DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy

Abstract

Machine learning and artificial intelligence (ML/AI) are rapidly becoming an indispensable part of physics research, with domain applications ranging from theory and materials prediction to high-throughput data analysis. In parallel, the recent successes in applying ML/AI methods for autonomous systems from robotics to self-driving cars to organic and inorganic synthesis are generating enthusiasm for the potential of these techniques to enable automated and autonomous experiments (AE) in imaging. Here, we aim to analyze the major pathways toward AE in imaging methods with sequential image formation mechanisms, focusing on scanning probe microscopy (SPM) and (scanning) transmission electron microscopy ((S)TEM). We argue that automated experiments should necessarily be discussed in a broader context of the general domain knowledge that both informs the experiment and is increased as the result of the experiment. As such, this analysis should explore the human and ML/AI roles prior to and during the experiment and consider the latencies, biases, and prior knowledge of the decision-making process. Similarly, such discussion should include the limitations of the existing imaging systems, including intrinsic latencies, non-idealities, and drifts comprising both correctable and stochastic components. We further pose that the role of the AE in microscopy is not the exclusion of humanmore » operators (as is the case for autonomous driving), but rather automation of routine operations such as microscope tuning, etc., prior to the experiment, and conversion of low latency decision making processes on the time scale spanning from image acquisition to human-level high-order experiment planning. Finally, we argue that ML/AI can dramatically alter the (S)TEM and SPM fields; however, this process is likely to be highly nontrivial and initiated by combined human-ML workflows and will bring challenges both from the microscope and ML/AI sides. At the same time, these methods will enable opportunities and paradigms for scientific discovery and nanostructure fabrication.« less

Authors:
ORCiD logo; ORCiD logo; ; ; ; ORCiD logo; ; ORCiD logo; ORCiD logo
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1857888
Alternate Identifier(s):
OSTI ID: 1813222
Grant/Contract Number:  
34532; AC05-00OR22725
Resource Type:
Published Article
Journal Name:
ACS Nano
Additional Journal Information:
Journal Name: ACS Nano Journal Volume: 15 Journal Issue: 8; Journal ID: ISSN 1936-0851
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; machine learning; artificial intelligence; automated experiments; scanning probe microscopy; reinforcement learning; Gaussian process regression; Bayesian optimization; scanning transmission electron microscopy; autonomous; imaging; algorithms; neural networks; mathematical methods

Citation Formats

Kalinin, Sergei V., Ziatdinov, Maxim, Hinkle, Jacob, Jesse, Stephen, Ghosh, Ayana, Kelley, Kyle P., Lupini, Andrew R., Sumpter, Bobby G., and Vasudevan, Rama K. Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy. United States: N. p., 2021. Web. doi:10.1021/acsnano.1c02104.
Kalinin, Sergei V., Ziatdinov, Maxim, Hinkle, Jacob, Jesse, Stephen, Ghosh, Ayana, Kelley, Kyle P., Lupini, Andrew R., Sumpter, Bobby G., & Vasudevan, Rama K. Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy. United States. https://doi.org/10.1021/acsnano.1c02104
Kalinin, Sergei V., Ziatdinov, Maxim, Hinkle, Jacob, Jesse, Stephen, Ghosh, Ayana, Kelley, Kyle P., Lupini, Andrew R., Sumpter, Bobby G., and Vasudevan, Rama K. Fri . "Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy". United States. https://doi.org/10.1021/acsnano.1c02104.
@article{osti_1857888,
title = {Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy},
author = {Kalinin, Sergei V. and Ziatdinov, Maxim and Hinkle, Jacob and Jesse, Stephen and Ghosh, Ayana and Kelley, Kyle P. and Lupini, Andrew R. and Sumpter, Bobby G. and Vasudevan, Rama K.},
abstractNote = {Machine learning and artificial intelligence (ML/AI) are rapidly becoming an indispensable part of physics research, with domain applications ranging from theory and materials prediction to high-throughput data analysis. In parallel, the recent successes in applying ML/AI methods for autonomous systems from robotics to self-driving cars to organic and inorganic synthesis are generating enthusiasm for the potential of these techniques to enable automated and autonomous experiments (AE) in imaging. Here, we aim to analyze the major pathways toward AE in imaging methods with sequential image formation mechanisms, focusing on scanning probe microscopy (SPM) and (scanning) transmission electron microscopy ((S)TEM). We argue that automated experiments should necessarily be discussed in a broader context of the general domain knowledge that both informs the experiment and is increased as the result of the experiment. As such, this analysis should explore the human and ML/AI roles prior to and during the experiment and consider the latencies, biases, and prior knowledge of the decision-making process. Similarly, such discussion should include the limitations of the existing imaging systems, including intrinsic latencies, non-idealities, and drifts comprising both correctable and stochastic components. We further pose that the role of the AE in microscopy is not the exclusion of human operators (as is the case for autonomous driving), but rather automation of routine operations such as microscope tuning, etc., prior to the experiment, and conversion of low latency decision making processes on the time scale spanning from image acquisition to human-level high-order experiment planning. Finally, we argue that ML/AI can dramatically alter the (S)TEM and SPM fields; however, this process is likely to be highly nontrivial and initiated by combined human-ML workflows and will bring challenges both from the microscope and ML/AI sides. At the same time, these methods will enable opportunities and paradigms for scientific discovery and nanostructure fabrication.},
doi = {10.1021/acsnano.1c02104},
journal = {ACS Nano},
number = 8,
volume = 15,
place = {United States},
year = {Fri Jul 16 00:00:00 EDT 2021},
month = {Fri Jul 16 00:00:00 EDT 2021}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1021/acsnano.1c02104

