. R.; Petersen, I. R.
- Nanotechnology, Vol. 21, Issue 36
Subangstrom Resolution by Underfocused Incoherent Transmission Electron Microscopy
journal, November 1998
- Nellist, P. D.; Pennycook, S. J.
- Physical Review Letters, Vol. 81, Issue 19
A new-designed non-raster scan and precision control for increasing AFM imaging speed
conference, July 2020
- Chen, Huang-Chih; Fu, Li-Chen
- 2020 American Control Conference (ACC)
Electromechanical detection in scanning probe microscopy: Tip models and materials contrast
journal, July 2007
- Eliseev, Eugene A.; Kalinin, Sergei V.; Jesse, Stephen
- Journal of Applied Physics, Vol. 102, Issue 1
Applying compressive sensing to TEM video: a substantial frame rate increase on any camera
journal, August 2015
- Stevens, Andrew; Kovarik, Libor; Abellan, Patricia
- Advanced Structural and Chemical Imaging, Vol. 1, Issue 10
Differential phase-contrast microscopy at atomic resolution
journal, June 2012
- Shibata, Naoya; Findlay, Scott D.; Kohno, Yuji
- Nature Physics, Vol. 8, Issue 8
Imaging and Control of Domain Structures in Ferroelectric thin Films via Scanning Force Microscopy
journal, August 1998
- Gruverman, Alexei; Auciello, Orlando; Tokumoto, Hiroshi
- Annual Review of Materials Science, Vol. 28, Issue 1
Experimental tests on double-resolution coherent imaging via STEM
journal, March 1993
- Rodenburg, J. M.; McCallum, B. C.; Nellist, P. D.
- Ultramicroscopy, Vol. 48, Issue 3
Fast Scanning Probe Microscopy via Machine Learning: Non‐Rectangular Scans with Compressed Sensing and Gaussian Process Optimization
journal, August 2020
- Kelley, Kyle P.; Ziatdinov, Maxim; Collins, Liam
- Small, Vol. 16, Issue 37
Electron-beam induced recrystallization in amorphous apatite
journal, January 2007
- Bae, In-Tae; Zhang, Yanwen; Weber, William J.
- Applied Physics Letters, Vol. 90, Issue 2
Directing Matter: Toward Atomic-Scale 3D Nanofabrication
journal, May 2016
- Jesse, Stephen; Borisevich, Albina Y.; Fowlkes, Jason D.
- ACS Nano, Vol. 10, Issue 6
An adaptive non-raster scanning method in atomic force microscopy for simple sample shapes
journal, February 2015
- Zhang, Kaiqiang; Hatano, Toshiaki; Tien, Thang
- Measurement Science and Technology, Vol. 26, Issue 3
Deep-neural-network solution of the electronic Schrödinger equation
journal, September 2020
- Hermann, Jan; Schätzle, Zeno; Noé, Frank
- Nature Chemistry, Vol. 12, Issue 10
Production and application of electron vortex beams
journal, September 2010
- Verbeeck, J.; Tian, H.; Schattschneider, P.
- Nature, Vol. 467, Issue 7313
Guided search for desired functional responses via Bayesian optimization of generative model: Hysteresis loop shape engineering in ferroelectrics
journal, July 2020
- Kalinin, Sergei V.; Ziatdinov, Maxim; Vasudevan, Rama K.
- Journal of Applied Physics, Vol. 128, Issue 2
Rosette-scan video-rate atomic force microscopy: Trajectory patterning and control design
journal, July 2019
- Nikooienejad, Nastaran; Maroufi, Mohammad; Moheimani, S. O. Reza
- Review of Scientific Instruments, Vol. 90, Issue 7
Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control
journal, September 1997
- Gruverman, A.; Auciello, O.; Ramesh, R.
- Nanotechnology, Vol. 8, Issue 3A
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy
journal, February 2016
- Béché, A.; Goris, B.; Freitag, B.
- Applied Physics Letters, Vol. 108, Issue 9
Placing single atoms in graphene with a scanning transmission electron microscope
journal, September 2017
- Dyck, Ondrej; Kim, Songkil; Kalinin, Sergei V.
