Sensor Distortion Effects in Photon Monte Carlo Simulations
Abstract
We present a detailed method to simulating sensor distortions using a photon and electron Monte Carlo method. We use three dimensional electrostatic simulations to parameterize the perturbed electric field profile for non-ideal sensor details. We follow the conversion of simulated photons, and the subsequent response of the converted electrons to the electric field pattern. These non-ideal sensor details can be implemented efficiently in a Monte Carlo approach. We demonstrate that the non-ideal sensor distortions have a variety of observable consequence including the modification of the astrometric pattern, the distortion of the electron diffusion size and shape, and the distortion of flats. We show analytic validation of the diffusion physics, reproduce two kinds of edge distortion, and show qualitative validation of field-free regions, lithography errors, and fringing. We also demonstrate that there are two related effects of doping variation having different observable consequences. We show that field distortions from accumulated electrons lead to intensity-dependent point-spread-functions and the sub-linear variance in flats. The method is implemented in the Photon Simulator (PhoSim) and the code is publicly available.
- Authors:
-
[1];
[3];
- Purdue Univ., West Lafayette, IN (United States)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Univ. of Hawaii, Honolulu, HI (United States)
- Eureka Scientific, Oakland, CA (United States)
- Purdue Univ., West Lafayette, IN (United States); Tsinghua Univ., Beijing (China)
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Publication Date:
- Research Org.:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), High Energy Physics (HEP)
- OSTI Identifier:
- 1635094
- Alternate Identifier(s):
- OSTI ID: 1635461
- Report Number(s):
- BNL-216084-2020-JAAM; BNL-216095-2020-JAAM
Journal ID: ISSN 1538-4357; TRN: US2201330
- Grant/Contract Number:
- SC0012704
- Resource Type:
- Accepted Manuscript
- Journal Name:
- The Astrophysical Journal (Online)
- Additional Journal Information:
- Journal Name: The Astrophysical Journal (Online); Journal Volume: 889; Journal Issue: 2; Journal ID: ISSN 1538-4357
- Publisher:
- Institute of Physics (IOP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; telescopes; instrumentation; detectors
Citation Formats
Peterson, J. R., O’Connor, P., Nomerotski, A., Magnier, E., Jernigan, J. G., Cheng, J., Cui, W., Peng, E., Rasmussen, A., and Sembroski, G. Sensor Distortion Effects in Photon Monte Carlo Simulations. United States: N. p., 2020.
Web. doi:10.3847/1538-4357/ab64e0.
Peterson, J. R., O’Connor, P., Nomerotski, A., Magnier, E., Jernigan, J. G., Cheng, J., Cui, W., Peng, E., Rasmussen, A., & Sembroski, G. Sensor Distortion Effects in Photon Monte Carlo Simulations. United States. https://doi.org/10.3847/1538-4357/ab64e0
Peterson, J. R., O’Connor, P., Nomerotski, A., Magnier, E., Jernigan, J. G., Cheng, J., Cui, W., Peng, E., Rasmussen, A., and Sembroski, G. Wed .
"Sensor Distortion Effects in Photon Monte Carlo Simulations". United States. https://doi.org/10.3847/1538-4357/ab64e0. https://www.osti.gov/servlets/purl/1635094.
@article{osti_1635094,
title = {Sensor Distortion Effects in Photon Monte Carlo Simulations},
author = {Peterson, J. R. and O’Connor, P. and Nomerotski, A. and Magnier, E. and Jernigan, J. G. and Cheng, J. and Cui, W. and Peng, E. and Rasmussen, A. and Sembroski, G.},
abstractNote = {We present a detailed method to simulating sensor distortions using a photon and electron Monte Carlo method. We use three dimensional electrostatic simulations to parameterize the perturbed electric field profile for non-ideal sensor details. We follow the conversion of simulated photons, and the subsequent response of the converted electrons to the electric field pattern. These non-ideal sensor details can be implemented efficiently in a Monte Carlo approach. We demonstrate that the non-ideal sensor distortions have a variety of observable consequence including the modification of the astrometric pattern, the distortion of the electron diffusion size and shape, and the distortion of flats. We show analytic validation of the diffusion physics, reproduce two kinds of edge distortion, and show qualitative validation of field-free regions, lithography errors, and fringing. We also demonstrate that there are two related effects of doping variation having different observable consequences. We show that field distortions from accumulated electrons lead to intensity-dependent point-spread-functions and the sub-linear variance in flats. The method is implemented in the Photon Simulator (PhoSim) and the code is publicly available.},
doi = {10.3847/1538-4357/ab64e0},
journal = {The Astrophysical Journal (Online)},
number = 2,
volume = 889,
place = {United States},
year = {Wed Feb 05 00:00:00 EST 2020},
month = {Wed Feb 05 00:00:00 EST 2020}
}
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