Save / Share:

Works referenced in this record:

Dynamic piezoresponse force microscopy: Spatially resolved probing of polarization dynamics in time and voltage domains
journal, September 2012

  • Kumar, A.; Ehara, Y.; Wada, A.
  • Journal of Applied Physics, Vol. 112, Issue 5
  • DOI: 10.1063/1.4746080

Dynamic atomic force microscopy methods
journal, September 2002


Non-raster sampling in atomic force microscopy: A compressed sensing approach
conference, June 2012

  • Andersson, S. B.; Pao, L. Y.
  • 2012 American Control Conference - ACC 2012, 2012 American Control Conference (ACC)
  • DOI: 10.1109/ACC.2012.6315406

The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images
journal, October 2013


Building Structures Atom by Atom via Electron Beam Manipulation
journal, August 2018


Extracting information from sequences of spatially resolved EELS spectra using multivariate statistical analysis
journal, July 1999


Materials Data Infrastructure: A Case Study of the Citrination Platform to Examine Data Import, Storage, and Access
journal, June 2016


Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope
journal, January 2019


Current imaging tunneling spectroscopy of metallic deposits on silicon
journal, July 1992


Toward Decoding the Relationship between Domain Structure and Functionality in Ferroelectrics via Hidden Latent Variables
journal, January 2021

  • Kalinin, Sergei V.; Kelley, Kyle; Vasudevan, Rama K.
  • ACS Applied Materials & Interfaces, Vol. 13, Issue 1
  • DOI: 10.1021/acsami.0c15085

USID and Pycroscopy – Open Source Frameworks for Storing and Analyzing Imaging and Spectroscopy Data
journal, August 2019

  • Somnath, Suhas; Smith, Chris R.; Laanait, Nouamane
  • Microscopy and Microanalysis, Vol. 25, Issue S2
  • DOI: 10.1017/S1431927619001831

Learning dexterous in-hand manipulation
journal, November 2019

  • Andrychowicz, OpenAI: Marcin; Baker, Bowen; Chociej, Maciek
  • The International Journal of Robotics Research, Vol. 39, Issue 1
  • DOI: 10.1177/0278364919887447

Nano-chemistry and scanning probe nanolithographies
journal, January 2006

  • Garcia, Ricardo; Martinez, Ramses V.; Martinez, Javier
  • Chem. Soc. Rev., Vol. 35, Issue 1
  • DOI: 10.1039/B501599P

Ultrafast current imaging by Bayesian inversion
journal, February 2018


Crystallization from amorphous structure to hexagonal quantum dots induced by an electron beam on CdTe thin films
journal, February 2009


Mastering the game of Go with deep neural networks and tree search
journal, January 2016

  • Silver, David; Huang, Aja; Maddison, Chris J.
  • Nature, Vol. 529, Issue 7587
  • DOI: 10.1038/nature16961

A single-atom transistor
journal, February 2012

  • Fuechsle, Martin; Miwa, Jill A.; Mahapatra, Suddhasatta
  • Nature Nanotechnology, Vol. 7, Issue 4
  • DOI: 10.1038/nnano.2012.21

Deep Reinforcement Learning for Multiagent Systems: A Review of Challenges, Solutions, and Applications
journal, September 2020

  • Nguyen, Thanh Thi; Nguyen, Ngoc Duy; Nahavandi, Saeid
  • IEEE Transactions on Cybernetics, Vol. 50, Issue 9
  • DOI: 10.1109/TCYB.2020.2977374