- Applied Physics Letters, Vol. 111, Issue 11
Direct atomic fabrication and dopant positioning in Si using electron beams with active real-time image-based feedback
journal, April 2018
- Jesse, Stephen; Hudak, Bethany M.; Zarkadoula, Eva
- Nanotechnology, Vol. 29, Issue 25
Spatially resolved probing of Preisach density in polycrystalline ferroelectric thin films
journal, October 2010
- Guo, S.; Ovchinnikov, O. S.; Curtis, M. E.
- Journal of Applied Physics, Vol. 108, Issue 8
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale
journal, September 2007
- Jesse, Stephen; Kalinin, Sergei V.; Proksch, Roger
- Nanotechnology, Vol. 18, Issue 43
Building ferroelectric from the bottom up: The machine learning analysis of the atomic-scale ferroelectric distortions
journal, July 2019
- Ziatdinov, M.; Nelson, C.; Vasudevan, R. K.
- Applied Physics Letters, Vol. 115, Issue 5
Chemical Robotics Enabled Exploration of Stability in Multicomponent Lead Halide Perovskites via Machine Learning
journal, October 2020
- Higgins, Kate; Valleti, Sai Mani; Ziatdinov, Maxim
- ACS Energy Letters, Vol. 5, Issue 11
Current status and future directions for in situ transmission electron microscopy
journal, November 2016
- Taheri, Mitra L.; Stach, Eric A.; Arslan, Ilke
- Ultramicroscopy, Vol. 170
Beyond Ternary OPV: High‐Throughput Experimentation and Self‐Driving Laboratories Optimize Multicomponent Systems
journal, April 2020
- Langner, Stefan; Häse, Florian; Perea, José Darío
- Advanced Materials, Vol. 32, Issue 14
K-space Navigation for Accurate High-angle Tilting and Control of the TEAM Sample Stage
journal, July 2009
- Duden, T.; Radmilovic, V.; Schmid, A.
- Microscopy and Microanalysis, Vol. 15, Issue S2
Hyperspectral and Multispectral Image Fusion Based on a Sparse Representation
journal, July 2015
- Wei, Qi; Bioucas-Dias, Jose; Dobigeon, Nicolas
- IEEE Transactions on Geoscience and Remote Sensing, Vol. 53, Issue 7
Fast spiral-scan atomic force microscopy
journal, August 2009
- Mahmood, I. A.; Reza Moheimani, S. O.
- Nanotechnology, Vol. 20, Issue 36
Human-level control through deep reinforcement learning
journal, February 2015
- Mnih, Volodymyr; Kavukcuoglu, Koray; Silver, David
- Nature, Vol. 518, Issue 7540
Autonomous Scanning Probe Microscopy in Situ Tip Conditioning through Machine Learning
journal, May 2018
- Rashidi, Mohammad; Wolkow, Robert A.
- ACS Nano, Vol. 12, Issue 6
Spiral Scanning Method for Atomic Force Microscopy
journal, July 2010
- Hung, Shao-Kang
- Journal of Nanoscience and Nanotechnology, Vol. 10, Issue 7
Atomic-resolution spectroscopic imaging: past, present and future
journal, January 2009
- Pennycook, S. J.; Varela, M.; Lupini, A. R.
- Journal of Electron Microscopy, Vol. 58, Issue 3
Irradiation behavior of SrTiO[sub 3] at temperatures close to the critical temperature for amorphization
journal, January 2006
- Zhang, Y.; Wang, C. M.; Engelhard, M. H.
- Journal of Applied Physics, Vol. 100, Issue 11
Design Principles and Top Non-Fullerene Acceptor Candidates for Organic Photovoltaics
journal, December 2017
- Lopez, Steven A.; Sanchez-Lengeling, Benjamin; de Goes Soares, Julio
- Joule, Vol. 1, Issue 4
A Universal Scripting Engine for Transmission Electron Microscopy
journal, July 2020
- LeBeau, James; Kumar, Abinash; Hauwiller, Matthew
- Microscopy and Microanalysis, Vol. 26, Issue S2
Polarization Dynamics in Ferroelectric Capacitors: Local Perspective on Emergent Collective Behavior and Memory Effects
journal, April 2013
- K. Vasudevan, Rama; Marincel, Daniel; Jesse, Stephen
- Advanced Functional Materials, Vol. 23, Issue 20
Learning surface molecular structures via machine vision
journal, August 2017
- Ziatdinov, Maxim; Maksov, Artem; Kalinin, Sergei V.
- npj Computational Materials, Vol. 3, Issue 1
Resolution beyond the 'information limit' in transmission electron microscopy
journal, April 1995
- Nellist, P. D.; McCallum, B. C.; Rodenburg, J. M.
- Nature, Vol. 374, Issue 6523
Ion-induced crystallization and amorphization at crystal/amorphous interfaces of silicon
journal, June 1995
- Wang, Zhong-Lie; Itoh, Noriaki; Matsunami, Noriaki
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 100, Issue 4
Deep data mining in a real space: separation of intertwined electronic responses in a lightly doped BaFe 2 As 2
journal, October 2016
- Ziatdinov, Maxim; Maksov, Artem; Li, Li
- Nanotechnology, Vol. 27, Issue 47
Dynamic Manipulation in Piezoresponse Force Microscopy: Creating Nonequilibrium Phases with Large Electromechanical Response
journal, August 2020
- Kelley, Kyle P.; Ren, Yao; Morozovska, Anna N.
- ACS Nano, Vol. 14, Issue 8
Beyond the conventional information limit: the relevant coherence function
journal, May 1994
- Nellist, P. D.; Rodenburg, J. M.
- Ultramicroscopy, Vol. 54, Issue 1
Automated detection of particles, clusters and islands in scanning probe microscopy images
journal, November 2001
- Jak, M. J. J.; Konstapel, C.; van Kreuningen, A.
- Surface Science, Vol. 494, Issue 2
Deep Data Analysis of Conductive Phenomena on Complex Oxide Interfaces: Physics from Data Mining
journal, May 2014
- Strelcov, Evgheni; Belianinov, Alexei; Hsieh, Ying-Hui
- ACS Nano, Vol. 8, Issue 6
Gaussian Processes for Machine Learning
book, January 2005
- Rasmussen, Carl Edward; Williams, Christopher K. I.
- The MIT Press
Electronically Nonadiabatic Structural Transformations Promoted by Electron Beams
journal, June 2019
- Lingerfelt, David B.; Ganesh, Panchapakesan; Jakowski, Jacek
- Advanced Functional Materials, Vol. 29, Issue 52
Review of Deep Reinforcement Learning for Robot Manipulation
conference, February 2019
- Nguyen, Hai; La, Hung
- 2019 Third IEEE International Conference on Robotic Computing (IRC)
Force measurements with the atomic force microscope: Technique, interpretation and applications
journal, October 2005
- Butt, Hans-Jürgen; Cappella, Brunero; Kappl, Michael
- Surface Science Reports, Vol. 59, Issue 1-6
Nanoelectromechanics of piezoelectric indentation and applications to scanning probe microscopies of ferroelectric materials
journal, April 2005
- Karapetian *, E.; Kachanov, M.; Kalinin, S. V.
- Philosophical Magazine, Vol. 85, Issue 10
Spin glasses: Experimental facts, theoretical concepts, and open questions
journal, October 1986
- Binder, K.; Young, A. P.
- Reviews of Modern Physics, Vol. 58, Issue 4
Scanning tunneling spectroscopy
journal, January 1994
- Feenstra, Randall M.
- Surface Science, Vol. 299-300
Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future
journal, August 2009
- Balke, Nina; Bdikin, Igor; Kalinin, Sergei V.
- Journal of the American Ceramic Society, Vol. 92, Issue 8
Measurement method of aberration from Ronchigram by autocorrelation function
journal, October 2008
- Sawada, H.; Sannomiya, T.; Hosokawa, F.
- Ultramicroscopy, Vol. 108, Issue 11
A Bayesian Approach to Predict Solubility Parameters
journal, September 2018
- Sanchez-Lengeling, Benjamin; Roch, Loïc M.; Perea, José Darío
- Advanced Theory and Simulations, Vol. 2, Issue 1
An electron microscope for the aberration-corrected era
journal, February 2008
- Krivanek, O. L.; Corbin, G. J.; Dellby, N.