Sketched oxide single-electron transistor
journal, April 2011

  • Cheng, Guanglei; Siles, Pablo F.; Bi, Feng
  • Nature Nanotechnology, Vol. 6, Issue 6
  • DOI: 10.1038/nnano.2011.56

Implementing an accurate and rapid sparse sampling approach for low-dose atomic resolution STEM imaging
journal, October 2016

  • Kovarik, L.; Stevens, A.; Liyu, A.
  • Applied Physics Letters, Vol. 109, Issue 16
  • DOI: 10.1063/1.4965720

Electron beam induced regrowth of ion implantation damage in Si and Ge
journal, January 1999

  • Jenčič, I.; Robertson, I. M.; Skvarč, J.
  • Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 148, Issue 1-4
  • DOI: 10.1016/S0168-583X(98)00781-2

Fire up the atom forge
journal, November 2016

  • Kalinin, Sergei V.; Borisevich, Albina; Jesse, Stephen
  • Nature, Vol. 539, Issue 7630
  • DOI: 10.1038/539485a

Electron microscopy image enhanced
journal, April 1998

  • Haider, Maximilian; Uhlemann, Stephan; Schwan, Eugen
  • Nature, Vol. 392, Issue 6678
  • DOI: 10.1038/33823

A bridge for accelerating materials by design
journal, November 2015


Electron-beam-induced ferroelectric domain behavior in the transmission electron microscope: Toward deterministic domain patterning
journal, November 2016


Nanoelectromechanics of piezoresponse force microscopy
journal, November 2004


Improved accuracy and speed in scanning probe microscopy by image reconstruction from non-gridded position sensor data
journal, July 2013


Sparse imaging for fast electron microscopy
conference, February 2013

  • Anderson, Hyrum S.; Ilic-Helms, Jovana; Rohrer, Brandon
  • IS&T/SPIE Electronic Imaging, SPIE Proceedings
  • DOI: 10.1117/12.2008313

A general reinforcement learning algorithm that masters chess, shogi, and Go through self-play
journal, December 2018


Nanoscale domain patterning of lead zirconate titanate materials using electron beams
journal, February 2004

  • Ferris, J. H.; Li, D. B.; Kalinin, S. V.
  • Applied Physics Letters, Vol. 84, Issue 5
  • DOI: 10.1063/1.1644327

High-speed cycloid-scan atomic force microscopy
journal, August 2010


Subangstrom Resolution by Underfocused Incoherent Transmission Electron Microscopy
journal, November 1998


A new-designed non-raster scan and precision control for increasing AFM imaging speed
conference, July 2020


Electromechanical detection in scanning probe microscopy: Tip models and materials contrast
journal, July 2007

  • Eliseev, Eugene A.; Kalinin, Sergei V.; Jesse, Stephen
  • Journal of Applied Physics, Vol. 102, Issue 1
  • DOI: 10.1063/1.2749463

Applying compressive sensing to TEM video: a substantial frame rate increase on any camera
journal, August 2015

  • Stevens, Andrew; Kovarik, Libor; Abellan, Patricia
  • Advanced Structural and Chemical Imaging, Vol. 1, Issue 10
  • DOI: 10.1186/s40679-015-0009-3

Differential phase-contrast microscopy at atomic resolution
journal, June 2012

  • Shibata, Naoya; Findlay, Scott D.; Kohno, Yuji
  • Nature Physics, Vol. 8, Issue 8
  • DOI: 10.1038/nphys2337

Imaging and Control of Domain Structures in Ferroelectric thin Films via Scanning Force Microscopy
journal, August 1998


Experimental tests on double-resolution coherent imaging via STEM
journal, March 1993


Fast Scanning Probe Microscopy via Machine Learning: Non‐Rectangular Scans with Compressed Sensing and Gaussian Process Optimization
journal, August 2020


Electron-beam induced recrystallization in amorphous apatite
journal, January 2007

  • Bae, In-Tae; Zhang, Yanwen; Weber, William J.
  • Applied Physics Letters, Vol. 90, Issue 2
  • DOI: 10.1063/1.2430779

Directing Matter: Toward Atomic-Scale 3D Nanofabrication
journal, May 2016


An adaptive non-raster scanning method in atomic force microscopy for simple sample shapes
journal, February 2015


Deep-neural-network solution of the electronic Schrödinger equation
journal, September 2020


Production and application of electron vortex beams
journal, September 2010

  • Verbeeck, J.; Tian, H.; Schattschneider, P.
  • Nature, Vol. 467, Issue 7313
  • DOI: 10.1038/nature09366