- Ultramicroscopy, Vol. 108, Issue 3
Local oxidation of silicon surfaces by dynamic force microscopy: Nanofabrication and water bridge formation
journal, May 1998
- Garcı́a, Ricardo; Calleja, Montserrat; Pérez-Murano, Francesc
- Applied Physics Letters, Vol. 72, Issue 18
Discovery of Wall-Selective Carbon Nanotube Growth Conditions via Automated Experimentation
journal, October 2014
- Nikolaev, Pavel; Hooper, Daylond; Perea-López, Nestor
- ACS Nano, Vol. 8, Issue 10
Machine learning for molecular and materials science
journal, July 2018
- Butler, Keith T.; Davies, Daniel W.; Cartwright, Hugh
- Nature, Vol. 559, Issue 7715
Artificial neural network correction for density-functional tight-binding molecular dynamics simulations
journal, June 2019
- Zhu, Junmian; Vuong, Van Quan; Sumpter, Bobby G.
- MRS Communications, Vol. 9, Issue 3
Software tools for automated transmission electron microscopy
journal, May 2019
- Schorb, Martin; Haberbosch, Isabella; Hagen, Wim J. H.
- Nature Methods, Vol. 16, Issue 6
Spatial and spectral dynamics in STEM hyperspectral imaging using random scan patterns
journal, May 2020
- Zobelli, Alberto; Woo, Steffi Y.; Tararan, Anna
- Ultramicroscopy, Vol. 212
Damage-free vibrational spectroscopy of biological materials in the electron microscope
journal, March 2016
- Rez, Peter; Aoki, Toshihiro; March, Katia
- Nature Communications, Vol. 7, Issue 1
Ensemble learning-iterative training machine learning for uncertainty quantification and automated experiment in atom-resolved microscopy
journal, July 2021
- Ghosh, Ayana; Sumpter, Bobby G.; Dyck, Ondrej
- npj Computational Materials, Vol. 7, Issue 1
Dynamic scan control in STEM: spiral scans
journal, June 2016
- Sang, Xiahan; Lupini, Andrew R.; Unocic, Raymond R.
- Advanced Structural and Chemical Imaging, Vol. 2, Issue 1
Automated probe microscopy via evolutionary optimization at the atomic scale
journal, June 2011
- Woolley, Richard A. J.; Stirling, Julian; Radocea, Adrian
- Applied Physics Letters, Vol. 98, Issue 25
Artificial-intelligence-driven scanning probe microscopy
journal, March 2020
- Krull, A.; Hirsch, P.; Rother, C.
- Communications Physics, Vol. 3, Issue 1
Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
journal, March 2017
- Sang, Xiahan; Lupini, Andrew R.; Ding, Jilai
- Scientific Reports, Vol. 7, Issue 1
Efficient Exploration Through Bayesian Deep Q-Networks
conference, February 2018
- Azizzadenesheli, Kamyar; Brunskill, Emma; Anandkumar, Animashree
- 2018 Information Theory and Applications Workshop (ITA)
Nano-oxidation of silicon surfaces: Comparison of noncontact and contact atomic-force microscopy methods
journal, July 2001
- Tello, Marta; Garcı́a, Ricardo
- Applied Physics Letters, Vol. 79, Issue 3
Multivariate statistical methods for the analysis of microscope image series: applications in materials science
journal, April 1998
- Bonnet, N.
- Journal of Microscopy, Vol. 190, Issue 1‐2
Detection of magnetic circular dichroism using a transmission electron microscope
journal, May 2006
- Schattschneider, P.; Rubino, S.; Hébert, C.
- Nature, Vol. 441, Issue 7092
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy
journal, February 2009
- Jesse, Stephen; Kalinin, Sergei V.
- Nanotechnology, Vol. 20, Issue 8
Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python.
journal, August 2019
- Meyer, Chris; Dellby, Niklas; Hachtel, Jordan A.
- Microscopy and Microanalysis, Vol. 25, Issue S2
Spiral scanning: An alternative to conventional raster scanning in high-speed scanning probe microscopes
conference, June 2010
- Mahmood, I. A.; Moheimani, S. O. R.
- 2010 American Control Conference (ACC 2010), Proceedings of the 2010 American Control Conference
A Kriging-Based Approach to Autonomous Experimentation with Applications to X-Ray Scattering
journal, August 2019
- Noack, Marcus M.; Yager, Kevin G.; Fukuto, Masafumi
- Scientific Reports, Vol. 9, Issue 1
Autonomous robotic nanofabrication with reinforcement learning
journal, September 2020
- Leinen, Philipp; Esders, Malte; Schütt, Kristof T.
- Science Advances, Vol. 6, Issue 36
A Novel Non-Raster Scan Method for AFM Imaging
conference, November 2018
- Nikooienejad, Nastaran; Maroufi, Mohammad; Moheimani, S. O. Reza
- ASME 2018 Dynamic Systems and Control Conference, Volume 3: Modeling and Validation; Multi-Agent and Networked Systems; Path Planning and Motion Control; Tracking Control Systems; Unmanned Aerial Vehicles (UAVs) and Application; Unmanned Ground and Aerial Vehicles; Vibration in Mechanical Systems; Vibrations and Control of Systems; Vibrations: Modeling, Analysis, and Control
Atomically Precise Placement of Single Dopants in Si
journal, September 2003
- Schofield, S. R.; Curson, N. J.; Simmons, M. Y.
- Physical Review Letters, Vol. 91, Issue 13
Big, Deep, and Smart Data in Scanning Probe Microscopy
journal, September 2016
- Kalinin, Sergei V.; Strelcov, Evgheni; Belianinov, Alex
- ACS Nano, Vol. 10, Issue 10
py4DSTEM: Open Source Software for 4D-STEM Data Analysis
journal, August 2019
- Savitzky, Benjamin H.; Hughes, Lauren; Bustillo, Karen C.
- Microscopy and Microanalysis, Vol. 25, Issue S2
Imaging the effects of individual zinc impurity atoms on superconductivity in Bi2Sr2CaCu2O8+δ
journal, February 2000
- Pan, S. H.; Hudson, E. W.; Lang, K. M.
- Nature, Vol. 403, Issue 6771
Automated Tip Conditioning for Scanning Tunneling Spectroscopy
journal, February 2021
- Wang, Shenkai; Zhu, Junmian; Blackwell, Raymond
- The Journal of Physical Chemistry A, Vol. 125, Issue 6
Progress in aberration-corrected scanning transmission electron microscopy
journal, May 2001
- Dellby, N.; Krivanek, O. L.; Nellist, P. D.
- Microscopy, Vol. 50, Issue 3
Machine Learning for Electronically Excited States of Molecules
journal, November 2020
- Westermayr, Julia; Marquetand, Philipp
- Chemical Reviews
Big–deep–smart data in imaging for guiding materials design
journal, September 2015
- Kalinin, Sergei V.; Sumpter, Bobby G.; Archibald, Richard K.
- Nature Materials, Vol. 14, Issue 10
Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm
journal, June 2014
- Huang, Peng; Andersson, Sean B.
- Review of Scientific Instruments, Vol. 85, Issue 6
Manipulating low-dimensional materials down to the level of single atoms with electron irradiation
journal, September 2017
- Susi, Toma; Meyer, Jannik C.; Kotakoski, Jani
- Ultramicroscopy, Vol. 180
Correlative Multimodal Probing of Ionically-Mediated Electromechanical Phenomena in Simple Oxides
journal, October 2013
- Kim, Yunseok; Strelcov, Evgheni; Hwang, In Rok
- Scientific Reports, Vol. 3, Issue 1
Adaptive probe trajectory scanning probe microscopy for multiresolution measurements of interface geometry
journal, June 2009
- Ovchinnikov, Oleg S.; Jesse, S.; Kalinin, S. V.
- Nanotechnology, Vol. 20, Issue 25
Electron Energy Loss Spectroscopy imaging of surface plasmons at the nanometer scale
journal, March 2016
- Colliex, Christian; Kociak, Mathieu; Stéphan, Odile
- Ultramicroscopy, Vol. 162
A self-driving microscope and the Atomic Forge
journal, September 2019
- Dyck, Ondrej; Jesse, Stephen; Kalinin, Sergei V.
- MRS Bulletin, Vol. 44, Issue 09
Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale
journal, July 2013
- Strelcov, Evgheni; Kim, Yunseok; Jesse, Stephen
- Nano Letters, Vol. 13, Issue 8
Nanopatterning of carbonaceous structures by field-induced carbon dioxide splitting with a force microscope
journal, April 2010
- Garcia, R.; Losilla, N. S.; Martínez, J.
- Applied Physics Letters, Vol. 96, Issue 14
Positioning single atoms with a scanning tunnelling microscope
journal, April 1990
- Eigler, D. M.; Schweizer, E. K.