Guided search for desired functional responses via Bayesian optimization of generative model: Hysteresis loop shape engineering in ferroelectrics
journal, July 2020

  • Kalinin, Sergei V.; Ziatdinov, Maxim; Vasudevan, Rama K.
  • Journal of Applied Physics, Vol. 128, Issue 2
  • DOI: 10.1063/5.0011917

Rosette-scan video-rate atomic force microscopy: Trajectory patterning and control design
journal, July 2019

  • Nikooienejad, Nastaran; Maroufi, Mohammad; Moheimani, S. O. Reza
  • Review of Scientific Instruments, Vol. 90, Issue 7
  • DOI: 10.1063/1.5098499

Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control
journal, September 1997


Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy
journal, February 2016

  • Béché, A.; Goris, B.; Freitag, B.
  • Applied Physics Letters, Vol. 108, Issue 9
  • DOI: 10.1063/1.4943086

Placing single atoms in graphene with a scanning transmission electron microscope
journal, September 2017

  • Dyck, Ondrej; Kim, Songkil; Kalinin, Sergei V.
  • Applied Physics Letters, Vol. 111, Issue 11
  • DOI: 10.1063/1.4998599

Direct atomic fabrication and dopant positioning in Si using electron beams with active real-time image-based feedback
journal, April 2018


Spatially resolved probing of Preisach density in polycrystalline ferroelectric thin films
journal, October 2010

  • Guo, S.; Ovchinnikov, O. S.; Curtis, M. E.
  • Journal of Applied Physics, Vol. 108, Issue 8
  • DOI: 10.1063/1.3493738

The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale
journal, September 2007


Building ferroelectric from the bottom up: The machine learning analysis of the atomic-scale ferroelectric distortions
journal, July 2019

  • Ziatdinov, M.; Nelson, C.; Vasudevan, R. K.
  • Applied Physics Letters, Vol. 115, Issue 5
  • DOI: 10.1063/1.5109520

Chemical Robotics Enabled Exploration of Stability in Multicomponent Lead Halide Perovskites via Machine Learning
journal, October 2020


Current status and future directions for in situ transmission electron microscopy
journal, November 2016


Beyond Ternary OPV: High‐Throughput Experimentation and Self‐Driving Laboratories Optimize Multicomponent Systems
journal, April 2020

  • Langner, Stefan; Häse, Florian; Perea, José Darío
  • Advanced Materials, Vol. 32, Issue 14
  • DOI: 10.1002/adma.201907801

Molecule Cascades
journal, October 2002


K-space Navigation for Accurate High-angle Tilting and Control of the TEAM Sample Stage
journal, July 2009


Hyperspectral and Multispectral Image Fusion Based on a Sparse Representation
journal, July 2015

  • Wei, Qi; Bioucas-Dias, Jose; Dobigeon, Nicolas
  • IEEE Transactions on Geoscience and Remote Sensing, Vol. 53, Issue 7
  • DOI: 10.1109/TGRS.2014.2381272

Fast spiral-scan atomic force microscopy
journal, August 2009


Human-level control through deep reinforcement learning
journal, February 2015

  • Mnih, Volodymyr; Kavukcuoglu, Koray; Silver, David
  • Nature, Vol. 518, Issue 7540
  • DOI: 10.1038/nature14236

Autonomous Scanning Probe Microscopy in Situ Tip Conditioning through Machine Learning
journal, May 2018


Spiral Scanning Method for Atomic Force Microscopy
journal, July 2010


Atomic-resolution spectroscopic imaging: past, present and future
journal, January 2009

  • Pennycook, S. J.; Varela, M.; Lupini, A. R.
  • Journal of Electron Microscopy, Vol. 58, Issue 3
  • DOI: 10.1093/jmicro/dfn030

Irradiation behavior of SrTiO[sub 3] at temperatures close to the critical temperature for amorphization
journal, January 2006

  • Zhang, Y.; Wang, C. M.; Engelhard, M. H.
  • Journal of Applied Physics, Vol. 100, Issue 11
  • DOI: 10.1063/1.2399932

Design Principles and Top Non-Fullerene Acceptor Candidates for Organic Photovoltaics
journal, December 2017


A Universal Scripting Engine for Transmission Electron Microscopy
journal, July 2020

  • LeBeau, James; Kumar, Abinash; Hauwiller, Matthew
  • Microscopy and Microanalysis, Vol. 26, Issue S2
  • DOI: 10.1017/S1431927620023338

Polarization Dynamics in Ferroelectric Capacitors: Local Perspective on Emergent Collective Behavior and Memory Effects
journal, April 2013

  • K. Vasudevan, Rama; Marincel, Daniel; Jesse, Stephen
  • Advanced Functional Materials, Vol. 23, Issue 20
  • DOI: 10.1002/adfm.201203422

Learning surface molecular structures via machine vision
journal, August 2017

  • Ziatdinov, Maxim; Maksov, Artem; Kalinin, Sergei V.
  • npj Computational Materials, Vol. 3, Issue 1
  • DOI: 10.1038/s41524-017-0038-7

Resolution beyond the 'information limit' in transmission electron microscopy
journal, April 1995

  • Nellist, P. D.; McCallum, B. C.; Rodenburg, J. M.
  • Nature, Vol. 374, Issue 6523
  • DOI: 10.1038/374630a0

Ion-induced crystallization and amorphization at crystal/amorphous interfaces of silicon
journal, June 1995

  • Wang, Zhong-Lie; Itoh, Noriaki; Matsunami, Noriaki
  • Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 100, Issue 4
  • DOI: 10.1016/0168-583X(95)00369-X

Deep data mining in a real space: separation of intertwined electronic responses in a lightly doped BaFe 2 As 2
journal, October 2016


Dynamic Manipulation in Piezoresponse Force Microscopy: Creating Nonequilibrium Phases with Large Electromechanical Response
journal, August 2020


Beyond the conventional information limit: the relevant coherence function
journal, May 1994


Automated detection of particles, clusters and islands in scanning probe microscopy images
journal, November 2001


Deep Data Analysis of Conductive Phenomena on Complex Oxide Interfaces: Physics from Data Mining
journal, May 2014

  • Strelcov, Evgheni; Belianinov, Alexei; Hsieh, Ying-Hui
  • ACS Nano, Vol. 8, Issue 6
  • DOI: 10.1021/nn502029b

Gaussian Processes for Machine Learning
book, January 2005


Electronically Nonadiabatic Structural Transformations Promoted by Electron Beams
journal, June 2019

  • Lingerfelt, David B.; Ganesh, Panchapakesan; Jakowski, Jacek
  • Advanced Functional Materials, Vol. 29, Issue 52
  • DOI: 10.1002/adfm.201901901

Review of Deep Reinforcement Learning for Robot Manipulation
conference, February 2019

  • Nguyen, Hai; La, Hung
  • 2019 Third IEEE International Conference on Robotic Computing (IRC)
  • DOI: 10.1109/IRC.2019.00120

Force measurements with the atomic force microscope: Technique, interpretation and applications
journal, October 2005


Nanoelectromechanics of piezoelectric indentation and applications to scanning probe microscopies of ferroelectric materials
journal, April 2005


Spin glasses: Experimental facts, theoretical concepts, and open questions
journal, October 1986


Scanning tunneling spectroscopy
journal, January 1994


Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future
journal, August 2009


Measurement method of aberration from Ronchigram by autocorrelation function
journal, October 2008


A Bayesian Approach to Predict Solubility Parameters
journal, September 2018

  • Sanchez-Lengeling, Benjamin; Roch, Loïc M.; Perea, José Darío
  • Advanced Theory and Simulations, Vol. 2, Issue 1
  • DOI: 10.1002/adts.201800069

An electron microscope for the aberration-corrected era
journal, February 2008


Local oxidation of silicon surfaces by dynamic force microscopy: Nanofabrication and water bridge formation
journal, May 1998

  • Garcı́a, Ricardo; Calleja, Montserrat; Pérez-Murano, Francesc
  • Applied Physics Letters, Vol. 72, Issue 18
  • DOI: 10.1063/1.121340

Discovery of Wall-Selective Carbon Nanotube Growth Conditions via Automated Experimentation
journal, October 2014

  • Nikolaev, Pavel; Hooper, Daylond; Perea-López, Nestor
  • ACS Nano, Vol. 8, Issue 10
  • DOI: 10.1021/nn503347a

Machine learning for molecular and materials science
journal, July 2018


Artificial neural network correction for density-functional tight-binding molecular dynamics simulations
journal, June 2019

  • Zhu, Junmian; Vuong, Van Quan; Sumpter, Bobby G.
  • MRS Communications, Vol. 9, Issue 3
  • DOI: 10.1557/mrc.2019.80

Software tools for automated transmission electron microscopy
journal, May 2019


Spatial and spectral dynamics in STEM hyperspectral imaging using random scan patterns
journal, May 2020


Damage-free vibrational spectroscopy of biological materials in the electron microscope
journal, March 2016

  • Rez, Peter; Aoki, Toshihiro; March, Katia
  • Nature Communications, Vol. 7, Issue 1
  • DOI: 10.1038/ncomms10945