- Nature, Vol. 344, Issue 6266
Video-Rate Lissajous-Scan Atomic Force Microscopy
journal, January 2014
- Yong, Yuen Kuan; Bazaei, Ali; Moheimani, S. O. Reza
- IEEE Transactions on Nanotechnology, Vol. 13, Issue 1
Materials in nanotechnology: New structures, new properties, new complexity
journal, September 2003
- Bonnell, Dawn A.
- Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 21, Issue 5
Advanced scanning probe lithography
journal, August 2014
- Garcia, Ricardo; Knoll, Armin W.; Riedo, Elisa
- Nature Nanotechnology, Vol. 9, Issue 8
Curiosity-Driven Exploration by Self-Supervised Prediction
conference, July 2017
- Pathak, Deepak; Agrawal, Pulkit; Efros, Alexei A.
- 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
Bayesian Fusion of Multi-Band Images
journal, September 2015
- Wei, Qi; Dobigeon, Nicolas; Tourneret, Jean-Yves
- IEEE Journal of Selected Topics in Signal Processing, Vol. 9, Issue 6
Exploring order parameters and dynamic processes in disordered systems via variational autoencoders
journal, April 2021
- Kalinin, Sergei V.; Dyck, Ondrej; Jesse, Stephen
- Science Advances, Vol. 7, Issue 17
Fast scanning in AFM using non-raster sampling and time-optimal trajectories
conference, December 2012
- Huang, Peng; Andersson, Sean B.
- 2012 IEEE 51st Annual Conference on Decision and Control (CDC), 2012 IEEE 51st IEEE Conference on Decision and Control (CDC)
Functional recognition imaging using artificial neural networks: applications to rapid cellular identification via broadband electromechanical response
journal, September 2009
- Nikiforov, M. P.; Reukov, V. V.; Thompson, G. L.
- Nanotechnology, Vol. 20, Issue 40
Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy
journal, June 2015
- Shibata, Naoya; Findlay, Scott D.; Sasaki, Hirokazu
- Scientific Reports, Vol. 5, Issue 1
Deep Rotation Equivariant Network
journal, May 2018
- Li, Junying; Yang, Zichen; Liu, Haifeng
- Neurocomputing, Vol. 290
Predictability as a probe of manifest and latent physics: The case of atomic scale structural, chemical, and polarization behaviors in multiferroic Sm-doped BiFeO 3
journal, March 2021
- Ziatdinov, Maxim; Creange, Nicole; Zhang, Xiaohang
- Applied Physics Reviews, Vol. 8, Issue 1
Vibrational spectroscopy in the electron microscope
journal, October 2014
- Krivanek, Ondrej L.; Lovejoy, Tracy C.; Dellby, Niklas
- Nature, Vol. 514, Issue 7521
A Deep Learning Approach to Identify Local Structures in Atomic-Resolution Transmission Electron Microscopy Images
journal, July 2018
- Madsen, Jacob; Liu, Pei; Kling, Jens
- Advanced Theory and Simulations, Vol. 1, Issue 8
A continuous sampling pattern design algorithm for atomic force microscopy images
journal, January 2019
- Luo, Yufan; Andersson, Sean B.
- Ultramicroscopy, Vol. 196
A spherical-aberration-corrected 200kV transmission electron microscope
journal, October 1998
- Haider, Max; Rose, Harald; Uhlemann, Stephan
- Ultramicroscopy, Vol. 75, Issue 1
Deep learning analysis of defect and phase evolution during electron beam-induced transformations in WS2
journal, February 2019
- Maksov, Artem; Dyck, Ondrej; Wang, Kai
- npj Computational Materials, Vol. 5, Issue 1
Materials contrast in piezoresponse force microscopy
journal, June 2006
- Kalinin, Sergei V.; Eliseev, Eugene A.; Morozovska, Anna N.
- Applied Physics Letters, Vol. 88, Issue 23
Monochromated STEM with a 30 meV-wide, atom-sized electron probe
journal, January 2013
- Krivanek, Ondrej L.; Lovejoy, Tracy C.; Dellby, Niklas
- Microscopy, Vol. 62, Issue 1
Feature tracking for high speed AFM: Experimental demonstration
conference, May 2017
- Hartman, Brett; Andersson, Sean B.
- 2017 American Control Conference (ACC)
Building and exploring libraries of atomic defects in graphene: Scanning transmission electron and scanning tunneling microscopy study
journal, September 2019
- Ziatdinov, Maxim; Dyck, Ondrej; Li, Xin
- Science Advances, Vol. 5, Issue 9
Data mining graphene: correlative analysis of structure and electronic degrees of freedom in graphenic monolayers with defects
journal, November 2016
- Ziatdinov, Maxim; Fujii, Shintaro; Kiguchi, Manabu
- Nanotechnology, Vol. 27, Issue 49
REPRINT OF: Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns
journal, June 2011
- Barthel, J.; Thust, A.
- Ultramicroscopy, Vol. 111, Issue 7
Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images
journal, October 2006
- Bosman, M.; Watanabe, M.; Alexander, D. T. L.
- Ultramicroscopy, Vol. 106, Issue 11-12, p. 1024-1032
High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories
journal, April 2012
- Tuma, Tomas; Lygeros, John; Kartik, V.
- Nanotechnology, Vol. 23, Issue 18
Advances in Kriging-Based Autonomous X-Ray Scattering Experiments
journal, January 2020
- Noack, Marcus M.; Doerk, Gregory S.; Li, Ruipeng
- Scientific Reports, Vol. 10, Issue 1
“Water-cycle” mechanism for writing and erasing nanostructures at the LaAlO3/SrTiO3 interface
journal, October 2010
- Bi, Feng; Bogorin, Daniela F.; Cen, Cheng
- Applied Physics Letters, Vol. 97, Issue 17
Rapid multidimensional data acquisition in scanning probe microscopy applied to local polarization dynamics and voltage dependent contact mechanics
journal, September 2008
- Jesse, Stephen; Maksymovych, Peter; Kalinin, Sergei V.
- Applied Physics Letters, Vol. 93, Issue 11
Resolution-function theory in piezoresponse force microscopy: Wall imaging, spectroscopy, and lateral resolution
journal, May 2007
- Morozovska, Anna N.; Eliseev, Eugene A.; Bravina, Svetlana L.
- Physical Review B, Vol. 75, Issue 17
Band Excitation in Scanning Probe Microscopy: Recognition and Functional Imaging
journal, April 2014
- Jesse, S.; Vasudevan, R. K.; Collins, L.
- Annual Review of Physical Chemistry, Vol. 65, Issue 1
Subsampled STEM-ptychography
journal, July 2018
- Stevens, Andrew; Yang, Hao; Hao, Weituo
- Applied Physics Letters, Vol. 113, Issue 3
Detecting magnetic ordering with atomic size electron probes
journal, May 2016
- Idrobo, Juan Carlos; Rusz, Ján; Spiegelberg, Jakob
- Advanced Structural and Chemical Imaging, Vol. 2, Issue 1
Spectroscopic imaging in piezoresponse force microscopy: New opportunities for studying polarization dynamics in ferroelectrics and multiferroics
journal, July 2012
- Vasudevan, R. K.; Jesse, S.; Kim, Y.
- MRS Communications, Vol. 2, Issue 3
Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) With Nonrectangular Scans
journal, December 2018
- Li, Xin; Dyck, Ondrej; Kalinin, Sergei V.
- Microscopy and Microanalysis, Vol. 24, Issue 6
Regrowth of amorphous regions in semiconductors by sub-threshold electron beams
journal, December 1996
- Robertson, I. M.; Jenčič, I.
- Journal of Nuclear Materials, Vol. 239
Towards the low-dose characterization of beam sensitive nanostructures via implementation of sparse image acquisition in scanning transmission electron microscopy
journal, February 2017
- Hwang, Sunghwan; Han, Chang Wan; Venkatakrishnan, Singanallur V.
- Measurement Science and Technology, Vol. 28, Issue 4
The NOMAD laboratory: from data sharing to artificial intelligence
journal, May 2019
- Draxl, Claudia; Scheffler, Matthias
- Journal of Physics: Materials, Vol. 2, Issue 3
Achieving Atomic Resolution Magnetic Dichroism by Controlling the Phase Symmetry of an Electron Probe
journal, September 2014
- Rusz, Ján; Idrobo, Juan-Carlos; Bhowmick, Somnath
- Physical Review Letters, Vol. 113, Issue 14