Ensemble learning-iterative training machine learning for uncertainty quantification and automated experiment in atom-resolved microscopy
journal, July 2021


Dynamic scan control in STEM: spiral scans
journal, June 2016

  • Sang, Xiahan; Lupini, Andrew R.; Unocic, Raymond R.
  • Advanced Structural and Chemical Imaging, Vol. 2, Issue 1
  • DOI: 10.1186/s40679-016-0020-3

Automated probe microscopy via evolutionary optimization at the atomic scale
journal, June 2011

  • Woolley, Richard A. J.; Stirling, Julian; Radocea, Adrian
  • Applied Physics Letters, Vol. 98, Issue 25
  • DOI: 10.1063/1.3600662

Artificial-intelligence-driven scanning probe microscopy
journal, March 2020


Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
journal, March 2017

  • Sang, Xiahan; Lupini, Andrew R.; Ding, Jilai
  • Scientific Reports, Vol. 7, Issue 1
  • DOI: 10.1038/srep43585

Efficient Exploration Through Bayesian Deep Q-Networks
conference, February 2018

  • Azizzadenesheli, Kamyar; Brunskill, Emma; Anandkumar, Animashree
  • 2018 Information Theory and Applications Workshop (ITA)
  • DOI: 10.1109/ITA.2018.8503252

Nano-oxidation of silicon surfaces: Comparison of noncontact and contact atomic-force microscopy methods
journal, July 2001

  • Tello, Marta; Garcı́a, Ricardo
  • Applied Physics Letters, Vol. 79, Issue 3
  • DOI: 10.1063/1.1385582

Detection of magnetic circular dichroism using a transmission electron microscope
journal, May 2006

  • Schattschneider, P.; Rubino, S.; Hébert, C.
  • Nature, Vol. 441, Issue 7092
  • DOI: 10.1038/nature04778

Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy
journal, February 2009


Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python.
journal, August 2019

  • Meyer, Chris; Dellby, Niklas; Hachtel, Jordan A.
  • Microscopy and Microanalysis, Vol. 25, Issue S2
  • DOI: 10.1017/S143192761900134X

Spiral scanning: An alternative to conventional raster scanning in high-speed scanning probe microscopes
conference, June 2010

  • Mahmood, I. A.; Moheimani, S. O. R.
  • 2010 American Control Conference (ACC 2010), Proceedings of the 2010 American Control Conference
  • DOI: 10.1109/ACC.2010.5530444

A Kriging-Based Approach to Autonomous Experimentation with Applications to X-Ray Scattering
journal, August 2019


Autonomous robotic nanofabrication with reinforcement learning
journal, September 2020

  • Leinen, Philipp; Esders, Malte; Schütt, Kristof T.
  • Science Advances, Vol. 6, Issue 36
  • DOI: 10.1126/sciadv.abb6987

A Novel Non-Raster Scan Method for AFM Imaging
conference, November 2018

  • Nikooienejad, Nastaran; Maroufi, Mohammad; Moheimani, S. O. Reza
  • ASME 2018 Dynamic Systems and Control Conference, Volume 3: Modeling and Validation; Multi-Agent and Networked Systems; Path Planning and Motion Control; Tracking Control Systems; Unmanned Aerial Vehicles (UAVs) and Application; Unmanned Ground and Aerial Vehicles; Vibration in Mechanical Systems; Vibrations and Control of Systems; Vibrations: Modeling, Analysis, and Control
  • DOI: 10.1115/DSCC2018-9049

Atomically Precise Placement of Single Dopants in Si
journal, September 2003


Big, Deep, and Smart Data in Scanning Probe Microscopy
journal, September 2016


py4DSTEM: Open Source Software for 4D-STEM Data Analysis
journal, August 2019

  • Savitzky, Benjamin H.; Hughes, Lauren; Bustillo, Karen C.
  • Microscopy and Microanalysis, Vol. 25, Issue S2
  • DOI: 10.1017/S1431927619001351

Imaging the effects of individual zinc impurity atoms on superconductivity in Bi2Sr2CaCu2O8+δ
journal, February 2000

  • Pan, S. H.; Hudson, E. W.; Lang, K. M.
  • Nature, Vol. 403, Issue 6771
  • DOI: 10.1038/35001534

Automated Tip Conditioning for Scanning Tunneling Spectroscopy
journal, February 2021

  • Wang, Shenkai; Zhu, Junmian; Blackwell, Raymond
  • The Journal of Physical Chemistry A, Vol. 125, Issue 6
  • DOI: 10.1021/acs.jpca.0c10731

Progress in aberration-corrected scanning transmission electron microscopy
journal, May 2001


Machine Learning for Electronically Excited States of Molecules
journal, November 2020


Big–deep–smart data in imaging for guiding materials design
journal, September 2015

  • Kalinin, Sergei V.; Sumpter, Bobby G.; Archibald, Richard K.
  • Nature Materials, Vol. 14, Issue 10
  • DOI: 10.1038/nmat4395

Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm
journal, June 2014

  • Huang, Peng; Andersson, Sean B.
  • Review of Scientific Instruments, Vol. 85, Issue 6
  • DOI: 10.1063/1.4881682

Manipulating low-dimensional materials down to the level of single atoms with electron irradiation
journal, September 2017


Correlative Multimodal Probing of Ionically-Mediated Electromechanical Phenomena in Simple Oxides
journal, October 2013

  • Kim, Yunseok; Strelcov, Evgheni; Hwang, In Rok
  • Scientific Reports, Vol. 3, Issue 1
  • DOI: 10.1038/srep02924

Adaptive probe trajectory scanning probe microscopy for multiresolution measurements of interface geometry
journal, June 2009


Electron Energy Loss Spectroscopy imaging of surface plasmons at the nanometer scale
journal, March 2016


A self-driving microscope and the Atomic Forge
journal, September 2019

  • Dyck, Ondrej; Jesse, Stephen; Kalinin, Sergei V.
  • MRS Bulletin, Vol. 44, Issue 09
  • DOI: 10.1557/mrs.2019.211

Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale
journal, July 2013

  • Strelcov, Evgheni; Kim, Yunseok; Jesse, Stephen
  • Nano Letters, Vol. 13, Issue 8
  • DOI: 10.1021/nl400780d

Nanopatterning of carbonaceous structures by field-induced carbon dioxide splitting with a force microscope
journal, April 2010

  • Garcia, R.; Losilla, N. S.; Martínez, J.
  • Applied Physics Letters, Vol. 96, Issue 14
  • DOI: 10.1063/1.3374885

Positioning single atoms with a scanning tunnelling microscope
journal, April 1990

  • Eigler, D. M.; Schweizer, E. K.
  • Nature, Vol. 344, Issue 6266
  • DOI: 10.1038/344524a0

Video-Rate Lissajous-Scan Atomic Force Microscopy
journal, January 2014

  • Yong, Yuen Kuan; Bazaei, Ali; Moheimani, S. O. Reza
  • IEEE Transactions on Nanotechnology, Vol. 13, Issue 1
  • DOI: 10.1109/TNANO.2013.2292610

Materials in nanotechnology: New structures, new properties, new complexity
journal, September 2003

  • Bonnell, Dawn A.
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 21, Issue 5
  • DOI: 10.1116/1.1600445

Advanced scanning probe lithography
journal, August 2014

  • Garcia, Ricardo; Knoll, Armin W.; Riedo, Elisa
  • Nature Nanotechnology, Vol. 9, Issue 8
  • DOI: 10.1038/nnano.2014.157

Curiosity-Driven Exploration by Self-Supervised Prediction
conference, July 2017

  • Pathak, Deepak; Agrawal, Pulkit; Efros, Alexei A.
  • 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
  • DOI: 10.1109/CVPRW.2017.70

Bayesian Fusion of Multi-Band Images
journal, September 2015

  • Wei, Qi; Dobigeon, Nicolas; Tourneret, Jean-Yves
  • IEEE Journal of Selected Topics in Signal Processing, Vol. 9, Issue 6
  • DOI: 10.1109/JSTSP.2015.2407855

Exploring order parameters and dynamic processes in disordered systems via variational autoencoders
journal, April 2021

  • Kalinin, Sergei V.; Dyck, Ondrej; Jesse, Stephen
  • Science Advances, Vol. 7, Issue 17
  • DOI: 10.1126/sciadv.abd5084

Fast scanning in AFM using non-raster sampling and time-optimal trajectories
conference, December 2012

  • Huang, Peng; Andersson, Sean B.
  • 2012 IEEE 51st Annual Conference on Decision and Control (CDC), 2012 IEEE 51st IEEE Conference on Decision and Control (CDC)
  • DOI: 10.1109/CDC.2012.6426849

Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy
journal, June 2015

  • Shibata, Naoya; Findlay, Scott D.; Sasaki, Hirokazu
  • Scientific Reports, Vol. 5, Issue 1
  • DOI: 10.1038/srep10040

Deep Rotation Equivariant Network
journal, May 2018


Predictability as a probe of manifest and latent physics: The case of atomic scale structural, chemical, and polarization behaviors in multiferroic Sm-doped BiFeO 3
journal, March 2021

  • Ziatdinov, Maxim; Creange, Nicole; Zhang, Xiaohang
  • Applied Physics Reviews, Vol. 8, Issue 1
  • DOI: 10.1063/5.0016792

Vibrational spectroscopy in the electron microscope
journal, October 2014

  • Krivanek, Ondrej L.; Lovejoy, Tracy C.; Dellby, Niklas
  • Nature, Vol. 514, Issue 7521
  • DOI: 10.1038/nature13870

A Deep Learning Approach to Identify Local Structures in Atomic-Resolution Transmission Electron Microscopy Images
journal, July 2018

  • Madsen, Jacob; Liu, Pei; Kling, Jens
  • Advanced Theory and Simulations, Vol. 1, Issue 8
  • DOI: 10.1002/adts.201800037

A continuous sampling pattern design algorithm for atomic force microscopy images
journal, January 2019


A spherical-aberration-corrected 200kV transmission electron microscope
journal, October 1998


Deep learning analysis of defect and phase evolution during electron beam-induced transformations in WS2
journal, February 2019


Materials contrast in piezoresponse force microscopy
journal, June 2006

  • Kalinin, Sergei V.; Eliseev, Eugene A.; Morozovska, Anna N.
  • Applied Physics Letters, Vol. 88, Issue 23
  • DOI: 10.1063/1.2206992

Monochromated STEM with a 30 meV-wide, atom-sized electron probe
journal, January 2013

  • Krivanek, Ondrej L.; Lovejoy, Tracy C.; Dellby, Niklas
  • Microscopy, Vol. 62, Issue 1
  • DOI: 10.1093/jmicro/dfs089

Feature tracking for high speed AFM: Experimental demonstration
conference, May 2017


Building and exploring libraries of atomic defects in graphene: Scanning transmission electron and scanning tunneling microscopy study
journal, September 2019


Data mining graphene: correlative analysis of structure and electronic degrees of freedom in graphenic monolayers with defects
journal, November 2016


Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images
journal, October 2006


High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories
journal, April 2012


Advances in Kriging-Based Autonomous X-Ray Scattering Experiments
journal, January 2020


“Water-cycle” mechanism for writing and erasing nanostructures at the LaAlO3/SrTiO3 interface
journal, October 2010

  • Bi, Feng; Bogorin, Daniela F.; Cen, Cheng
  • Applied Physics Letters, Vol. 97, Issue 17
  • DOI: 10.1063/1.3506509

Rapid multidimensional data acquisition in scanning probe microscopy applied to local polarization dynamics and voltage dependent contact mechanics
journal, September 2008

  • Jesse, Stephen; Maksymovych, Peter; Kalinin, Sergei V.
  • Applied Physics Letters, Vol. 93, Issue 11
  • DOI: 10.1063/1.2980031

Resolution-function theory in piezoresponse force microscopy: Wall imaging, spectroscopy, and lateral resolution
journal, May 2007

  • Morozovska, Anna N.; Eliseev, Eugene A.; Bravina, Svetlana L.
  • Physical Review B, Vol. 75, Issue 17
  • DOI: 10.1103/PhysRevB.75.174109

Band Excitation in Scanning Probe Microscopy: Recognition and Functional Imaging
journal, April 2014


Subsampled STEM-ptychography
journal, July 2018

  • Stevens, Andrew; Yang, Hao; Hao, Weituo
  • Applied Physics Letters, Vol. 113, Issue 3
  • DOI: 10.1063/1.5040496

Detecting magnetic ordering with atomic size electron probes
journal, May 2016

  • Idrobo, Juan Carlos; Rusz, Ján; Spiegelberg, Jakob
  • Advanced Structural and Chemical Imaging, Vol. 2, Issue 1
  • DOI: 10.1186/s40679-016-0019-9

Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) With Nonrectangular Scans
journal, December 2018


Regrowth of amorphous regions in semiconductors by sub-threshold electron beams
journal, December 1996


Towards the low-dose characterization of beam sensitive nanostructures via implementation of sparse image acquisition in scanning transmission electron microscopy
journal, February 2017

  • Hwang, Sunghwan; Han, Chang Wan; Venkatakrishnan, Singanallur V.
  • Measurement Science and Technology, Vol. 28, Issue 4
  • DOI: 10.1088/1361-6501/aa57df

The NOMAD laboratory: from data sharing to artificial intelligence
journal, May 2019


Achieving Atomic Resolution Magnetic Dichroism by Controlling the Phase Symmetry of an Electron Probe
journal, September 2014